Apparatus enabling use of a reference diode to compare against a device under test in relative amplitude and phase measurements

Patent metadata

Field	Value
Publication number	US-9841447-B2
Application number	US-201514945395-A
Country	US
Kind code	B2
Filing date	Nov 18, 2015
Priority date	Nov 21, 2014
Publication date	Dec 12, 2017
Grant date	Dec 12, 2017

Abstract

Embodiments of the invention include methods and devices for determining a phase angle offset between a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT). Some embodiments include a laser source and an optical phase adjustor, which may be embodied by a loop stretcher structured to controllably stretch a length of fiber optic cable, driven by a phase adjust driver. In other embodiments the phase angle offset information is conveyed to an oscilloscope for internal compensation.

First claim

What is claimed is:

1. A system for determining a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT), comprising:
a first laser source structured to generate the signal input for the DUT, and a signal input for a reference detector;
a second laser source structured to generate a Local Oscillator input for the DUT;
a phase maintaining laser coupler having two inputs and two outputs, the first input to the coupler coupled to the output of the first laser source, the second input to the coupler coupled to the output of the second laser source, the first output to the coupler coupled to the reference detector, and the second output to the coupler coupled to the DUT;
a current monitor structured to monitor a selected one of a plurality of outputs of the DUT, the plurality of outputs of the DUT including in-phase and quadrature outputs for each of an X and a Y channel; and
a phase measurer coupled to the output of the DUT selected by the current monitor, and structured to measure an error amount by which the LO is out of phase from the signal input to the DUT.

2. The system for determining a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT) according to claim 1 , in which the phase measurer is a DC gain loop, and further comprising a phase adjuster coupled to the phase measurer and structured to modify a phase of the LO by an amount related to the output of the phase measurer.

3. The system for determining a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT) according to claim 2 , in which the phase adjuster is a fiber loop stretcher.

4. The system for determining a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT) according to claim 2 , in which the phase adjuster causes a phase angle difference of the signal input to the DUT and the LO input to the DUT to be controllably driven to approximately zero.

5. The system for determining a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT) according to claim 1 , in which the phase measurer is a first oscilloscope coupled to the current monitor.

6. The system for determining a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT) according to claim 5 in which the first oscilloscope passes a measurement signal to a second oscilloscope.

7. A system for determining a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT), comprising:
a first laser source structured to generate the signal input for the DUT, and a signal input for a reference detector;
a second laser source structured to generate a Local Oscillator input for the DUT;
a phase maintaining laser coupler having two inputs and two outputs, the first input to the coupler coupled to the output of the first laser source, the second input to the coupler coupled to the output of the second laser source, the first output to the coupler coupled to the reference detector, and the second output to the coupler coupled to the DUT;
an Acoustic Optic Modulator (AOM) coupled between the second laser source and the LO input to the DUT; in which
a beat frequency between the signal input for the reference detector and the signal input to the DUT approximates an operational frequency of the AOM.

8. The system for determining a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT) according to claim 7 , further comprising an RF coupler structured to pass the beat frequency to an oscilloscope coupled to the DUT and to the reference detector.

9. The system for determining a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT) according to claim 7 , in which the operational frequency of the AOM is less than 100 MHz.

10. The system for determining a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT) according to claim 7 , further comprising a means for sampling and storing the voltages output by the DUT, in which the stored voltage data is then used to determine the desired relative phase angle.

11. The system for determining a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT) according to claim 10 , in which the means for sampling and storing the voltage data is provided by a digital storage oscilloscope.

12. The system for determining a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT) according to claim 10 , where the desired relative phase angle is obtained from the stored voltage data by least-square fitting to one general sinusoid, or the sum of general sinusoids at different frequencies.

13. A method for determining a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT), the method comprising:
generating a first laser signal at a first laser, the first laser signal to connect to the DUT;
generating a second laser signal at a second laser, the second laser signal connected to a local oscillator input to the DUT;
coupling a phase of the first laser signal to a phase of the second laser signal in a phase maintaining coupler;
measuring a phase error between the first laser signal and the second laser signal; and
compensating for the measured phase error.

14. The method for determining a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT) according to claim 13 , in which compensating for the measured phase error comprises physically adjusting a fiber length of a fiber carrying the first laser signal or a fiber carrying the second laser signal.

15. The method for determining a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT) according to claim 13 , in which physically adjusting a fiber length comprises stretching a loop of fiber.

16. The method for determining a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT) according to claim 13 , in which compensating for the measured phase error comprises sending the measured phase error to an oscilloscope coupled to the output of the DUT, and compensating for the measured phase error in the oscilloscope.

17. The method for determining a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT) according to claim 16 in which sending the measured phase error to an oscilloscope coupled to the output of the DUT comprises sending the measured phase error from a second oscilloscope.

18. The method for determining a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT) according to claim 16 in which an Acoustic Optic Modulator (AOM) is coupled between the second laser and the DUT, and in which sending the measured phase error to an oscilloscope coupled to the output of the DUT comprises sending the operating frequency of the AOM.

Assignees

• Tektronix Inc

Inventors

• Marsland Jr Robert A
• Jacobs Steven A

Classifications

• G01J1/44

  Electric circuits {(for command of an exposure part G03B7/02)} · CPC title

• H04B10/615

  Arrangements affecting the optical part of the receiver · CPC title

• G01R25/00 Primary

  Arrangements for measuring phase angle between a voltage and a current or between voltages or currents · CPC title

• H04B10/63 Primary

  Homodyne {, i.e. coherent receivers where the local oscillator is locked in frequency and phase to the carrier signal} · CPC title

• H04B10/0731 Primary

  Testing or characterisation of optical devices, e.g. amplifiers · CPC title