Probe and manufacturing method thereof

US9841404B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9841404-B2
Application numberUS-201514749595-A
CountryUS
Kind codeB2
Filing dateJun 24, 2015
Priority dateDec 26, 2014
Publication dateDec 12, 2017
Grant dateDec 12, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Disclosed herein is a probe including: an acoustic module including a piezoelectric layer configured to generate ultrasonic waves, a matching layer configured to reduce a difference in acoustic impedance between the piezoelectric layer and an object, and a backing layer configured to absorb ultrasonic waves generated by the piezoelectric layer and transmitted backward from the piezoelectric layer; a plurality of attenuation layers provided at both edges of the upper surface of the acoustic module, and configured to attenuate ultrasonic waves generated by the acoustic module; and a lens layer disposed to cover the upper surfaces of the attenuation layers, and configured to focus ultrasonic waves transmitted forward from the piezoelectric layer at a predetermined point.

First claim

Opening claim text (preview).

What is claimed is: 1. A probe comprising: an acoustic module comprising a piezoelectric layer configured to generate ultrasonic waves, a matching layer configured to reduce a difference in acoustic impedance between the piezoelectric layer and an object, and a backing layer configured to absorb ultrasonic waves generated by the piezoelectric layer and transmitted backward from the piezoelectric layer; an attenuation layer disposed on the center upper surface of the acoustic module, and including a low attenuation material; and a lens layer disposed to cover the upper surface of the attenuation layer, and configured to focus ultrasonic waves transmitted forward from the piezoelectric layer at a predetermined point. 2. The probe according to claim 1 , wherein the attenuation layer is disposed on the center surface of the acoustic module, as seen in an elevation direction of the probe. 3. The probe according to claim 1 , wherein the attenuation layer includes a silicon material. 4. The probe according to claim 1 , wherein the piezoelectric layer is formed on a caved surface of the backing layer. 5. The probe according to claim 1 , wherein the attenuation layer is configured with a plurality of layers, and the lens layer is configured with a plurality of layers. 6. The probe according to claim 1 , wherein the piezoelectric layer is formed on the entire or a part of the upper surface of the backing layer. 7. A probe comprising: an acoustic module comprising a piezoelectric layer configured to generate ultrasonic waves, a matching layer configured to reduce a difference in acoustic impedance between the piezoelectric layer and an object, and a backing layer configured to absorb ultrasonic waves generated by the piezoelectric layer and transmitted backward from the piezoelectric layer; an attenuation layer disposed on the upper surface of the acoustic module, wherein a center part of the attenuation layer has ultrasonic waves attenuation that is different from ultrasonic waves attenuation of both edges of the attenuation layer; and a lens layer disposed to cover the upper surface of the attenuation layer, and configured to focus ultrasonic waves transmitted forward from the piezoelectric layer at a predetermined point. 8. The probe according to claim 7 , wherein the attenuation layer includes a low attenuation material at the center part as seen in an elevation direction of the probe, and a high attenuation material at both edges as seen in the elevation direction of the probe. 9. The probe according to claim 7 , wherein the attenuation layer includes a low attenuation material, the center part of the attenuation layer as seen in an elevation direction of the probe has a single-layer structure, and both edges of the attenuation layer as seen in the elevation direction of the probe each has a multi-layer structure. 10. The probe according to claim 7 , wherein the attenuation layer includes a silicon material. 11. The probe according to claim 7 , wherein the piezoelectric layer is formed on a caved surface of the backing layer. 12. The probe according to claim 7 , wherein the attenuation layer is configured with a plurality of layers, and the lens layer is configured with a plurality of layers. 13. A method of manufacturing a probe, comprising: fabricating an acoustic module by forming a backing layer, a piezoelectric layer, and a matching layer sequentially; forming an attenuation layer configured to attenuate ultrasonic waves generated by the acoustic module, and including a low attenuation material, on the center upper surface of the acoustic module; and forming a lens layer configured to focus ultrasonic waves transmitted forward from the piezoelectric layer at a predetermined point, on the upper surface of the attenuation layer. 14. The method according to claim 13 , wherein the forming of the attenuation layer comprises forming other attenuation layers with a high attenuation material respectively, at both edges of the upper surface of the acoustic module. 15. The method according to claim 14 , wherein the high attenuation material includes a silicon material. 16. The method according to claim 14 , wherein the forming of the other attenuation layers comprises forming the other attenuation layers respectively at a part of the left upper surface of the acoustic module and at a part of the right upper surface of the acoustic module, as seen in an elevation direction of the probe. 17. The method according to claim 16 , wherein the forming of the other attenuation layers comprises forming the other attenuation layers respectively at the most left upper part of the left upper surface of the acoustic module and at the most right upper part of the right upper surface of the acoustic module. 18. The method according to claim 13 , wherein the forming of the attenuation layer comprises forming a multi-layer structure each layer formed with a low attenuation material on the center upper surface of the acoustic module. 19. The method according to claim 13 , wherein the fabricating of the acoustic module comprises removing a part of the backing layer, and forming the piezoelectric layer on a caved surface of the backing layer formed by removing the part of the backing layer. 20. The method according to claim 13 , wherein the forming of the lens layer comprises configuring the lens layer with a plurality of layers.

Assignees

Inventors

Classifications

  • B06B1/0681Primary

    and a damping structure · CPC title

  • G01N29/245Primary

    Ceramic probes, e.g. lead zirconate titanate [PZT] probes · CPC title

  • Mechanical acoustic impedances; Impedance matching, e.g. by horns; Acoustic resonators · CPC title

  • using refraction, e.g. acoustic lenses · CPC title

  • Devices for damping, suppressing, obstructing or conducting sound in acoustic devices (G10K1/06 - G10K1/10 take precedence; for electro-mechanical transducers for communication H04R3/002) · CPC title

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What does patent US9841404B2 cover?
Disclosed herein is a probe including: an acoustic module including a piezoelectric layer configured to generate ultrasonic waves, a matching layer configured to reduce a difference in acoustic impedance between the piezoelectric layer and an object, and a backing layer configured to absorb ultrasonic waves generated by the piezoelectric layer and transmitted backward from the piezoelectric lay…
Who is the assignee on this patent?
Samsung Medison Co Ltd
What technology area does this patent fall under?
Primary CPC classification B06B1/0681. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Dec 12 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).