Chemical mapping using thermal microscopy at the micro and nano scales

Patent metadata

Field	Value
Publication number	US-9841324-B2
Application number	US-201514748430-A
Country	US
Kind code	B2
Filing date	Jun 24, 2015
Priority date	Nov 25, 2011
Publication date	Dec 12, 2017
Grant date	Dec 12, 2017

Abstract

A non-destructive method for chemical imaging with ˜1 nm to 10 μm spatial resolution (depending on the type of heat source) without sample preparation and in a non-contact manner. In one embodiment, a sample undergoes photo-thermal heating using an IR laser and the resulting increase in thermal emissions is measured with either an IR detector or a laser probe having a visible laser reflected from the sample. In another embodiment, the infrared laser is replaced with a focused electron or ion source while the thermal emission is collected in the same manner as with the infrared heating. The achievable spatial resolution of this embodiment is in the 1-50 nm range.

First claim

What is claimed as new and desired to be protected by Letters Patent of the United States is:

1. A system for photo-thermal spectroscopic and confocal microscopy, comprising:
an infrared laser directed along an optical path to photo-thermally heat the sample and create an infrared photo-thermal signal, wherein infrared light is emitted from the sample;
a probe laser directed along the optical path, wherein the probe laser is co-focused with the infrared laser, and wherein light from the probe laser is reflected from the sample as a confocal signal;
means to detect a sub-diffraction-limited photo-thermal signal and confocal signal comprising a detector to measure reflection of the probe laser beam to indicate both the change in the reflected signal due to the photo-thermal heating and the DC component of the confocal signal; and
an interferometer to maximize the signal from the probe laser.

2. The system of claim 1 , wherein the sample has no contact with a probe.

3. The system of claim 1 , additionally comprising means for modulating the infrared laser to achieve a spatial resolution of one micron or less.

4. The system of claim 1 , additionally comprising means to detect the diffraction-limited photo-thermal signal comprising an infrared light detector to measure the increase in thermal emissions from the infrared photo-thermal signal.

5. The system of claim 1 , additionally comprising means for raster scanning over a surface of the sample to generate a map of the chemical composition of the sample surface.

6. The system of claim 1 , wherein the infrared laser light reflected from the sample is collected and analyzed to measure the change in infrared reflectivity due to photo-thermal heating.

7. The system of claim 1 , additionally comprising means for moving the sample perpendicular to a surface of the sample.

8. The system of claim 1 , wherein the sample comprises a microfabricated structure, a polymer, a forensic sample, a fingerprint, a blood stain, a residue from an illicit drug or explosive, a pharmaceutical, a biological sample, a cancerous tissue, a cataract, or a cell.

9. A system for photo-thermal spectroscopic and confocal microscopy, comprising:
an infrared laser directed along an optical path to photo-thermally heat the sample and create an infrared photo-thermal signal, wherein infrared light is reflected from the sample;
a probe laser directed along the optical path, wherein the probe laser is co-focused with the infrared laser, and wherein light from the probe laser is reflected from the sample as a confocal signal; and
means to detect a sub-diffraction-limited photo-thermal signal and confocal signal comprising a light detector and an interferometer to measure both the change in the probe laser light reflected signal due to the photo-thermal heating and the DC component of the confocal signal
wherein either a moving mirror arm of the interferometer or the sample are dithered at a different frequency than a periodic heating to eliminate a varying photo-thermal signal.

10. The system of claim 9 , wherein the sample has no contact with a probe.

11. The system of claim 9 , additionally comprising means for modulating the infrared laser to achieve a spatial resolution of one micron or less.

12. The system of claim 9 , additionally comprising means to detect the diffraction-limited photo-thermal signal comprising an infrared light detector to measure the increase in thermal emissions from the infrared photo-thermal signal.

13. The system of claim 9 , additionally comprising means for raster scanning over a surface of the sample to generate a map of the chemical composition of the sample surface.

14. The system of claim 9 , wherein the infrared laser light reflected from the sample is collected and analyzed to measure the change in infrared reflectivity due to photo-thermal heating.

15. The system of claim 9 , additionally comprising means for moving the sample perpendicular to a surface of the sample.

16. The system of claim 9 , wherein the sample comprises a microfabricated structure, a polymer, a forensic sample, a fingerprint, a blood stain, a residue from an illicit drug or explosive, a pharmaceutical, a biological sample, a cancerous tissue, a cataract, or a cell.

Assignees

• Furstenberg Robert
• Kendziora Chris
• Mcgill R Andrew
• Nguyen Viet K
• Us Navy

Inventors

• Furstenberg Robert
• Kendziora Chris
• Mcgill R Andrew
• Nguyen Viet K

Classifications

• G01J3/02

  Details · CPC title

• G01N2021/1731

  Temperature modulation · CPC title

• G02B21/008

  Details of detection or image processing, including general computer control · CPC title

• G01N21/41

  Refractivity; Phase-affecting properties, e.g. optical path length (G01N21/21 takes precedence) · CPC title

• G01N2021/1714

  Photothermal radiometry with measurement of emission · CPC title