System and method for testing photosensitive device degradation

Patent metadata

Field	Value
Publication number	US-9831829-B2
Application number	US-201615276378-A
Country	US
Kind code	B2
Filing date	Sep 26, 2016
Priority date	Sep 24, 2015
Publication date	Nov 28, 2017
Grant date	Nov 28, 2017

Abstract

The performance of photosensitive devices over time may be tested by configuring a photosensitive device test system that includes a light source plate that exposes photosensitive devices within a container to a specified light intensity. The light intensity may be adjusted by a programmable power source according to one or more thresholds. A test may last for a set duration with performance measurements being taken at predetermined intervals throughout the duration. Feedback from the photosensitive device test system may be recorded to determine whether to increase light intensity, to stop testing, to continue testing, and whether one or more environmental conditions should be altered. Measurements may be sent to a client for analysis and display to a user.

First claim

What is claimed is:

1. A system comprising:
a light source plate, wherein the light source plate emits light at an intensity level;
a cell interface plate;
a container proximate to the light source plate and coupled to the cell interface plate, wherein the container comprises one or more photosensitive devices and a thermoconductive compound adjacent to at least one side of the one or more photosensitive devices, wherein one or more pins associated with one or more pixels of the one or more photosensitive devices interfaces with the container, and wherein the container interfaces the one or more pins to the cell interface plate;
a light metering device proximate to the light source plate, wherein the light metering device measures the intensity of emissions from the light source plate to the photosensitive devices;
a light power source coupled to the light source plate, wherein the light power source controls one or more of current and voltage to the light source plate;
a multiplexor coupled to the cell interface plate, wherein the multiplexor activates circuitry to address the one or more pixels; and
a measuring device coupled to the multiplexor, wherein the measuring device receives one or more performance measurements associated with the one or more pixels.

2. The system of claim 1 , wherein the light power source is a programmable power supply.

3. The system of claim 1 , further comprising:
a temperature metering device within the container, wherein the temperature metering device measures the temperature associated with the one or more photosensitive devices.

4. The system of claim 1 , further comprising:
a client communicatively coupled to the light power source, the multiplexor and the measuring device.

5. The system of claim 1 , further comprising:
a photosensitive device test system, wherein the photosensitive device test system comprises the light source plate, the cell interface plate, and the container.

6. The system of claim 1 , further comprising:
one or more substrates within the container, wherein each of the one or more substrates comprises one or more photosensitive devices.

Assignees

• Hunt Energy Entpr Llc
• Hee Solar Llc

Inventors

• Irwin Michael D
• Lovelace Jerome
• Mielczarek Kamil

Classifications

• H02S50/10 Primary

  Testing of PV devices, e.g. of PV modules or single PV cells (testing of semiconductor devices during manufacturing {H10P74/00}) · CPC title

• H02S50/15

  using optical means, e.g. using electroluminescence · CPC title

• H02S99/00 Primary

  Subject matter not provided for in other groups of this subclass · CPC title

• Y02E10/50

  Photovoltaic [PV] energy · CPC title

• H05B33/10

  Apparatus or processes specially adapted to the manufacture of electroluminescent light sources · CPC title