Detection of x-rays, and x-ray detector system

Patent metadata

Field	Value
Publication number	US-9829586-B2
Application number	US-201314418378-A
Country	US
Kind code	B2
Filing date	Jul 9, 2013
Priority date	Jul 31, 2012
Publication date	Nov 28, 2017
Grant date	Nov 28, 2017

Abstract

A method is disclosed for detecting x-rays using an x-ray detector which includes a direct-conversion semiconductor detector element. Additional radiation is supplied to the semiconductor detector element using a radiation source, and the supply of the additional radiation is controlled and/or regulated on the basis of a specified target value. In at least one embodiment, the target value can be specified in a variable manner over time as a sequence of target values. An x-ray detector system is further disclosed, with which the method can be carried out.

First claim

The invention claimed is:

1. A method for detecting x-ray radiation by way of an x-ray detector including a direct-conversion semiconductor detector element, comprising:
supplying a conditioning radiation to the semiconductor detector element for varying polarization effects in the semiconductor detector element with the aid of a conditioning radiation source prior to supplying an imaging radiation to the semiconductor detector with the aid of the radiation source;
measuring the conditioning radiation at the semiconductor detector element;
determining a nominal value of the conditioning radiation based on the measured conditioning radiation, the nominal value representing a nominal measured value, including at least one of duration or time point of the supply of the conditioning radiation or x-ray radiation, operating time of the semiconductor detector, radiation intensity of the conditioning radiation or x-ray radiation, radiation density of the conditioning radiation or x-ray radiation, count rate of the conditioning radiation or x-ray radiation, and dose of the conditioning radiation or x-ray radiation; and
at least one of controlling and regulating the supply of the conditioning radiation from an incident x-ray radiation source based on the determined nominal value, where the conditioning radiation is supplied while no incident radiation to be detected is incident on the semiconductor detector element.

2. The method of claim 1 , wherein the radiation source comprises at least one component from the group UV light source, IR light source, light source for visible light, a laser, a halogen lamp, and a tubular fluorescent lamp.

3. The method of claim 1 , wherein the radiation source comprises the x-ray source.

4. The method of claim 1 , wherein the supply of the conditioning radiation is at least one of controlled and regulated with respect to at least one of time, the radiation density and energy.

5. The method of claim 1 , wherein a monitoring measured value corresponding to the nominal value is acquired.

6. The method of claim 1 , wherein a monitoring unit for acquiring a monitoring measured value comprises at least one component from the group
light sensor,
x-ray sensor,
semiconductor detector element of the x-ray detector,
evaluation electronics of the x-ray detector,
dosimeter,
thermometer, and
luxmeter.

7. The method of claim 1 , wherein the supply of the conditioning radiation is at least one of controlled and regulated based on the characteristics of an examination subject which is to be transradiated by the x-ray radiation that is to be detected.

8. The method of claim 1 , wherein the supply of the conditioning radiation is at least one of controlled and regulated based on at least one of
the characteristic curve of the emission of the x-ray radiation by way of the x-ray source and
the attenuation of the x-ray radiation of the x-ray source by the examination subject.

9. The method of claim 1 , wherein the supply of the conditioning radiation is at least one of controlled and regulated based on a count rate drift of x-ray quanta.

10. The method of claim 1 , wherein the supply of the conditioning radiation is effected on the basis of at least one of the variables
irradiation time,
administered dose,
value or characteristic curve of the detection signal,
total operating time of the detector,
temperature,
humidity,
current consumption of a semiconductor detector element, and
current consumption of a group of semiconductor detector elements.

11. The method of claim 1 , wherein the conditioning radiation is supplied in a time window in which the x-ray source emits no x-ray radiation.

12. The method of claim 1 , wherein the conditioning radiation is supplied during the entire operating time of the x-ray detector.

13. The method of claim 1 , wherein the supply of the conditioning radiation is at least one of controlled and regulated in such a way that at least one of
the intensity and the spectral distribution is determined or monitored, and
the current consumption of at least one of the semiconductor detector elements and a group of semiconductor detector elements is substantially constant.

14. An x-ray detector system, comprising:
an x-ray detector to detect radiation of an x-ray source which includes a direct-conversion semiconductor detector element;
a radiation source to supply a conditioning radiation prior to supplying an imaging radiation to at least one of the semiconductor detector element and a control interface for driving a radiation source; and
a control unit configured to
measure an intensity of the conditioning radiation,
determine a nominal value of the conditioning radiation, and
at least one of control and regulate the supply of an additional radiation on the basis of the determined nominal value.

15. The x-ray detector system of claim 14 , further comprising:
a monitoring unit to acquire a monitoring measured value corresponding to the nominal value.

16. The x-ray detector system of claim 15 , wherein the monitoring unit is arranged outside of a primary beam path of the x-ray source to the semiconductor detector element.

17. The x-ray detector system of claim 15 , wherein the monitoring unit includes at least one shielding device to protect against radiation of the x-ray source.

18. An x-ray detector for the x-ray detector system of claim 14 , further comprising a monitoring unit integrated into the x-ray detector.

19. A computed tomography system comprising the x-ray detector system of claim 14 .

20. The x-ray detector system of claim 16 , wherein the monitoring unit includes at least one shielding device to protect against radiation of the x-ray source.

21. A computed tomography system comprising the x-ray detector system of claim 15 .

22. A computed tomography system comprising the x-ray detector system of claim 16 .

23. A computed tomography system comprising the x-ray detector system of claim 17 .

24. The method of claim 2 , wherein the radiation source comprises the x-ray source.

25. The method of claim 2 , wherein the supply of the conditioning radiation is at least one of controlled and regulated with respect to at least one of time, the radiation density and energy.

26. The method of claim 2 , wherein a monitoring measured value corresponding to the nominal value is acquired.

27. The method of claim 2 , wherein a monitoring unit for acquiring a monitoring measured value comprises at least one component from the group
light sensor,
x-ray sensor,
semiconductor detector element of the x-ray detector,
evaluation electronics of the x-ray detector,
dosimeter,
thermometer, and
luxmeter.

28. The method of claim 2 , wherein the supply of the conditioning radiation is at least one controlled and regulated based on the characteristics of an examination subject which is to be transradiated by the x-ray radiation that is to be detected.

29. The method of claim 1 , wherein the nominal value is derived from a topogram of a patient.

Assignees

• Siemens Ag

Inventors

• Göderer Edgar
• Hackenschmied Peter
• Kappler Steffen
• Kreisler Björn
• Labayen De Inza Miguel
• Niederlöhner Daniel
• Reinwand Mario
• Schröter Christian
• Strassburg Matthias
• Wirth Stefan

Classifications

• G01N23/04

  and forming images of the material · CPC title

• G01N23/046

  using tomography, e.g. computed tomography [CT] · CPC title

• G01T1/244 Primary

  Auxiliary details, e.g. casings, cooling, damping or insulation against damage by, e.g. heat, pressure or the like · CPC title

• G01T1/026

  Semiconductor dose-rate meters · CPC title

• G01T1/24 Primary

  with semiconductor detectors · CPC title