Metal oxide thin film substrate, method of fabricating the same, photovoltaic cell and OLED including the same
US-9257312-B2 · Feb 9, 2016 · US
US9825257B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9825257-B2 |
| Application number | US-201313914916-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 11, 2013 |
| Priority date | Jun 12, 2012 |
| Publication date | Nov 21, 2017 |
| Grant date | Nov 21, 2017 |
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A light extraction substrate for an organic light-emitting device (OLED) which can improve the brightness of a display or an illumination system to which an OLED is applied by improving light extraction efficiency and a method of manufacturing the same. The light extraction substrate for an OLED includes an oxide or nitride thin film formed on a substrate body. The oxide or nitride thin film includes a base layer formed on the substrate body, a first texture formed on the base layer, the first texture having a plurality of first protrusions which protrude continuously or discontinuously from the base layer, and a second texture having a plurality of second protrusions which protrude continuously or discontinuously from each outer surface of the first protrusions.
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What is claimed is: 1. A light extraction substrate for an organic light-emitting device comprising an oxide or nitride thin film formed on a substrate body, wherein the oxide or nitride thin film comprises: a base layer formed on the substrate body; a first texture formed on the base layer, the first texture comprising a plurality of first protrusions which protrude continuously or discontinuously from the base layer; and a second texture comprising a plurality of second protrusions which protrude continuously or discontinuously from each outer surface of the first protrusions, wherein the base layer has fewer voids therein than the first texture, wherein the oxide or nitride thin film comprises a material selected from the group consisting of ZnO, TiO2, SnO2, SrTiO3, VO2, V2O3, SrRuO3, TiN, and mixtures thereof, wherein a thickness of the oxide or nitride thin film ranges from 1 to 12 μm, wherein a thickness of the base layer ranges from 0.01 to 1 μm, wherein a height of the first protrusions ranges from 0.05 to 10 μm, and wherein a thickness of the base layer is 25% or less of a thickness of the first texture. 2. The light extraction substrate of claim 1 , wherein a refractive index of the oxide or nitride thin film is greater than a refractive index of the substrate body. 3. The light extraction substrate of claim 1 , wherein the oxide or nitride thin film comprises a dopant of at least one selected from a metal group consisting of Mg, Cd, S, Se, Te, F, Ga, Al, Mn, Co, Cu, Nb, Nd, Sr, W and Fe. 4. The light extraction substrate of claim 1 , comprising an average transmittance of 40% or greater in a wavelength range from 380 to 800 nm. 5. The light extraction substrate of claim 1 , wherein a pitch of the first protrusions is 10 μm or less. 6. The light extraction substrate of claim 1 , wherein the shortest width of each first protrusion ranges from 0.05 to 5 μm, and the orthogonal width to the shortest width of each first protrusion ranges from 0.05 to 10 μm. 7. The light extraction substrate of claim 1 , wherein the first protrusions have a shape selected from leaf, stacked hexagon and hexagonal prism. 8. The light extraction substrate of claim 1 , wherein a surface of the base layer above which the first texture protrudes has a wave-like appearance. 9. The light extraction substrate of claim 1 , wherein a pitch of the second protrusions ranges from 0.01 to 1 μm, and a height of the second protrusions ranges from 0.01 to 1 μm. 10. A method of manufacturing a light extraction substrate, comprising: forming a light extraction layer comprising an oxide or nitride thin film on a substrate body via atmospheric pressure chemical vapor deposition, the light extraction layer comprising an oxide or nitride thin film, wherein the light extraction layer includes: a base layer on the substrate body; a first texture formed on the base layer, the first texture having a plurality of first protrusions which protrude continuously or discontinuously from the base layer; and a second texture having a plurality of second protrusions which protrude continuously or discontinuously from each outer surface of the first protrusions, wherein the base layer has fewer voids therein than the first texture, wherein the oxide or nitride thin film comprises a material selected from the group consisting of ZnO, TiO2, SnO2, SrTiO3, VO2, V2O3, SrRuO3, TiN, and mixtures thereof, wherein a thickness of the oxide or nitride thin film ranges from 1 to 12 μm, wherein a thickness of the base layer ranges from 0.01 to 1 μm, wherein a height of the first protrusions ranges from 0.05 to 10 μm, and wherein a thickness of the base layer is 25% or less of a thickness of the first texture. 11. The method of claim 10 , further comprising treating the substrate body with plasma or a chemical before forming the light extraction layer via atmospheric pressure chemical vapor deposition. 12. The method of claim 10 , further comprising treating the light extraction layer with plasma or a chemical after forming the light extraction layer via atmospheric pressure chemical vapor deposition. 13. The method of claim 10 , wherein a pitch of the second protrusions ranges from 0.01 to 1 μm, and a height of the second protrusions ranges from 0.01 to 1 μm.
Manufacture or treatment specially adapted for the organic devices covered by this subclass · CPC title
comprising refractive means, e.g. lenses · CPC title
comprising scattering means · CPC title
Containing metal or metal compound · CPC title
and varying density · CPC title
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