Systems and methods for high throughput solvent assisted ionization inlet for mass spectrometry

Patent metadata

Field	Value
Publication number	US-9824872-B2
Application number	US-201615181300-A
Country	US
Kind code	B2
Filing date	Jun 13, 2016
Priority date	Sep 2, 2010
Publication date	Nov 21, 2017
Grant date	Nov 21, 2017

Abstract

A multiplex system and method for achieving high throughput analysis of samples using solvent assisted ionization inlet includes an ionizing system with a heated inlet channel and a pressure differential across the inlet channel, pipet tips serially aligned with the inlet to a mass spectrometer, and a system of mapping data generated by mass spectrometry.

First claim

What is claimed is:

1. A multiplex system for allowing high throughput analysis of samples using solvent assisted ionization inlet (SAII) comprising:
(i) an ionizing system for SAII wherein the ionizing system lacks a laser, an electrode and a voltage source;
(ii) a x,y-stage or x,y,z-stage; and
(iii) a software program stored on a non-transitory computer readable medium that maps samples according to a selection criteria.

2. The multiplex system of claim 1 , further comprising delivery tips that are serially aligned to the inlet of the ionizing system using the x,y-stage or x,y,z-stage.

3. The multiplex system of claim 1 , further comprising a multiple well plate that is serially aligned with a tube using the x,y-stage or the x,y,z-stage, wherein the tube can deliver solution from the wells to the ionizing system.

4. The multiplex system of claim 2 , wherein the delivery tips are held by a multiple channel pipet or multiple pipet tip holder.

5. The multiplex system of claim 4 , wherein the multiple channel pipet or multiple pipet tip holder holds 1 to 1,536 delivery tips.

6. The multiplex system of claim 3 , wherein the multiple well plate comprises well numbers ranging from 1 to 1,536.

7. The multiplex system of claim 3 , wherein the multiple well plate is vertical and the tube is positioned horizontally from the inlet.

8. The multiplex system of claim 3 , wherein the multiple well plate is horizontal and the tube is bent to position it from the inlet into the wells of the well plate.

9. The multiplex system of claim 1 , wherein the software program is enabled to allow acquisition of data from 1000 samples in one hour.

10. The multiplex system of claim 1 , wherein the selection criteria is the location of an analyte.

11. The multiplex system of claim 1 , wherein the selection criteria is the quantity of an analyte.

12. The multiplex system of claim 1 , wherein the software program is imaging software.

13. A method of achieving high throughput analysis of samples using solvent assisted ionization inlet comprising:
creating a pressure differential across the inlet channel of a mass spectrometer;
heating or cooling the inlet channel of the mass spectrometer;
serially aligning the samples with the inlet of a mass spectrometer; acquiring data regarding each sample;
mapping the data according to a selection criteria; and
obtaining additional information about a sample mapped positively according to the selection criteria wherein, for sample ionization, the method does not utilize a laser, an electrode or a voltage source.

14. The method of claim 13 , wherein the mapping is performed by imaging software stored on a non-transitory computer readable medium.

15. The method of claim 13 , wherein the sample enters the mass spectrometer through the pressure differential across the inlet channel.

16. The method of claim 13 , wherein pure solvent is loaded between samples.

17. The method of claim 13 , wherein the method acquires data from 1000 samples in one hour.

18. The method of claim 13 , further comprising cooling the sample and the inlet channel.

19. The method of claim 13 , further comprising adding ammonium salts to the sample.

20. The method of claim 13 , further comprising adding a low viscosity solvent to the sample.

21. The method of claim 13 , wherein the serial alignment is achieved using a x,y-stage or a x,y,z-stage.

22. The method of claim 13 , wherein the selection criteria maps the sample according to the location of an analyte.

23. The method of claim 13 , wherein the selection criteria maps the sample according to the quantity of an analyte.

24. A multiplex system for allowing high throughput analysis of samples using solvent assisted ionization inlet (SAII) comprising:
(i) an ionizing system for SAII wherein the ionizing system does not require a laser, an electrode, or a voltage source;
(ii) a x,y-stage or x,y,z-stage; and
(iii) a software program stored on a non-transitory computer readable medium that maps samples according to a selection criteria.

25. The multiplex system of claim 24 , further comprising delivery tips that are serially aligned to the inlet of the ionizing system using the x,y-stage or x,y,z-stage.

26. The multiplex system of claim 24 , further comprising a multiple well plate that is serially aligned with a tube using the x,y-stage or the x,y,z-stage, wherein the tube can deliver solution from the wells to the ionizing system.

27. The multiplex system of claim 25 , wherein the delivery tips are held by a multiple channel pipet or multiple pipet tip holder.

28. The multiplex system of claim 27 , wherein the multiple channel pipet or multiple pipet tip holder holds 1 to 1,536 delivery tips.

29. The multiplex system of claim 26 , wherein the multiple well plate comprises well numbers ranging from 1 to 1,536.

30. The multiplex system of claim 26 , wherein the multiple well plate is vertical and the tube is positioned horizontally from the inlet.

31. The multiplex system of claim 26 , wherein the multiple well plate is horizontal and the tube is bent to position it from the inlet into the wells of the well plate.

32. The multiplex system of claim 24 , wherein the software program is enabled to allow acquisition of data from 1000 samples in one hour.

33. The multiplex system of claim 24 , wherein the selection criteria is the location of an analyte.

34. The multiplex system of claim 24 , wherein the selection criteria is the quantity of an analyte.

35. The multiplex system of claim 24 , wherein the software program is imaging software.

36. A method of achieving high throughput analysis of samples using solvent assisted ionization inlet comprising:
creating a pressure differential across the inlet channel of a mass spectrometer;
heating or cooling the inlet channel of the mass spectrometer;
serially aligning the samples with the inlet of a mass spectrometer;
acquiring data regarding each sample; mapping the data according to a selection criteria; and
obtaining additional information about a sample mapped positively according to the selection criteria wherein, for sample ionization, the method does not require a laser, an electrode, or a voltage source.

37. The method of claim 36 , wherein the mapping is performed by imaging software stored on a non-transitory computer readable medium.

38. The method of claim 36 , wherein the sample enters the mass spectrometer through the pressure differential across the inlet channel.

39. The method of claim 36 , wherein pure solvent is loaded between samples.

40. The method of claim 36 , wherein the method acquires data from 1000 samples in one hour.

41. The method of claim 36 , further comprising cooling the sample and the inlet channel.

42. The method of claim 36 , further comprising adding ammonium salts to the sample.

43. The method of claim 36 , further comprising adding a low viscosity solvent to the sample.

44. The method of claim 36 , wherein the serial alignment is achieved using a x,y-stage or a x,y,z-stage.

45. The method of cla

Assignees

• Trimpin Sarah
• Univ Wayne State

Inventors

• Trimpin Sarah

Classifications

• H01J49/0468 Primary

  with means for heating or cooling the sample · CPC title

• H01J49/24

  Vacuum systems, e.g. maintaining desired pressures · CPC title

• H01J49/10

  Ion sources; Ion guns · CPC title

• H01J49/04 Primary

  Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components · CPC title