Stabilization gas environments in a proton-exchanged lithium niobate optical chip

Patent metadata

Field	Value
Publication number	US-9817254-B2
Application number	US-201514628933-A
Country	US
Kind code	B2
Filing date	Feb 23, 2015
Priority date	Feb 23, 2015
Publication date	Nov 14, 2017
Grant date	Nov 14, 2017

Abstract

A stabilized integrated optical circuit is presented. The stabilized integrated optical circuit includes at least one integrated optical chip formed from at least one inorganic material, a stabilizing-polarizable-fill gas, and an enclosure enclosing the at least one integrated optical chip and the stabilizing-polarizable-fill gas. At least one surface of the at least one integrated optical chip is modified by a treatment with at least one treatment gas selected to stabilize defects on the at least one surface. The stabilizing-polarizable-fill gas includes N 2 O and at least one polarizable material.

First claim

What is claimed is:

1. A stabilized integrated optical circuit comprising:
at least one integrated optical chip formed from at least one inorganic material, wherein at least one surface of the at least one integrated optical chip is modified by a treatment with at least one treatment gas selected to stabilize defects on the at least one surface;
a stabilizing-polarizable-fill gas including N 2 O and at least one polarizable material; and
an enclosure enclosing the at least one integrated optical chip and the stabilizing-polarizable-fill gas.

2. The stabilized integrated optical circuit of claim 1 , wherein the at least one integrated optical chip formed from at least one inorganic material is at least one phase modulator formed from a lithium-niobate-based material.

3. The stabilized integrated optical circuit of claim 2 , wherein the at least one treatment gas includes a reactive oxidizing gas.

4. The stabilized integrated optical circuit of claim 3 , wherein the at least one polarizable material includes a refrigerant.

5. The stabilized integrated optical circuit of claim 2 , wherein the at least one treatment gas includes at least a first treatment gas and a second treatment gas, wherein the first treatment gas includes a reactive oxidizing gas and the second treatment gas includes N 2 O, and wherein the at least one polarizable material is a refrigerant.

6. The stabilized integrated optical circuit of claim 2 , wherein the at least one treatment gas includes at least a first treatment gas and a second treatment gas, wherein the first treatment gas is N 2 O and the second treatment gas is N 2 , and wherein the at least one polarizable material is a refrigerant.

7. The stabilized integrated optical circuit of claim 1 , wherein the at least one polarizable material is at least one of: a perfluorinated hydrocarbon; a chlorfluorocarbon; a hydrofluorocarbon; a hydrochlorofluorocarbon; a perfluorocarbon; chloromethane; and dichloromethane.

8. The stabilized integrated optical circuit of claim 1 , wherein the at least one integrated optical chip formed from at least one material is formed from a lithium-niobate-based material, wherein the at least one treatment gas includes a reactive oxidizing gas, and wherein the at least one polarizable material is a refrigerant.

9. The stabilized integrated optical circuit of claim 1 , wherein the at least one treatment gas includes at least a first treatment gas and a second treatment gas wherein the first treatment gas includes a reactive oxidizing gas and the second treatment gas includes a nonreactive gas, and wherein the at least one polarizable material is a refrigerant.

10. A gyroscope system comprising:
a light source to generate a light signal coupled to at least one phase modulator;
the at least one phase modulator formed from a lithium-niobate-based material, wherein at least one surface of the at least one phase modulator is modified by a treatment with at least one treatment gas selected to stabilize defects on the at least one surface;
an enclosure enclosing a stabilizing-polarizable-fill gas and at least the at least one phase modulator, the stabilizing-polarizable-fill gas including N 2 O and at least one polarizable material, wherein the stabilizing-polarizable-fill gas contacts the at least one modified surface of the phase modulator, and wherein the presence of the at least one polarizable material in the stabilizing-polarizable-fill gas reduces an effect of a charge diffusion on the at least one modified surface of the phase modulator when an electric field is applied to the at least one phase modulator; and
a sensing coil configured with coupling components to receive signals from the at least one phase modulator and output signals to the at least one phase modulator.

11. The gyroscope system of claim 10 , wherein the at least one treatment gas includes a reactive oxidizing gas.

12. The gyroscope system of claim 10 , the at least one polarizable material includes a refrigerant.

13. The gyroscope system of claim 10 , wherein the at least one treatment gas includes at least a first treatment gas and a second treatment gas, wherein the first treatment gas includes a reactive oxidizing gas and the second treatment gas includes N 2 O, and wherein the at least one polarizable material is a refrigerant.

14. The gyroscope system of claim 10 , wherein the at least one treatment gas includes at least a first treatment gas and a second treatment gas, wherein the first treatment gas is N 2 O and the second treatment gas is N 2 , and wherein the at least one polarizable material is a refrigerant.

15. The gyroscope system of claim 10 , wherein the at least one polarizable material is at least one of: a perfluorinated hydrocarbon; a chlorfluorocarbon; a hydrofluorocarbon; a hydrochlorofluorocarbon; a perfluorocarbon; chloromethane; and dichloromethane.

16. The gyroscope system of claim 10 , wherein the at least one treatment gas includes N 2 O, and wherein the at least one polarizable material is a perfluorinated hydrocarbon.

17. A method of stabilizing an integrated optical circuit, the method comprising:
providing at least one integrated optical chip formed from at least one inorganic material;
treating at least one surface of the integrated optical chip with at least one treatment gas selected to modify the at least one surface to stabilize defects on the at least one surface;
positioning the treated integrated optical chip in an enclosure;
filling the enclosure with a stabilizing-polarizable-fill gas, the stabilizing-polarizable-fill gas including N 2 O and at least one polarizable material; and
sealing the enclosure to enclose the at least one integrated optical chip and the stabilizing-polarizable-fill gas, wherein the stabilizing-polarizable-fill gas stabilizes the at least one modified surface of the integrated optical chip.

18. The method of claim 17 , further comprising:
applying an electric field to the at least one lithium-niobate-based integrated optical chip.

19. The method of claim 18 , wherein treating the at least one surface of the integrated optical chip with the at least one treatment gas comprises:
treating the at least one surface of the integrated optical chip with a reactive oxidizing gas, wherein the presence of the at least one polarizable material in the stabilizing-polarizable-fill gas reduces an effect of a charge diffusion on the at least one modified surface of the integrated optical chip when an electric field is applied to the at least one lithium-niobate-based integrated optical chip.

20. The method of claim 17 , wherein filling the enclosure with the stabilizing-polarizable-fill gas including N 2 O and at least one polarizable material comprises:
filling the enclosure with N 2 O and a refrigerant.

Assignees

• Honeywell Int Inc

Inventors

• Iwamoto Nancy E
• Sanders Steven J
• Yates Stephen F
• Fechner Paul S
• Taranta Austin

Classifications

• G01C19/722

  of the mechanical construction · CPC title

• G02B6/102

  for infrared and ultraviolet radiation · CPC title

• G01C19/72

  with counter-rotating light beams in a passive ring, e.g. fibre laser gyrometers · CPC title

• G02B6/12

  of the integrated circuit kind (electric integrated circuits H10B, H10D84/00 - H10D89/00, H10F19/00, H10F39/00, H10H29/00, H10K19/00, H10K39/00, H10K59/00, H10N19/00, H10N39/00, H10N59/00, H10N69/00, H10N79/00, H10N89/00) · CPC title

• G02F1/035 Primary

  in an optical waveguide structure · CPC title