Method and apparatus for testing a transformer

US9817053B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9817053-B2
Application numberUS-201414782183-A
CountryUS
Kind codeB2
Filing dateFeb 4, 2014
Priority dateApr 5, 2013
Publication dateNov 14, 2017
Grant dateNov 14, 2017

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  1. Title

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  2. Abstract

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  5. First independent claim

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Abstract

Official abstract text for this publication.

For testing a transformer ( 20 ) the transformer ( 20 ) is emulated by an equivalent circuit ( 30 ) and an accuracy of the transformer ( 20 ) relative to the equivalent circuit ( 30 ) is determined by evaluating a test response of the transformer ( 20 ) and is then automatically converted to an operating condition-related accuracy of the transformer ( 20 ).

First claim

Opening claim text (preview).

The invention claimed is: 1. Method for testing a transformer, comprising the steps a) emulating the transformer by means of an equivalent circuit, b) applying a test signal to the transformer, c) detecting a test response of the transformer in dependence on the test signal, d) automatically determining an equivalent-circuit-related accuracy of the transformer on the basis of the test response, and e) automatically determining an operating-condition-related accuracy of the transformer from the equivalent-circuit-related accuracy. 2. Method according to claim 1 , wherein in steps c) and d), components of the equivalent circuit are determined automatically in dependence on the test response of the transformer in order to determine the equivalent-circuit-related accuracy of the transformer on the basis of the equivalent circuit thus provided with specific values for the components. 3. Method according to claim 1 , wherein in step d), an equivalent-circuit-related voltage deviation and/or an equivalent-circuit-related phase displacement of the transformer are determined for different burdens, operating voltages and/or operating frequencies of the transformer, and are converted in step e) into a corresponding voltage deviation or a corresponding phase displacement for corresponding operating conditions of the transformer. 4. Method according to claim 1 , wherein in step e), the equivalent-circuit-related accuracy of the transformer is converted into the operating-condition-related accuracy of the transformer using a simulation model of the transformer, wherein the simulation model takes into consideration frequency-dependent and flux-dependent iron losses of the transformer. 5. Method according to claim 1 , wherein for determining the equivalent-circuit-related accuracy of the transformer, a test signal with a voltage of not more than 10 V and/or a frequency of not more than 10 Hz is applied. 6. Method according to claim 1 , wherein for determining the equivalent-circuit-related accuracy of the transformer, a test signal with a voltage less than the nominal voltage of the transformer and a frequency less than the nominal frequency of the transformer is applied. 7. Method according to claim 1 , wherein in steps b) to d), a primary winding resistance and a secondary winding resistance of the equivalent circuit are determined by means of a resistance measurement on the transformer. 8. Method according to claim 7 , wherein a resistance measurement is carried out at each secondary winding of the transformer in order to determine the corresponding secondary winding resistance for each secondary winding, wherein a transformed primary winding resistance of the equivalent circuit is determined automatically from the determined secondary winding resistances and from measured stray losses of the transformer. 9. Method according to claim 1 , wherein in steps b) to d), stray losses of the transformer are determined automatically by a short-circuit impedance measurement. 10. Method according to claim 9 , wherein for determining the stray losses of the transformer, the primary side is short circuited and a test signal is applied to each secondary winding of the transformer in succession. 11. Method according to claim 1 , wherein in steps b) to d), leakage inductances of the equivalent circuit of the transformer are determined automatically by short-circuit impedance measurements on the primary side and on the secondary side. 12. Method according to claim 1 , wherein in steps b) to d), a measurement of the magnetisation behaviour of the transformer is carried out by applying test signals with different voltages and frequencies. 13. Method according to claim 1 , wherein in steps b) to d), the transformation ratio of the transformer is determined. 14. Method according to claim 13 , wherein for determining the transformation ratio, a test signal with a voltage in the range of from 3% to 80% of the nominal voltage of the transformer is applied to the transformer on the primary side. 15. Method according to claim 13 , wherein a measurement of a total transformation ratio of the transformer, a measurement of a transformation ratio of an inductive voltage transformer of the transformer and a measurement of a transformation ratio of a capacitive voltage divider of the transformer are carried out. 16. Method according to claim 1 , wherein when determining the accuracy of the transformer, a winding adjustment carried out during the manufacture of the transformer is automatically taken into consideration. 17. Method according to claim 16 , wherein the winding adjustment is taken into consideration when determining the transformation ratio of the transformer in steps b) to d). 18. Method according to claim 1 , wherein the test response is detected using a four-wire measuring method. 19. Method according to claim 1 , wherein the method is carried out for a transformer in the form of an inductive voltage transformer or for a transformer in the form of a capacitive voltage transformer. 20. Method according to claim 1 , wherein the method is carried out by means of a portable test device at the installation site of the transformer. 21. Device for testing a transformer, comprising a test signal source generating a test signal which is to be applied to the transformer, a test response detection device having a measuring input to connect to the transformer to detect a test response of the transformer in dependence on the test signal, and a control unit coupled to the test response detection device to receive the test response of the transformer, the control unit emulating the transformer by determining components of an equivalent circuit of the transformer, on the basis of the test response, automatically determining an equivalent-circuit-related accuracy of the transformer, and converting that accuracy into an operating-condition-related accuracy of the transformer. 22. Device according to claim 21 , wherein the device is in the form of a portable test device for carrying out an in situ test of the transformer. 23. Device according to claim 21 , wherein the device is configured for testing a transformer in the form of a voltage transformer.

Assignees

Inventors

Classifications

  • G01R31/62Primary

    Testing of transformers · CPC title

  • Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections (testing of sparking plugs H01T13/58) · CPC title

  • of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating · CPC title

  • G01R31/027Primary

    Physics · mapped topic

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What does patent US9817053B2 cover?
For testing a transformer ( 20 ) the transformer ( 20 ) is emulated by an equivalent circuit ( 30 ) and an accuracy of the transformer ( 20 ) relative to the equivalent circuit ( 30 ) is determined by evaluating a test response of the transformer ( 20 ) and is then automatically converted to an operating condition-related accuracy of the transformer ( 20 ).
Who is the assignee on this patent?
Omicron Electronics Gmbh
What technology area does this patent fall under?
Primary CPC classification G01R31/62. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Nov 14 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).