Compound sensor including a plurality of detection elements and a plurality of fault detection circuits

Patent metadata

Field	Value
Publication number	US-9810734-B2
Application number	US-201314764067-A
Country	US
Kind code	B2
Filing date	Nov 19, 2013
Priority date	Feb 1, 2013
Publication date	Nov 7, 2017
Grant date	Nov 7, 2017

Abstract

A compound sensor capable of suppressing a fault which has occurred in a detection element from affecting other detection units in which no fault has occurred is provided. The compound sensor includes: a plurality of detection units including C/V conversion circuits 321 a and 321 b , amplifier circuits 322 a and 322 b , ADCs 323 a and 323 b , diagnosis voltage outputting DACs 327 a and 327 b , carrier signal generating DACs 328 a and 328 b and substrate voltage generating DACs 329 a and 329 b which are signal detection circuits provided for each of a plurality of detection elements; a power source voltage input unit 331 and a GND voltage input unit 332 shared among each of the plurality of detection units; and overcurrent switch circuits 101 a and 101 b which are fault detection circuits for detecting a fault of each detection element and stopping power supply to the detection unit in which the fault has occurred.

First claim

The invention claimed is:

1. A compound sensor for detecting a plurality of physical quantities, the compound sensor comprising:
a plurality of detection elements;
a plurality of signal detection circuits provided for processing signals received from the plurality of detection elements;
a power source shared among each of the plurality of detection elements; and
a plurality of fault detection circuits provided for each of the plurality of detection elements for detecting a fault of each detection element and stopping power supply to a faulty detection element;
wherein the plurality of fault detection circuits detect fault occurrence by detecting when a current in the faulty detection element is not at a predetermined value or when the current is larger than a threshold;
wherein the signal detection circuits includes a low-pass filter for removing noise; and
wherein a response time from detection of a fault of each detection element to stop of power supply to the detection element in which the fault has occurred in each of the plurality of signal detection circuits is shorter than a time constant of the low-pass filter.

2. The compound sensor according to claim 1 ,
wherein the plurality of detection elements include first and second acceleration detection elements for detecting biaxial acceleration.

3. The compound sensor according to claim 1 , further comprising:
a reference voltage generation circuit and a clock generation circuit shared among each of the plurality of detection elements,
wherein each of the plurality of fault detection circuits has a buffer circuit, and
at least one of a voltage signal of the reference voltage generated by the reference voltage generation circuit and a clock voltage signal generated by the clock generation circuit is supplied to each of the signal detection circuits through each of the plurality of buffer circuits.

4. The compound sensor according to claim 3 ,
wherein each of the plurality of fault detection circuits monitors change in consumption current of the buffer circuit, determines a fault of a detection element when the consumption current is not at a predetermined current value, and stops power supply to the detection element in which the fault has occurred.

5. The compound sensor according to claim 1 , further comprising:
a communication circuit which notifies by an output communication frame that each of the plurality of fault detection circuits has stopped supplying power to the detection element in which the fault has occurred.

6. The compound sensor according to claim 5 ,
wherein the output communication frame contains contents to notify that power supply to the detection element in which the fault has occurred has been stopped and output values of the plurality of detection elements.

7. The compound sensor according to claim 1 ,
wherein each of the plurality of detection elements includes movable parts, electrodes and dummy pattern parts, and
a voltage of the dummy pattern parts differs from any one of voltages of the movable parts and the electrodes.

Assignees

• Hitachi Automotive Systems Ltd

Inventors

• Maeda Daisuke
• Ohsaka Ichiroh
• Hayashi Masahide

Classifications

• G01P21/00

  Testing or calibrating of apparatus or devices covered by the preceding groups · CPC title

• G01P15/125

  by capacitive pick-up · CPC title

• G01C19/5776

  Signal processing not specific to any of the devices covered by groups G01C19/5607 - G01C19/5719 · CPC title

• G01P15/18

  in two or more dimensions · CPC title

• G01C19/5726

  Signal processing · CPC title