Defect detection device and production system

Patent metadata

Field	Value
Publication number	US-9805457-B2
Application number	US-201415324250-A
Country	US
Kind code	B2
Filing date	Jul 8, 2014
Priority date	Jul 8, 2014
Publication date	Oct 31, 2017
Grant date	Oct 31, 2017

Abstract

Provided is a defect detection device capable of measuring the volume of surface defects. The defect detection device includes: an imaging device configured to image an image of an inspection object; a binarization processing unit configured to subject the image to first and second binarization processing by use of different first and second binarization thresholds, so as to calculate first and second sizes for an identical defect in the image; a ratio calculation unit configured to calculate a first ratio of the second size to the first size; and a depth determination unit configured to determine a depth of the defect depending on the first ratio.

First claim

The invention claimed is:

1. A defect detection device comprising:
an imaging device configured to image an image of an inspection object;
a binarization processing unit configured to subject the image to first and second binarization processing by use of different first and second binarization thresholds, so as to calculate first and second sizes for an identical defect in the image;
a ratio calculation unit configured to calculate a first ratio of the second size to the first size; and
a depth determination unit configured to determine a depth of the defect depending on the first ratio.

2. The defect detection device according to claim 1 , further comprising:
a volume calculation unit configured to calculate a volume of the defect depending on the depth of the defect determined, and calculate a sum of volumes of all defects in the image; and
a quality determination unit configured to determine whether the inspection object is fine or inferior according to the sum of the volumes of the all defects.

3. The defect detection device according to claim 1 , wherein:
the binarization processing unit subjects the image to third binarization processing by use of a third binarization threshold different from the first and second binarization thresholds, so as to calculate a third size for the identical defect in the image;
the ratio calculation unit calculates a second ratio of the third size to the first size; and
the depth determination unit determines a depth of the defect depending on the first and second ratios.

4. The defect detection device according to claim 1 , wherein the depth determination unit compares the first ratio with each of a plurality of thresholds different from each other to determine depths of the defect several times, so as to comprehensively evaluate the depth of the defect according to the depths determined several times.

5. The defect detection device according to claim 1 , wherein:
the inspection object is a cylinder block of an engine; and
the defect includes at least a pit and a blowhole.

6. A production system comprising:
a defect detection device comprising:
an imaging device configured to image an image of an inspection object;
a binarization processing unit configured to subject the image to first and second binarization processing by use of different first and second binarization thresholds, so as to calculate first and second sizes for an identical defect in the image;
a ratio calculation unit configured to calculate a first ratio of the second size to the first size;
a depth determination unit configured to determine a depth of the defect depending on the first ratio; and
a volume calculation unit configured to calculate a volume of the defect depending on the depth of the defect determined, and calculate a sum of volumes of all defects in the image, and

a processing device configured to arrange a processing condition for the inspection object according to the sum of the volumes of the all defects.

Assignees

• Nissan Motor

Inventors

• Shibayama Hirohisa
• Shiotani Eiji
• Sakurai Satoru
• Sugiyama Kiyokazu
• Shimizu Akira
• Terada Daisuke
• Noshi Yoshitsugu
• Utsumi Yoshito

Classifications

• G06T2207/30108

  Industrial image inspection · CPC title

• G06T7/62

  of area, perimeter, diameter or volume · CPC title

• G01N21/88

  Investigating the presence of flaws or contamination · CPC title

• G01B11/30

  for measuring roughness or irregularity of surfaces · CPC title

• B23Q17/24

  using optics {or electromagnetic waves} · CPC title