Interleaver design and pairwise codeword distance distribution enhancement for turbo autoencoder
US-12175353-B2 · Dec 24, 2024 · US
US9805302B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9805302-B2 |
| Application number | US-201414213368-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 14, 2014 |
| Priority date | May 30, 2013 |
| Publication date | Oct 31, 2017 |
| Grant date | Oct 31, 2017 |
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A synapse circuit to perform spike timing dependent plasticity (STDP) operation is provided. The synapse circuit includes a memristor having a resistance value, a transistor connected to the memristor, and the transistor configured to receive at least two input signals. The resistance value of the memristor is changed based on a time difference between the at least two input signals received by the transistor.
Opening claim text (preview).
What is claimed is: 1. A synapse circuit to perform spike timing dependent plasticity (STDP) operation, the synapse circuit comprising: a memristor having a resistance value; and a transistor connected to the memristor, the transistor configured to receive at least two input signals, wherein the resistance value of the memristor is changed based on a time difference between the at least two input signals received by the transistor, wherein terminals of the memristor are respectively coupled to a reference voltage and a drain terminal of the transistor, wherein the at least two input signals comprise a first input signal applied to a gate terminal of the transistor and a second input signal applied to a source terminal of the transistor, and wherein the first input signal is provided by a pre-synaptic neuron circuit and the second input signal is provided by a post-synaptic neuron circuit. 2. The synapse circuit of claim 1 , wherein the resistance value of the memristor is changed based on a voltage change caused by the time difference between the at least two input signals. 3. The synapse circuit of claim 1 , wherein the resistance value of the memristor is changed based on a time difference between a first input signal applied to a gate terminal of the transistor and a second input signal based on a membrane voltage applied to a source terminal of the transistor. 4. The synapse circuit of claim 3 , wherein a direction of a current flowing on the memristor is determined by a voltage difference caused by the time difference between the first input signal and the second input signal. 5. The synapse circuit of claim 3 , wherein an amount of a current flowing on the memristor is determined by a voltage difference caused by the time difference between the first input signal and the second input signal. 6. The synapse circuit of claim 3 , wherein the synapse circuit further comprises: a first terminal connected to the gate terminal of the transistor and configured to provide the first input signal, and a second terminal connected to the source terminal of the transistor and configured to provide the second input signal, and the synapse circuit is connected to the pre-synaptic neuron circuit through the first terminal and to the post-synaptic neuron circuit through the second terminal. 7. The synapse circuit of claim 6 , wherein the post-synaptic neuron circuit is configured to generate a spike fired with reference to a resting voltage. 8. The synapse circuit of claim 7 , wherein the post-synaptic neuron circuit comprises an N-metal oxide semiconductor (MOS) and a P-MOS transistor, the N-MOS transistor and the P-MOS transistor being serially connected; a resting voltage source to supply the resting voltage is connected to a source terminal of the N-MOS transistor; and a capacitor is connected to a source terminal of the P-MOS transistor. 9. The synapse circuit of claim 1 , wherein different voltages are applied to the memristor and the source terminal of the transistor. 10. The synapse circuit of claim 1 , wherein a channel of the memristor is serially connected to a channel of the transistor. 11. The synapse circuit of claim 1 , wherein the transistor comprises an N-MOS transistor. 12. A neuromorphic system comprising: a synapse circuit configured to perform spike timing dependent plasticity (STDP) operation, the synapse circuit comprising a first terminal, a second terminal, a memristor having a resistance value, and a transistor connected to the memristor; a pre-synaptic neuron circuit connected to the memristor through the first terminal of the synapse circuit; and a post-synaptic neuron circuit connected to the memristor through the second terminal of the synapse circuit, wherein the resistance value of the memristor is changed based on a time difference between at least two input signals received by the synapse circuit, wherein terminals of the memristor are respectively coupled to a reference voltage and a drain terminal of the transistor, wherein the at least two input signals comprise a first input signal applied to a gate terminal of the transistor and a second input signal applied to a source terminal of the transistor, and wherein the first input signal is provided by a pre-synaptic neuron circuit and the second input signal is provided by a post-synaptic neuron circuit. 13. The neuromorphic system of claim 12 , wherein the first terminal of the synapse circuit is connected to a gate terminal of the transistor to provide a first input signal, and the second terminal of the synapse circuit is connected to a source terminal of the transistor to provide a second input signal. 14. The neuromorphic system of claim 13 , wherein the resistance value of the memristor is changed based on a time difference between the first input signal applied to the gate terminal of the transistor and the second input signal based on a membrane voltage applied to the source terminal of the transistor. 15. The neuromorphic system of claim 14 , wherein a direction of a current flowing on the memristor is determined by a voltage difference caused by the time difference between the first input signal and the second input signal. 16. The neuromorphic system of claim 14 , wherein an amount of a current flowing on the memristor is determined by a voltage difference caused by the time difference between the first input signal and the second input signal. 17. The neuromorphic system of claim 13 , wherein the post-synaptic neuron circuit is configured to generate a spike fired with reference to a resting voltage. 18. The neuromorphic system of claim 17 , wherein the post-synaptic neuron circuit comprises an N-metal oxide semiconductor (MOS) and a P-MOS transistor, wherein the N-MOS transistor and the P-MOS transistor are serially connected, a resting voltage source to supply the resting voltage is connected to a source terminal of the N-MOS transistor, and a capacitor is connected to a source terminal of the P-MOS transistor. 19. A method of performing spike timing dependent plasticity (STDP) operation between a pre-synaptic neuron circuit and a post-synaptic neuron circuit, the method comprising: receiving a pre-synaptic input signal from the pre-synaptic neuron circuit, the pre-synaptic input signal comprising a first input signal applied to a gate terminal of a transistor; receiving a post-synaptic input signal from the post-synaptic neuron circuit, the post-synaptic input signal comprising a second input signal applied to a source terminal of the transistor; and adjusting a resistance value of a memristor based on a time difference between the pre-synaptic input signal and the post-synaptic input signal, wherein the post-synaptic input signal is based on a charge stored in a capacitor of the post synaptic neuron circuit.
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