Dual-path analog to digital converter

Patent metadata

Field	Value
Publication number	US-9804249-B2
Application number	US-201414541454-A
Country	US
Kind code	B2
Filing date	Nov 14, 2014
Priority date	Nov 14, 2014
Publication date	Oct 31, 2017
Grant date	Oct 31, 2017

Abstract

Methods and apparatus for processing a signal comprise at least one circuit configured to generate a measured signal during a measured time period and a reference signal during a reference time period. Also included is at least one dual- or multi-path analog-to-digital converter comprising at least a first processing circuit configured to process the measured signal, at least a second processing circuit configured to process the reference signal, and a third processing circuit configured to process both the measured signal and the reference signal.

First claim

What is claimed is:

1. An apparatus comprising:
at least one magnetic field sensing circuit configured to generate a measured signal representing a magnetic field during a measured time period and to generate a reference signal representing a reference magnetic field during a reference time period; and
at least one multi-path analog-to-digital converter (ADC) comprising:
an input;
an output; and
at least one multi-path integrator circuit to integrate the measured signal during the measured time period and integrate the reference signal during the reference time period, the multi-path integrator circuit comprising:
a first processing circuit selectively coupled between the input and the output during the measured time period to process the measured signal and decoupled from the input and the output during the reference time period; and
a second processing circuit selectively coupled between the input and the output during the reference time period to process the reference signal and decoupled from the input and the output during the measured time period; and

at least one shared signal processing circuit configured to process both the measured signal and the reference signal.

2. The apparatus of claim 1 wherein the measured time period and the reference time period are alternating time periods.

3. The apparatus of claim 1 further comprising a control circuit configured to enable the first processing circuit during the measured time period and to enable the second processing circuit during the reference time period.

4. The apparatus of claim 1 wherein the first processing circuit comprises a first capacitor for processing the measured signal and the second processing circuit comprises a second capacitor for processing the reference signal.

5. The apparatus of claim 1 further comprising a calibration circuit configured to combine the processed measured signal with the processed reference signal to generate a calibrated magnetic field signal.

6. The apparatus of claim 1 wherein the analog-to-digital converter is a sigma-delta analog-to-digital converter.

7. The apparatus of claim 1 further comprising a built in self-test circuit configured to detect an error in the apparatus.

8. The apparatus of claim 1 wherein the at least one magnetic field sensing circuit configured to generate the measured signal and the reference signal comprises at least one magnetic field sensing element.

9. The apparatus of claim 8 wherein the at least one magnetic field sensing element comprises a Hall effect element, a magnetoresistive element, or both.

10. The apparatus of claim 1 further comprising a fault circuit configured to determine whether an output signal of the apparatus, generated by the apparatus in response to the reference signal, indicates a fault in the apparatus.

11. The apparatus of claim 10 wherein the fault circuit determines whether the output signal indicates a fault by comparing the output signal to an expected value.

12. A analog-to-digital converter comprising:
an input configured to receive a measured signal during a measured time period and a reference signal during a reference time period;
at least one shared circuit coupled to receive the measured signal and reference signal from the input, and configured to process both the measured signal and the reference signal through a single signal path of the one shared circuit, wherein the at least one shared circuit comprises a multi-path integrator circuit comprising:
a first integration path for processing the measured signal and a second integration path for processing the reference signal, wherein the first integration path is coupled to the single signal path during the measured time period and decoupled from the single signal path during the reference time period, and the second integration path is coupled to the single signal path during the reference time period and decoupled from the single signal path during the measured time period;

and
a control circuit to selectively couple the first integration path to the single signal path to process the measured signal and couple the second integration path to the single signal path to process the reference signal.

13. The analog-to-digital converter of claim 12 wherein the measured time period and the reference time period are alternating time periods.

14. The analog-to-digital converter of claim 12 wherein the analog-to-digital converter is a sigma-delta analog-to-digital converter.

15. A magnetic field sensor comprising:
at least one magnetic field sensing element configured to generate a measured magnetic field signal responsive to an external magnetic field and to generate a reference magnetic field signal responsive to a reference magnetic field; and
a signal path for processing the measured magnetic field signal during a measured time period and processing the reference magnetic field during a reference time period, the signal path comprising a dual-path analog-to-digital converter (ADC);
wherein the dual-path ADC comprises at least one dual-path integrator circuit to integrate the measured signal during the measured time period and integrate the reference signal during the reference time period, the dual-path integrator circuit comprising
a first processing circuit selectively coupled to the signal path during the measured time period to process the measured signal and decoupled from the signal path during the reference time period;
a second processing circuit selectively coupled to the signal path during the reference time period to process the reference signal and decoupled from the signal path during the measured time period.

16. The magnetic field sensor of claim 15 further comprising a comparison circuit to determine whether an output signal of the signal path during the measured time period indicates a fault condition by comparing the output signal to an expected value.

17. The magnetic field sensor of claim 15 further comprising a reference coil proximate to the at least one magnetic field sensing element, wherein the reference coil is configured to carry a reference current to generate the reference magnetic field.

18. The magnetic field sensor of claim 15 further comprising a built in self-test circuit configured to detect an error in magnetic field sensor.

19. The magnetic field sensor of claim 15 further comprising a control circuit configured to couple and decouple the first and second processing circuits from the signal path.

20. The magnetic field sensor of claim 19 wherein the first processing circuit comprises one or more first capacitors and the second processing circuit comprises one or more second capacitors.

21. The magnetic field sensor of claim 20 wherein the control circuit is configured to:
couple the one or more first capacitors to the signal path during the measured time period;
decouple the one or more first capacitors from the signal path during the reference time period;
couple the one or more second capacitors to the signal path during the reference time period; and
decouple the one or more second capacitors from the signal path during the measured time period.

22. A method of testing a magnetic field sensor comprising:
generating a measured signal;
generating a reference signal;
processing the measured signal with a shared signal path of the magnetic field sensor during a measured time period, wherein the shared signal path includes a dual-path analog-to-digital converter (ADC), wherein the dual-path

Assignees

• Allegro Microsystems Llc

Inventors

• Petrie Craig S
• Choe Soo-Chang

Classifications

• H03M1/34

  Analogue value compared with reference values (H03M1/48 takes precedence) · CPC title

• G01R35/005 Primary

  Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references (G01R33/0035, G01R35/002 take precedence) · CPC title

• G01D5/142

  using Hall-effect devices (measuring magnetic variables using Hall-effect or other galvanomagnetic devices G01R33/06) · CPC title

• G01R33/0035

  Calibration of single magnetic sensors, e.g. integrated calibration · CPC title

• G01R33/0017 Primary

  Means for compensating offset magnetic fields or the magnetic flux to be measured; Means for generating calibration magnetic fields · CPC title