Power noise histogram of a computer system

Patent metadata

Field	Value
Publication number	US-9804231-B2
Application number	US-201414246376-A
Country	US
Kind code	B2
Filing date	Apr 7, 2014
Priority date	Apr 23, 2013
Publication date	Oct 31, 2017
Grant date	Oct 31, 2017

Abstract

A method is provided for determining a power noise histogram of a computer system. The computer system includes a skitter circuit with multiple skitter bins, each skitter bin of the multiple skitter bins being connected to a signal line at one or more clock cycles. The method includes: connecting each skitter bin to an individual counter circuit; and incrementing a counter when the respective skitter bin is enabled.

First claim

What is claimed is:

1. A method comprising:
determining a power noise histogram of a computer system, said computer system comprising a skitter circuit with multiple skitter bins, said skitter bins each being connected to a signal line at one or more clock cycles, the determining comprising:
connecting each skitter bin to an individual counter circuit;
incrementing a counter when the respective skitter bin is enabled;

calibrating the skitter bins by determining a voltage corresponding to each skitter bin;
defining a critical voltage limit;
measuring a voltage distribution during computer system operation for a range of skitter bins;
extrapolating the voltage distribution beyond the boundaries of the range of skitter bins; and
calculating a probability of the computer system from the extrapolated voltage distribution to reach the predefined voltage limit.

2. The method of claim 1 , further comprising sampling the voltage distribution with an on-chip skitter counter circuit.

3. The method of claim 1 , further comprising predicting a probability for the computer system to fail based on the extrapolated voltage distribution.

4. The method of claim 3 , further comprising calculating a correlation between the critical voltage limit and the probability for the computer system to fail.

5. The method of claim 1 , further comprising determining a voltage corresponding to each skitter bin by measuring a distribution of counts for the multiple skitter bins of the skitter circuit for a signal with a defined voltage.

6. The method of claim 1 , further comprising determining a critical voltage limit by reducing a supply voltage of the computer system registering a fail count of the computer system.

7. The method of claim 1 , further comprising measuring a voltage distribution during computer system operation for a range of skitter bins by registering a count distribution of the corresponding counter circuit.

8. The method of claim 7 , further comprising extrapolating the voltage distribution beyond the boundaries of the rage of skitter bins by approximating the voltage distribution for values smaller than a skitter bin resolution.

9. The method of claim 8 , further comprising calculating the probability for the computer system to fail from the extrapolated voltage distribution by integrating the voltage distribution within the skitter bin range of the critical voltage limit.

10. The method of claim 7 , further comprising adjusting the voltage distribution of the computer system to a predetermined probability for the computer system to fail by changing a supply voltage of the computer system.

11. The method of claim 7 , further comprising adjusting an executed program of the system to a predetermined probability for the computer system to fail by changing the executed program in a way that the resulting voltage distribution has a smaller width than before, staying at the same mean voltage.

12. The method of claim 1 , further comprising stopping measuring voltage distribution during computer system operation with multiple skitter bins if at least one of the multiple counter circuits connected to the skitter bins is exhibiting an overflow.

13. An apparatus for determining a power noise histogram of a computer system, said apparatus comprising:
a skitter circuit with multiple skitter bins, said skitter bins each being connected to a signal line at one or more clock cycles;
each skitter bin being connected to an individual counter circuit for incrementing a counter when the respective skitter bin is enabled;
calibrating the skitter bins by determining a voltage corresponding to each skitter bin;
defining a critical voltage limit;
measuring a voltage distribution during computer operation for a range of skitter bins;
extrapolating the voltage distribution beyond the boundaries of the range of skitter bins; and
calculating a probability of the computer system from the extrapolated voltage distribution to reach the predefined critical voltage limit.

14. The apparatus of claim 13 , wherein the counter circuit is implemented as an on-chip skitter counter circuit.

15. The apparatus of claim 14 , wherein the circuitry for extrapolating the voltage distribution beyond the boundaries of the range of skitter bins is implemented on the on-chip skitter counter circuit.

16. The apparatus of claim 15 , wherein the circuitry for calculating the probability of the computer system to fail from the extrapolated voltage distribution is implemented on the on-chip skitter counter circuit.

17. The apparatus of claim 14 , wherein the circuitry for calculating the probability of the computer system to fail from the extrapolated voltage distribution is implemented on the on-chip skitter counter circuit.

Assignees

• Globalfoundries Inc

Inventors

• Eckert Martin
• Harrer Hubert
• Strach Thomas

Classifications

• G06F1/26 Primary

  Power supply means, e.g. regulation thereof (for memories G11C) · CPC title

• G01R31/40 Primary

  Testing power supplies (testing photovoltaic devices H02S50/10) · CPC title

• G01R31/30

  Marginal testing, e.g. by varying supply voltage (testing computers during standby operation or idle time G06F11/22) · CPC title

• G01R29/26

  Measuring noise figure; Measuring signal-to-noise ratio · CPC title

• G01R31/31709 Primary

  Jitter measurements; Jitter generators (measuring jitter, noise figure or signal-to-noise ratio per se G01R29/26; analysis of tester signals G01R31/31901) · CPC title