Angle sensor temperature correcting device

Patent metadata

Field	Value
Publication number	US-9804006-B2
Application number	US-201514660277-A
Country	US
Kind code	B2
Filing date	Mar 17, 2015
Priority date	Mar 31, 2014
Publication date	Oct 31, 2017
Grant date	Oct 31, 2017

Abstract

An angle sensor temperature correcting device includes: a zero correcting factor storing portion that stores, as a reference temperature bridge midpoint potential difference offset and a bridge total resistance indicating value, a difference from an actual correct value, for a relative angle between a bridge circuit and a magnetic field, for the bridge midpoint potential difference, and a value indicating the total resistance of the bridge circuit, at a reference temperature, and stores, as a zero correcting factor, a ratio of the bridge midpoint potential difference offset and the bridge total resistance indicating value at the reference temperature; and a temperature correcting portion that performs temperature correction on angle information obtained from the bridge midpoint potential difference of the bridge circuit at a given time, based on a zero correcting factor stored in the zero correcting factor storing portion.

First claim

The invention claimed is:

1. An angle sensor temperature correcting device, comprising:
a bridge circuit configured to include four magnetoresistive elements, connected in a bridge connection, and to receive a supply of a constant current across power supply terminals;
a magnetic field generator configured to generate a magnetic field that acts on this bridge circuit, for performing temperature correction on angle information from an angle sensor that outputs a bridge midpoint potential difference for the bridge circuit as relative angle information between the bridge circuit and the magnetic field;
a zero correcting factor storing portion configured to store, at a reference temperature, as a bridge midpoint potential difference offset, a difference from an actual value to a correct value for a relative angle between the bridge circuit and the magnetic field of the bridge midpoint potential difference, and as a bridge total resistance indicating value a value indicating the total resistance of the bridge circuit at the reference temperature, and configured to store, as a zero correcting factor, a ratio of the bridge midpoint potential difference offset and the bridge total resistance indicating value at the reference temperature; and
a temperature correcting portion configured to perform temperature correction on angle information obtained from the bridge midpoint potential difference of the bridge circuit at a current time, based on the bridge total resistance indicating value of the bridge circuit at the current time and the zero correcting factor stored in the zero correcting factor storing portion.

2. The angle sensor temperature correcting device as set forth in claim 1 , further comprising:
a span correcting factor storing portion configured to store, as a reference temperature span, a difference between a maximum value and a minimum value of the bridge midpoint potential difference of the bridge circuit at the reference temperature, obtained by rotating the magnetic field that acts on the bridge circuit, and configured to store, as a span correcting factor, a factor calculated from the reference temperature span and the bridge total resistance indicating value at the reference temperature;

wherein:
the temperature correcting portion configured to perform a temperature correction of the angle information obtained from the bridge midpoint potential difference of the bridge circuit at the current time based on a the bridge total resistance indicating value of the bridge circuit at the current time and a span correcting factor that is stored in the span correcting factor storing portion.

3. The angle sensor temperature correcting device as set forth in claim 2 , further comprising:
the temperature correcting portion calculates a current temperature-corrected bridge midpoint potential difference offset based on the bridge total resistance indicating value of the bridge circuit at the current time and the zero correcting factor stored in the zero correcting factor storing portion, calculates a temperature-corrected span for the current time based on the bridge total resistance indicating value for the bridge circuit at the current time and the span correcting factor stored in the span correcting factor storing portion, and performs temperature correction of the angle information, obtained from the bridge midpoint potential difference of the bridge circuit at the current time, based on the current temperature-corrected bridge midpoint potential difference offset and span.

4. The angle sensor temperature correcting device as set forth in claim 1 , wherein:
the bridge total resistance indicating value is a voltage across the power supply terminals of the bridge circuit.

5. The angle sensor temperature correcting device as set forth in claim 1 , wherein:
the bridge total resistance indicating value is a bridge midpoint electrical potential sum for the bridge circuit.

6. The angle sensor temperature correcting device as set forth in claim 1 , wherein:
the difference from the actual value to the correct value, for a relative angle between the bridge circuit and the magnetic field, of the bridge midpoint potential difference at the reference temperature is a value obtained through using a maximum value and a minimum value of the bridge midpoint potential difference of the bridge circuit at the reference temperature, obtained by rotating a magnetic field that acts on the bridge circuit.

7. The angle sensor temperature correcting device as set forth in claim 1 , wherein:
the difference from the actual value to the correct value, for a relative angle between the bridge circuit and the magnetic field, of the bridge midpoint potential difference at the reference temperature is the bridge midpoint potential difference of the bridge circuit at the reference temperature when not in a magnetic field.

Assignees

• Azbil Corp

Inventors

• Nomiyama Takashi

Classifications

• G01D5/2449

  using hard-stored calibration data · CPC title

• G01D5/2448

  Correction of gain, threshold, offset or phase control · CPC title

• G01D5/24452

  Physics · mapped topic

• G01D18/00 Primary

  Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00 · CPC title

• G01D5/16

  by varying resistance · CPC title