Test fixture and test method using the same

Patent metadata

Field	Value
Publication number	US-9797944-B2
Application number	US-201414537192-A
Country	US
Kind code	B2
Filing date	Nov 10, 2014
Priority date	Nov 10, 2014
Publication date	Oct 24, 2017
Grant date	Oct 24, 2017

Abstract

The present disclosure relates to the field of display technology, in particular to a test fixture, comprising a pressing connection mechanism ( 1 ), an eccentric mechanism ( 2 ), and a working carrier ( 3 ), the pressing connection mechanism ( 1 ) and the working carrier ( 3 ) being arranged correspondingly, and the rotation of the eccentric mechanism ( 2 ) driving the pressing connection mechanism ( 1 ) to move up and down in a Y direction so as to conduct a signal pressing connection test for a tested product on the working carrier ( 3 ). The test fixture has a simple structure and steady properties, easy to be operated and maintained conveniently.

First claim

What is claimed is:

1. A test fixture, comprising a pressing connection mechanism, an eccentric mechanism, and a working carrier, the pressing connection mechanism and the working carrier being arranged correspondingly, wherein rotation of the eccentric mechanism driving the pressing connection mechanism to move up and down in a Y direction so as to conduct a signal pressing connection test for a tested product on the working carrier.

2. The test fixture according to claim 1 , further comprising:
a first adjustment mechanism for controlling and adjusting the working carrier to move left and right in an X direction, and
a second adjustment mechanism for controlling and adjusting the working carrier to move up and down in the Y direction.

3. The test fixture according to claim 1 , wherein the eccentric mechanism comprises a main eccentric block, a stress-bearing plate and a guide shaft, the stress-bearing plate being positioned below the main eccentric block, the stress-bearing plate being mounted with the guide shaft, the guide shaft being connected to the pressing connection mechanism above the main eccentric block, the main eccentric block rotating and pressing downward to the stress-bearing plate, the stress-bearing plate driving the pressing connection mechanism via the guide shaft to move up and down in the Y direction.

4. The test fixture according to claim 3 , wherein the main eccentric block is mounted with an eccentric handle for driving the rotation of the main eccentric block.

5. The test fixture according to claim 3 , wherein a bearing plate is provided between the main eccentric block and the pressing connection mechanism, a flange bearing is fixed on the bearing plate, and the guide shaft penetrates through the flange bearing and is connected to the pressing connection mechanism.

6. The test fixture according to claim 5 , wherein, a restoring spring is provided out of the guide shaft, the reset spring is positioned between the bearing plate and the pressing connection mechanism for restoring the pressing connection mechanism upward after a test is completed.

7. The test fixture according to claim 5 , wherein a rolling bearing is provided between the main eccentric block and the stress-bearing plate.

8. The test fixture according to claim 5 , wherein the pressing connection mechanism comprises a main pressing head, a pressing connection slider and a pressing connection guide rail, one end of the main pressing head being fixed on the guide shaft, and the other end of the main pressing head being slidablely mounted to the pressing connection guide rail via the pressing connection slider in up and down directions.

9. The test fixture according to claim 8 , wherein the main pressing head is provided with a vice pressing head for mounting the tested product.

10. The test fixture according to claim 8 , wherein one end of the main pressing head is fixed to a top end of the guide shaft via an adjuster, and the pressing connection slider is mounted to the other end of the main pressing head via a connecting plate.

11. The test fixture according to claim 2 , wherein the first adjustment mechanism comprises an X-directional guide rail mounting plate, an X-directional slider mounting plate, a guiding guide rail and a guiding slider, the guiding guide rail is mounted on the X-directional guide rail mounting plate, the X-directional slider mounting plate is slidablely mounted to the guiding guide rail via the guiding slider for driving the working carrier to move in the X direction.

12. The test fixture according to claim 11 , wherein the X-directional guide rail mounting plate is fixed under the working carrier via a backlight plate, and
a light hole is provided on the working carrier for aligning adjustment.

13. The test fixture according to claim 12 , wherein an adjusting screw and a fastening screw are mounted on the X-directional guide rail mounting plate.

14. The test fixture according to claim 5 , wherein the second adjustment mechanism comprises a Y-directional adjusting carrier and a height adjusting side plate, the height adjusting side plate is provided on the Y-directional adjusting carrier, the height adjusting side plate is provided under the X-directional guide rail mounting plate for driving the working carrier to move in the Y direction.

15. The test fixture according to claim 8 , wherein a pressing connection shape of the main pressing head is engaged to a silica gel sheet as a pressure buffer, a PCB or a FPC to be tested so that a signal source required for the test is steadily and accurately contacted with and stably connected with the tested product.

16. A test method using a test fixture, wherein the test fixture comprises a pressing connection mechanism, an eccentric mechanism, and a working carrier, the pressing connection mechanism and the working carrier being arranged correspondingly, wherein rotation of the eccentric mechanism driving the pressing connection mechanism to move up and down in a Y direction so as to conduct a signal pressing connection test for a tested product on the working carrier.

17. The test method according to claim 16 , wherein the test fixture further comprises
a first adjustment mechanism for controlling and adjusting the working carrier to move left and right in an X direction, and
a second adjustment mechanism for controlling and adjusting the working carrier to move up and down in the Y direction.

18. The test method according to claim 16 , wherein the eccentric mechanism comprises a main eccentric block, a stress-bearing plate and a guide shaft, the stress-bearing plate being positioned below the main eccentric block, the stress-bearing plate being mounted with the guide shaft, the guide shaft being connected to the pressing connection mechanism above the main eccentric block, the main eccentric block rotating and pressing downward to the stress-bearing plate, the stress-bearing plate driving the pressing connection mechanism via the guide shaft to move up and down in the Y direction.

19. The test method according to claim 18 , wherein a bearing plate is provided between the main eccentric block and the pressing connection mechanism, a flange bearing is fixed on the bearing plate, and the guide shaft penetrates through the flange bearing and is connected to the pressing connection mechanism.

20. The test method according to claim 18 , wherein a restoring spring is provided out of the guide shaft, the restoring spring is positioned between the bearing plate and the pressing connection mechanism for restoring the pressing connection mechanism upward after a test is completed; and a rolling bearing is provided between the main eccentric block and the stress-bearing plate.

Assignees

• Li Jian
• Liao Yongjun
• Tan Yu
• Zhang Jianchao
• Zhang Chunhua
• Boe Technology Group Co Ltd
• Boe (Hebei) Mobile Display Tech Co Ltd

Inventors

• Li Jian
• Liao Yongjun
• Tan Yu
• Zhang Jianchao
• Zhang Chunhua

Classifications

• G01R31/2808

  Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards (probe, multiprobe, probe manipulator or probe fixture G01R1/067) · CPC title

• G01R31/2891 Primary

  related to sensing or controlling of force, position, temperature (G01R31/2874 takes precedence; sensing of force G01L; sensing of position G01B, G01D; sensing of temperature G01K; controlling in general G05) · CPC title

• G01R1/0408 Primary

  Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets (G01R1/067 takes precedence; mass production testing systems G01R31/59; testing of connections G01R31/66; for testing printed circuit boards G01R31/2808) · CPC title