Probe pin and electronic device using the same

Patent metadata

Field	Value
Publication number	US-9797925-B2
Application number	US-201515318092-A
Country	US
Kind code	B2
Filing date	Jun 4, 2015
Priority date	Jun 16, 2014
Publication date	Oct 24, 2017
Grant date	Oct 24, 2017

Abstract

A probe pin includes a coil spring, a first plunger, and second and third plungers. The second and third plungers respectively are independently operable and include a main body and first and second elastic pieces that extend from the main body in the same direction to each other. The first plunger is inserted between the first and second elastic pieces each of the second and third plungers.

First claim

The invention claimed is:

1. A probe pin, comprising:
a coil spring;
a plurality of holding plungers having electric conductivity, being independently operable and including first and second elastic pieces extending from a main body in parallel in an identical direction to each other; and
an held plunger having electric conductivity and being inserted between the first and second elastic pieces of each of the holding plungers, wherein
the plurality of holding plungers are inserted from a first end of the coil spring, the held plunger is inserted from a second end of the coil spring, and the held plunger is held between the first and second elastic pieces.

2. The probe pin as claimed in claim 1 , wherein
a number of the holding plungers are two.

3. The probe pin as claimed in claim 1 , wherein
a number of the holding plungers are three.

4. The probe pin as claimed in claim 1 , wherein
each of the holding plunger and the held plunger, which is formed by electroplating, includes a flat original plate surface and an irregular growth surface, and at least one set of the holding plungers adjacent to each other is disposed so that the original plate surfaces of the holding plungers face each other.

5. The probe pin as claimed in claim 1 , wherein
a contact portion, which contacts with one of surfaces of the held plunger, protrudes from the first elastic piece of at least the holding plunger, and the holding plunger and the held plunger conduct to each other through the contact portion.

6. The probe pin as claimed in claim 1 , wherein
the first and second elastic pieces of the holding plunger are different from each other in length.

7. The probe pin as claimed in claim 1 , wherein
at least one of the first and second elastic pieces of the holding plunger includes a guide protrusion, the held plunger includes a guide groove in which the guide protrusion is engaged, and slide movement of the holding plunger and the held plunger is performed by movement of the guide protrusion along the guide groove.

8. An electrical device comprising a probe pin claimed in claim 1 .

Assignees

• Omron Tateisi Electronics Co

Inventors

• Teranishi Hirotada
• Sakai Takahiro

Classifications

• G01R1/06738

  related to tip portion · CPC title

• G01R1/06722 Primary

  Spring-loaded · CPC title

• G01R1/073

  Multiple probes · CPC title

• G01R31/26

  Testing of individual semiconductor devices (testing of photovoltaic devices H02S50/10; testing or measuring during manufacture or treatment {H10P74/00}) · CPC title

• G01R1/067 Primary

  Measuring probes · CPC title