Interferometer having two transparent plates in parallel for making reference and measurement beams parallel

Patent metadata

Field	Value
Publication number	US-9797704-B2
Application number	US-201514809107-A
Country	US
Kind code	B2
Filing date	Jul 24, 2015
Priority date	Jul 29, 2014
Publication date	Oct 24, 2017
Grant date	Oct 24, 2017

Abstract

An interferometer includes a light source, a beam splitter, a reference reflector, a measuring reflector, a detection unit, and at least two transparent plane-parallel plates. The beam splitter splits a beam of rays into at least one measuring beam and at least one reference beam. Until being recombined, the measuring beam propagates in a measuring arm, and the reference beam propagates in a reference arm. The reference beam falls at least three times on the reference reflector located in the reference arm. The measuring reflector is disposed in the measuring arm and is joined to an object to be measured, which is movable along a measuring direction relative to the reference reflector. The measuring beam falls at least three times on the measuring reflector. At least one distance signal with regard to the position of the object to be measured is ascertainable from the interfering measuring and reference beams via the detection unit. The plane-parallel plates are disposed parallel to each other in the beam path between the light source and the detection unit. At least the measuring reflector is movable relative to the plane-parallel plates along the measuring direction. The plane-parallel plates each include a plurality of optical elements that exert such an optical effect on the measuring beam and the reference beam that they propagate parallel to each other in the direction of the measuring reflector and reference reflector, respectively.

First claim

What is claimed is:

1. An interferometer, comprising
a light source adapted to emit a beam of rays;
a first beam splitter adapted to split the beam of rays, emitted by the light source, into at least one measuring beam and at least one reference beam, to define a splitting plane, the measuring beam adapted to propagate in a measuring arm and the reference beam adapted to propagate in a reference arm until being recombined at a recombining location in a recombining plane, the recombining plane being oriented parallel to the splitting plane;
a reference reflector arranged in the reference arm so that the reference beam impinges at least three times on the reference reflector;
a measuring reflector arranged in the measuring arm and adapted to be joined to an object to be measured, that is movable along a measuring direction relative to the reference reflector, so that the measuring beam impinges at least three times on the measuring reflector;
a detection unit adapted to ascertain at least one distance signal with regard to a position of the object to be measured from interfering measuring and reference beams superposed at the recombining location;
at least two transparent plane-parallel plates arranged parallel to each other in the beam path between the light source and the detection unit, the first beam splitter being integrated in one of the plane parallel plates, at least the measuring reflector being movable relative to the plane-parallel plates along the measuring direction, each plane-parallel plate including a plurality of optical elements adapted to impart an optical effect on the measuring beam and the reference beam such that the measuring beam and the reference beam propagate parallel between (a) the plane-parallel plate that is located adjacent to the reference and measuring reflectors and (b) the reference and measuring reflectors;
wherein the optical elements in the two plane-parallel plates include a plurality of reflectors and at least four imaging optical systems for the measuring beam and the reference beam;
wherein two imaging optical systems in each case are adapted to displace the measuring beam and the reference beam from the splitting plane to an intermediate plane that is located between, and oriented parallel to, the splitting plane and the recombining plane; and
wherein two further imaging optical systems in each case are adapted to displace the measuring beam and the reference beam from the intermediate plane to the recombining plane.

2. The interferometer according to claim 1 , wherein the interferometer includes a first plane-parallel plate and a second plane-parallel plate, and wherein:
a first imaging optical system for the measuring beam is arranged in the second plane-parallel plate;
a second imaging optical system for the measuring beam is arranged in the first plane-parallel plate;
a third imaging optical system for the reference beam is arranged in the second plane-parallel plate;
a fourth imaging optical system for the reference beam is arranged in the first plane-parallel plate;
the first and third imaging optical systems are adapted to increase an entrance-beam diameter of the beam of rays impinging thereon; and
the second and fourth imaging optical systems are adapted to reduce a beam diameter of the beam of rays impinging thereon to the entrance-beam diameter.

3. The interferometer according to claim 2 , wherein each imaging optical system includes two reflective grating lenses arranged on one side of a plane-parallel plate, and a reflector arranged on an opposite side of the plane-parallel plate, reflecting sides of the grating lenses and of the reflector facing one another.

4. The interferometer according to claim 3 , wherein:
the first imaging optical system includes:
a first grating lens and a second grating lens, both arranged on one side of the second plane-parallel plate; and
a first reflector arranged on the opposite side of the second plane-parallel plate;

the first imaging optical system is adapted to double the entrance-beam diameter of the measuring beam impinging thereon;
the second imaging optical system includes:
a third grating lens and a fourth grating lens, both arranged on one side of the first plane-parallel plate; and
a second reflector arranged on the opposite side of the first plane-parallel plate;

the second imaging optical system is adapted to halve the beam diameter of the measuring beam impinging thereon;
the third imaging optical system includes:
a fifth grating lens and a sixth grating lens, both arranged on one side of the second plane-parallel plate; and
a third reflector arranged on the opposite side of the second plane-parallel plate;

the third imaging optical system is adapted to double the entrance-beam diameter of the reference beam impinging thereon; and
the fourth imaging optical system includes:
a seventh grating lens and an eighth grating lens, both arranged on one side of the first plane-parallel plate; and
a fourth reflector arranged on the opposite side of the first plane-parallel plate; and

the fourth imaging optical system is adapted to halve the beam diameter of the reference beam impinging thereon.

5. The interferometer according to claim 4 , wherein each of the first, fourth, fifth, and eighth grating lenses has a first focal length, and each of the second, third, sixth, and seventh grating lenses has a second focal length, which is twice the first focal length.

6. The interferometer according to claim 3 , wherein the interferometer includes a first plane-parallel plate, a second plane-parallel plate, and a third plane-parallel plate, the plane-parallel plates set apart in the beam propagation direction, and wherein:
a first imaging optical system for the measuring beam is arranged in the second and third plane-parallel plates;
a second imaging optical system for the measuring beam is arranged in the second and third plane-parallel plates;
a third imaging optical system for the reference beam is arranged in the first and second plane-parallel plates;
a fourth imaging optical system for the reference beam is arranged in the first and second plane-parallel plates;
the first and third imaging optical systems are adapted to increase an entrance-beam diameter of the beam of rays impinging thereon; and
the second and fourth imaging optical systems are adapted to reduce a beam diameter of the beam of rays impinging thereon to the entrance-beam diameter.

7. The interferometer according to claim 6 , wherein each imaging optical system includes two reflective grating lenses arranged on one plane-parallel plate and a reflector arranged on an opposite plane-parallel plate, reflecting sides of the grating lenses and of the reflector facing one another.

8. The interferometer according to claim 7 , wherein:
the first imaging optical system includes:
a first grating lens and a second grating lens, both arranged on the third plane-parallel plate; and
a first reflector arranged on the second plane-parallel plate;

the first imaging optical system is adapted to double the entrance-beam diameter of the measuring beam impinging thereon;
the second imaging optical system includes:
a third grating lens and a fourth grating lens, both arranged on the first plane-parallel plate; and
a second reflector arranged on the second plane-parallel plate;

the second imaging optical system is adapted to halve the beam diameter of the measuring beam impinging thereon;
the third imaging optical system includes:
a fifth grating lens and a sixth grating lens, both arranged on the third plane-parallel plate; and
a third reflector arranged on the second plane-parallel plate;

the third imaging optical system is adapted to double the entrance-

Assignees

• Heidenhain Gmbh Dr Johannes

Inventors

• Meissner Markus

Classifications

• G01B2290/70

  Using polarization in the interferometer · CPC title

• G01B9/02018 Primary

  Multipass interferometers, e.g. double-pass · CPC title

• G01B9/02057

  by using common path configuration, i.e. reference and object path almost entirely overlapping · CPC title

• G01B9/02015 Primary

  characterised by the beam path configuration · CPC title

• G01B11/14

  for measuring distance or clearance between spaced objects or spaced apertures (G01B11/26 takes precedence; rangefinders G01C3/00) · CPC title