Off-axis loadcell force sensing to automatically determine location of specimen features

Patent metadata

Field	Value
Publication number	US-9797699-B2
Application number	US-201414912199-A
Country	US
Kind code	B2
Filing date	Aug 12, 2014
Priority date	Aug 22, 2013
Publication date	Oct 24, 2017
Grant date	Oct 24, 2017

Abstract

The present disclosure relates to a method in materials testing to automatically locate the center of a feature on or in an object using the off-axis force feedback of a loadcell. In this disclosure, either a simplified model of the product or device being tested, or the product itself, is placed under the loadcell probe with the feature of interest roughly aligned under the probe tip. The probe is driven down into the feature. The product is automatically positioned relative to the probe in the x-direction until the side of the probe contacts the side of the feature. Contact is determined by monitoring the force feedback from the loadcell. When the vertical force from the side-load surpasses a pre-determined setpoint, contact is assumed and the value of the x-position of the product with respect to the probe is recorded. The product is then repositioned in the opposite direction in the x-axis to record the touch load on the other side. The center is then calculated as the average of the x values. The process is repeated along the y-axis. This data is then used to calculate the center of the feature and the product can be positioned at this location so that the probe is centered over the center thereof.

First claim

What is claimed is:

1. A method for locating a center of a selected feature of a sample in a materials testing application, comprising the steps of:
providing a loadcell, including a probe;
directing the probe toward the selected feature of the sample;
driving the probe into the selected feature of the sample;
positioning the product relative to the probe in a first direction until the probe contacts a first side of the selected feature;
positioning the product relative to the probe in an opposite of the first direction until the probe contacts a second side of the selected feature;
positioning the product relative to the probe in a second direction until the probe contacts a third side of the selected feature; and
positioning the product relative to the probe in an opposite of the second direction until the probe contacts a fourth side of the selected feature.

2. The method of claim 1 wherein:
the step of positioning the product relative to the probe in the first direction calculates a first measurement in the first direction;
the step of positioning the product relative to the probe in an opposite of the first direction calculates a second measurement in the first direction;
the step of positioning the product relative to the probe in the second direction calculates a first measurement in the second direction;
the step of positioning the product relative to the probe in an opposite of the second direction calculates a second measurement in the second direction.

3. The method of claim 2 wherein the first direction is orthogonal to the second direction.

4. The method of claim 3 wherein:
a coordinate of the center of the feature in the first direction is calculated by averaging the first and second measurements in the first direction; and
a coordinate of the center of the feature in the second direction is calculated by averaging the first and second measurements in the second direction.

5. The method of claim 4 further including the step of determining contact of the probe by monitoring force feedback from the loadcell that is induced by the contact of the probe against a side of the selected feature.

6. The method of claim 5 wherein the step of determining contact of the probe further includes an indication of contact when force feedback from the loadcell surpasses a pre-determined setpoint.

7. The method of claim 4 further including the step of positioning the probe according to the coordinates of the center of the feature in the first and second directions.

8. The method of claim 1 wherein the feature is an aperture.

9. A method for locating a center of a selected feature of a sample in a materials testing application, comprising the steps of:
providing a loadcell, including a probe;
driving the sample in a first direction into a side of the probe until contact is detected at a point of contact; and
backing the sample away from the probe by an offset distance from a point of contact.

10. The method of claim 9 wherein the offset distance is pre-determined.

11. The method of claim 9 further including the step of calculating the offset distance, wherein the step of calculating the offset distance includes the steps of:
providing at least one expected force versus displacement curve;
after the step of backing the sample away, relatively moving the probe in a second direction, orthogonal to the first direction, thereby deriving an actual force versus displacement curve;
comparing the actual force versus displacement curves to the expected force versus displacement curves;
if the actual force versus displacement curve differs substantively from the expected force versus displacement curves, then a step of adjusting the offset distance is performed and the driving step, the relatively moving step, the comparing step and the adjusting step are repeated until the actual force versus displacement curve substantively matches at least one of the expected force versus displacement curves.

12. The method of claim 11 including the steps of driving, relatively moving, comparing and adjusting are terminated after the actual force versus displacement curve substantively matches at least one of the expected force versus displacement curves.

13. The method of claim 12 further including the step of communicating results of the method.

14. The method of claim 11 wherein the actual force versus displacement curve differing substantively from the expected force versus displacement curves indicates that the sample is dragging on the probe during motion.

15. The method of claim 11 wherein the step of providing at least one expected force versus displacement curve includes providing a plurality of expected force versus displacement curves.

16. The method of claim 11 wherein the step of providing at least one expected force versus displacement curve includes providing a library of expected force versus displacement curves.

17. The method of claim 11 wherein the step of providing at least one expected force versus displacement curve includes providing a database of expected force versus displacement curves.

18. The method of claim 11 wherein the plurality of expected force versus displacement curves are previously generated by performing the driving step on a sample which is known to be free of dragging on the probe.

Assignees

• Illinois Tool Works

Inventors

• Masek William
• Taliaferro Michael
• Manney Jeffrey

Classifications

• G01B5/004 Primary

  for measuring coordinates of points · CPC title

• G01B21/04

  by measuring coordinates of points · CPC title

• G05B2219/37608

  Center and diameter of hole, wafer, object · CPC title