Devices including a difussion barrier layer
US-2016275979-A1 · Sep 22, 2016 · US
US9792931B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9792931-B2 |
| Application number | US-201615060914-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 4, 2016 |
| Priority date | Mar 22, 2015 |
| Publication date | Oct 17, 2017 |
| Grant date | Oct 17, 2017 |
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Devices having an air bearing surface (ABS), the devices including a write pole; a near field transducer (NFT) that includes a peg and a disc, wherein the peg is at the ABS of the device; a heat sink positioned adjacent the disc of the NFT; a dielectric gap positioned adjacent the peg of the NFT at the ABS of the device; and a conformal diffusion barrier layer positioned between the write pole and the dielectric gap, the disc, and the heat sink, wherein the conformal diffusion barrier layer forms at least one angle that is not greater than 135°.
Opening claim text (preview).
What is claimed is: 1. A device having an air bearing surface (ABS), the device comprising: a write pole; a near field transducer (NFT) comprising a peg and a disc, wherein the peg is at the ABS of the device; a heat sink positioned adjacent the disc of the NFT; a dielectric gap positioned adjacent the peg of the NFT at the ABS of the device; and a conformal diffusion barrier layer positioned between the write pole and the dielectric gap, the disc, and the heat sink and directly adjacent the gap, the disc and the heat sink, wherein the conformal diffusion barrier layer forms at least one angle that is not greater than 135°. 2. The device according to claim 1 , wherein the conformal diffusion barrier layer comprises molybdenum (Mo), tantalum (Ta), niobium (Nb), hafnium (Hf), neodymium (Nd), holmium (Ho), molybdenum (Mo), tungsten (W), iridium (Ir), rhodium (Rh), ruthenium (Ru), rhenium (Re), titanium (Ti), zirconium (Zr), nickel (Ni), uranium (U), yttrium (Y), vanadium (V), or combinations thereof. 3. The device according to claim 1 , wherein the conformal diffusion barrier layer comprises ruthenium (Ru), iridium (Ir), tantalum (Ta), zirconium (Zr), niobium (Nb), hafnium (Hf), or combinations thereof. 4. The device according to claim 1 , wherein the conformal diffusion barrier layer comprises ruthenium (Ru), iridium (Ir), tantalum (Ta), zirconium (Zr), or combinations thereof. 5. The device according to claim 1 , wherein the conformal diffusion barrier layer is positioned directly adjacent the write pole. 6. The device according to claim 1 , wherein the conformal diffusion barrier layer has a thickness from about 5 nanometers (nm) to about 30 nm. 7. The device according to claim 1 further comprising a peg coupler layer, the peg coupler layer positioned between the conformal diffusion barrier layer and the dielectric gap, NFT and heat sink. 8. The device according to claim 7 , wherein the peg coupler layer comprises gold (Au) or an alloy thereof. 9. The device according to claim 7 , wherein the peg coupler layer has a thickness from about 8 nm to about 25 nm. 10. The device according to claim 1 further comprising an etch stop layer, the etch stop layer positioned adjacent the conformal diffusion barrier layer on the opposite side of the write pole. 11. The device according to claim 10 , wherein the etch stop layer comprises tantalum (Ta), titanium (Ti), chromium (Cr), tantalum nitride (TaN), titanium nitride (TiN), or combinations thereof. 12. A device having an air bearing surface (ABS), the device comprising: a write pole; a near field transducer (NFT) comprising a peg and a disc, wherein the peg is at the ABS of the device; a heat sink positioned adjacent the disc of the NFT; a dielectric gap positioned adjacent the peg of the NFT at the ABS of the device; and a conformal diffusion barrier layer positioned between the write pole and the dielectric gap, the disc, and the heat sink and directly adjacent the gap, the disc and the heat sink, wherein the conformal diffusion barrier layer forms at least one angle that is not greater than 110° and comprises molybdenum (Mo), tantalum (Ta), niobium (Nb), hafnium (Hf), neodymium (Nd), holmium (Ho), molybdenum (Mo), tungsten (W), iridium (Ir), rhodium (Rh), ruthenium (Ru), rhenium (Re), titanium (Ti), zirconium (Zr), nickel (Ni), uranium (U), yttrium (Y), vanadium (V), or combinations thereof. 13. The device according to claim 12 , wherein the conformal diffusion barrier layer comprises zirconium (Zr), ruthenium (Ru), or combinations thereof. 14. The device according to claim 12 , wherein the NFT comprises gold (Au) or an alloy thereof. 15. The device according to claim 12 , wherein the conformal diffusion barrier has a thickness from about 5 nm to about 30 nm. 16. The device according to claim 12 further comprising a peg coupler layer, the peg coupler layer positioned between the conformal diffusion barrier layer and the dielectric gap, NFT and heat sink. 17. The device according to claim 12 further comprising an etch stop layer, the etch stop layer positioned adjacent the conformal diffusion barrier layer on the opposite side of the write pole. 18. A device having an air bearing surface (ABS), the device comprising: a write pole; a near field transducer (NFT) comprising a peg and a disc, wherein the peg is at the ABS of the device; a heat sink positioned adjacent the disc of the NFT; a dielectric gap positioned adjacent the peg of the NFT at the ABS of the device; and a conformal diffusion barrier layer positioned between the write pole and the dielectric gap, the disc, and the heat sink and directly adjacent the gap, the disc and the heat sink, wherein the conformal diffusion barrier layer comprises rhenium (Re), vanadium (V), or combinations thereto. 19. The device according to claim 18 , wherein the conformal diffusion barrier layer forms at least one angle that is not greater than 160°. 20. The device according to claim 18 , wherein the conformal diffusion barrier layer has a thickness from about 8 nm to about 15 nm.
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