Distance measurement apparatus, and distance measurement method
US-9207074-B2 · Dec 8, 2015 · US
US9791559B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9791559-B2 |
| Application number | US-201314401281-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 19, 2013 |
| Priority date | May 18, 2012 |
| Publication date | Oct 17, 2017 |
| Grant date | Oct 17, 2017 |
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A measurement device for measuring an optical distance of an object includes an emission device configured to emit a first signal towards the object. The measurement device further includes a modulator device configured to modulate the first signal and a reception device configured to detect a second signal. The measurement device also includes an analysis device configured to receive and analyze the second signal. The measurement device further includes a calibration device configured to calibrate the measurement device with the modulator device turned on and with the emission device operated below a pre-definable power threshold value.
Opening claim text (preview).
The invention claimed is: 1. A measurement device for measuring an optical distance of an object, the measurement device comprising: an emission device configured to emit a first optical signal towards the object, the emission device being configured to operate with a first power level during a calibration process, the first power level being lower than a second power level used during optical distance measurement; a modulator device configured to modulate the first optical signal during the calibration process and during optical distance measurement; a reception device configured to detect a second optical signal, the second optical signal including an optical background radiation component and a measurement radiation component, the measurement radiation component resulting from the first optical signal being reflected from the object, the measurement radiation component receiving substantially no detectable signal when the emission device is operated at the first power level that is below a power threshold value during the calibration process; an analysis device configured to, at least during optical distance measurement, receive and analyze the second optical signal to determine an optical distance of the object; and a calibration device configured to calibrate the measurement device by determining a systematic error with reference to the second optical signal received during the calibration process. 2. The measurement device as claimed in claim 1 , wherein the calibration device is configured to calibrate the measurement device determine the systematic error with reference to a crosstalk between at least one of (i) the reception device and the modulator device and (ii) the analysis device and the modulator device. 3. The measurement device as claimed in claim 1 , wherein the reception device and the analysis device are integrally embodied. 4. The measurement device as claimed in claim 1 , wherein the reception device has at least one of (i) an avalanche photodiode and (ii) a single photon avalanche diode. 5. The measurement device as claimed in claim 1 , wherein the emission device includes a laser and the laser is operated below a laser threshold of the laser during the calibration process. 6. The measurement device as claimed in claim 1 , wherein the calibration device is configured to calibrate the measurement device such that the measurement radiation component of the second optical signal detected by the reception device during optical distance measurement is divided by the optical background radiation component of the second optical signal detected during the calibration process. 7. A method for calibrating a measurement device, the method comprising: emitting, during a calibration process, a first optical signal using an emission device towards an object using a first power level, the first power level being lower than a second power level used during optical distance measurement; modulating the first optical signal of the emission device using a modulator device during the calibration process; detecting a second optical signal using a reception device, the second optical signal including an optical background radiation component and a measurement radiation component, the measurement radiation component resulting from the first optical signal being reflected from the object, the measurement radiation component receiving substantially no detectable signal when the emission device is operated at the first power level that is below a power threshold value during the calibration process; receiving and analyzing the second signal using an analysis device; and calibrating the measurement device using a calibration device by determining a systematic error with reference to the second optical signal received during the calibration process, wherein the measurement device includes the emission device, the modulator device, the reception device, the analysis device, and the calibration device.
Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass (testing, calibrating or compensating compasses G01C17/38) · CPC title
for measuring distance only (indirect measurement G01S17/46; active triangulation systems G01S17/48) · CPC title
Transmitters · CPC title
Use of electric radiation detectors · CPC title
Means for monitoring or calibrating · CPC title
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