Analysis of periodic information in a signal

US9791422B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9791422-B2
Application numberUS-201414316883-A
CountryUS
Kind codeB2
Filing dateJun 27, 2014
Priority dateJul 2, 2013
Publication dateOct 17, 2017
Grant dateOct 17, 2017

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  5. First independent claim

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Abstract

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A “periodic signal parameter” (PSP) indicates periodic patterns in an autocorrelated vibration waveform and potential faults in a monitored machine. The PSP is calculated based on statistical measures derived from an autocorrelation waveform and characteristics of an associated vibration waveform. The PSP provides an indication of periodicity and a generalization of potential fault, whereas characteristics of the associated waveform indicate severity. A “periodic information plot” (PIP) is derived from a vibration signal processed using two analysis techniques to produce two X-Y graphs of the signal data that share a common X-axis. The PIP is created by correlating the Y-values on the two graphs based on the corresponding X-value. The amplitudes of Y-values in the PIP is derived from the two source graphs by multiplication, taking a ratio, averaging, or keeping the maximum value.

First claim

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What is claimed is: 1. A method for analyzing periodic information in a signal associated with a machine or process, the method comprising: (a) acquiring the signal over a time period using a sensor associated with the machine or process; (b) generating an autocorrelation waveform based on the signal; (c) determining a periodic signal parameter value based at least in part on the autocorrelation waveform, the periodic signal parameter value comprising a single real number indicative of a level of periodic information in the signal; (d) determining a vibration waveform value based on the signal; (e) comparing the vibration waveform value to a vibration waveform value threshold; (f) comparing the periodic signal parameter value to a periodic signal parameter value threshold; and (g) generating an output indicating a no-fault condition of the machine or process if the vibration waveform value is less than the vibration waveform value threshold and the periodic signal parameter value is less than the periodic signal parameter value threshold. 2. The method of claim 1 wherein step (c) comprises determining the periodic signal parameter value based at least in part on a combination of statistical values calculated from the autocorrelation waveform. 3. The method of claim 2 wherein step (c) comprises: (c1) determining a standard deviation of the autocorrelation waveform; (c2) determining a maximum absolute peak amplitude over all of the time period of the autocorrelation waveform; (c3) determining a maximum absolute peak amplitude after the first three percent of the time period of the autocorrelation waveform; (c4) determining a crest factor of the autocorrelation waveform; and (c5) determining the periodic signal parameter value based at least in part on the standard deviation, the maximum absolute peak amplitude over all of the time period of the autocorrelation waveform, the maximum absolute peak amplitude after the first three percent of the time period of the autocorrelation waveform, and the crest factor. 4. The method of claim 3 wherein the periodic signal parameter value comprises a sum of at least a first portion, a second portion and a third portion. 5. The method of claim 4 wherein step (c) further comprises determining the first portion of the periodic signal parameter value by: (c6) setting the first portion equal to the standard deviation of the autocorrelation waveform if a dividend of the maximum absolute peak amplitude over all of the time period of the autocorrelation waveform divided by the maximum absolute peak amplitude after the first three percent of the time period of the autocorrelation waveform is not greater than one; and (c7) setting the first portion equal to 0.1 if the dividend of the maximum absolute peak amplitude over all of the time period of the autocorrelation waveform divided by the maximum absolute peak amplitude after the first three percent of the time period of the autocorrelation waveform is greater than one, and the standard deviation of the autocorrelation waveform is greater than 0.1 and less than 0.9. 6. The method of claim 4 wherein step (c) further comprises determining the second portion of the periodic signal parameter value by: (c6) determining whether the maximum absolute peak amplitude over all of the time period of the autocorrelation waveform is greater than or equal to 0.3; (c7) determining whether a dividend of the maximum absolute peak amplitude after the first three percent of the time period of the autocorrelation waveform divided by a mean amplitude of the autocorrelation waveform is greater than or equal to 4; (c8) setting the second portion equal to 0.025 if the maximum absolute peak amplitude over all of the time period of the autocorrelation waveform is greater than or equal to 0.3, and the dividend of the maximum absolute peak amplitude after the first three percent of the time period of the autocorrelation waveform divided by a mean amplitude of the autocorrelation waveform is greater than or equal to 4; (c9) setting the second portion equal to 0 if the maximum absolute peak amplitude over all of the time period of the autocorrelation waveform is greater than or equal to 0.3, and the dividend of the maximum absolute peak amplitude after the first three percent of the time period of the autocorrelation waveform divided by a mean amplitude of the autocorrelation waveform is not greater than or equal to 4; (c10) setting the second portion equal to 0.025 if the maximum absolute peak amplitude in all of the time period of the autocorrelation waveform is not greater than or equal to 0.3, and the crest factor of the autocorrelation waveform is less than 4 and the standard deviation of the autocorrelation waveform is less than or equal to 0.1; and (c11) setting the second portion equal to 0 if the maximum absolute peak amplitude in all of the time period of the autocorrelation waveform is not greater than or equal to 0.3, and the crest factor of the autocorrelation waveform is not less than 4 or the standard deviation of the autocorrelation waveform is not less than or equal to 0.1. 7. The method of claim 4 wherein step (c) further comprises determining the third portion of the periodic signal parameter value by: (c6) discarding negative peaks in the autocorrelation waveform; (c7) of peaks remaining after step (c6), discarding peaks in the autocorrelation waveform that are outside a statistical range; (c8) determining a mean value of peaks in the autocorrelation waveform remaining after step (c7); (c9) determining a crest factor of the peaks in the autocorrelation waveform remaining after step (c7); (c10) setting the third portion to 0.025 if the crest factor determined in step (c9) is greater than or equal to 4, and the number of peaks discarded in step (c7) is greater than 2; and (c11) setting the third portion to 0 if the crest factor determined in step (c9) is not greater than or equal to 4, or the number of peaks discarded in step (c7) is not greater than 2. 8. The method of claim 1 further comprising: (h) generating an output indicating an early-stage periodic defect condition of the machine or process if the vibration waveform value is less than the vibration waveform value threshold and the periodic signal parameter value is greater than the periodic signal parameter value threshold; (i) generating an output indicating a non-periodic fault condition of the machine or process if the vibration waveform value is greater than the vibration waveform value threshold and the periodic signal parameter value is less than the periodic signal parameter value threshold; and (j) generating an output indicating a periodic fault condition of the machine or process if the vibration waveform value is greater than the vibration waveform value threshold and the periodic signal parameter value is greater than the periodic signal parameter value threshold. 9. The method of claim 1 further comprising: (h) determining that the signal comprises random noise, that bad data has been collected, or that data was collected for too short a time to indicate fault-related frequencies, if the periodic signal parameter value is less than or equal to a first threshold value; (i) determining that the signal comprises distinct frequencies with less noise than in step (d) if the periodic signal parameter value is greater than the first threshold value and less than or equal to a second threshold value; (j) determining that the signal comprises dominate single frequencies with less noise than in step (e) if the periodic signal parameter value is greater than the second threshold value.

Assignees

Inventors

Classifications

  • G01N29/46Primary

    by spectral analysis, e.g. Fourier analysis {or wavelet analysis (spectral signal processing per se G06F17/14)} · CPC title

  • Signal recognition, e.g. specific values or portions, signal events, signatures · CPC title

  • Measuring {characteristics of} vibrations in solids by using direct conduction to the detector (G01H9/00, G01H11/00 take precedence) · CPC title

  • with stored values, e.g. threshold values · CPC title

  • using auto-correlation techniques or cross-correlation techniques · CPC title

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What does patent US9791422B2 cover?
A “periodic signal parameter” (PSP) indicates periodic patterns in an autocorrelated vibration waveform and potential faults in a monitored machine. The PSP is calculated based on statistical measures derived from an autocorrelation waveform and characteristics of an associated vibration waveform. The PSP provides an indication of periodicity and a generalization of potential fault, whereas cha…
Who is the assignee on this patent?
Csi Tech Inc, Computational Systems Inc
What technology area does this patent fall under?
Primary CPC classification G01N29/46. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 17 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).