Light measuring apparatus employing optical electric field enhancing device

Patent metadata

Field	Value
Publication number	US-9791375-B2
Application number	US-201514668500-A
Country	US
Kind code	B2
Filing date	Mar 25, 2015
Priority date	Sep 28, 2012
Publication date	Oct 17, 2017
Grant date	Oct 17, 2017

Abstract

Using an optical electric field enhancing device including a fine uneven structure made of gold formed on the front surface of a transparent substrate, illumination light of a wavelength in the range from 400 to 530 nm is applied at least to an analyte, positional information of the analyte is detected by a position detection unit disposed on the rear surface side of the optical electric field enhancing device, and excitation light is applied to the detected position by an excitation light application unit. Signal light emitted from the analyte when the excitation light is applied is detected from the rear surface side of the transparent substrate.

First claim

What is claimed is:

1. A measuring apparatus comprising:
an optical electric field enhancing device comprising a transparent substrate, and a fine uneven structure made of gold formed on a front surface of the transparent substrate, wherein the fine uneven structure made of gold is capable of inducing localized plasmons when excitation light is applied, and an analyte is placed on a surface of the fine uneven structure;
an illumination optical system for applying illumination light only of a wavelength in a range from 400 to 530 nm at least to the analyte;
a position detection unit disposed on a rear surface side of the optical electric field enhancing device, the position detection unit detecting a position of the analyte by detecting, from the rear surface side of the transparent substrate, light emitted from the analyte when the illumination light is applied to the analyte;
an excitation light application unit for applying excitation light to the position on the optical electric field enhancing device; and
a light detection unit disposed on the rear surface side of the optical electric field enhancing device, the light detection unit detecting, from the rear surface side of the transparent substrate, signal light emitted from the analyte when the excitation light is applied,
wherein the optical electric field enhancing device comprises a transparent substrate having a fine uneven structure on the front surface thereof, and a fine uneven structure made of gold formed on the front surface of the transparent substrate, and
wherein a main component of the fine uneven structure of the transparent substrate is a metal hydroxide, or a hydroxide of a metal oxide.

2. The measuring apparatus as claimed in claim 1 , wherein the illumination optical system is disposed on the rear surface side of the optical electric field enhancing device.

3. The measuring apparatus as claimed in claim 1 , wherein the excitation light application unit is disposed on the rear surface side of the optical electric field enhancing device, and applies the excitation light from the rear surface side of the transparent substrate.

4. The measuring apparatus as claimed in claim 1 , wherein at least the fine uneven structure of the transparent substrate is made of bayerite or boehmite.

5. The measuring apparatus as claimed in claim 1 , wherein the fine uneven structure made of gold has an average film thickness in the range from 10 to 150 nm.

6. The measuring apparatus as claimed in claim 1 , wherein the optical electric field enhancing device comprises a liquid sample holding member for holding a liquid sample on the fine uneven structure made of gold on the transparent substrate.

7. The measuring apparatus as claimed in claim 6 , wherein the liquid sample holding member of the optical electric field enhancing device comprises a liquid inlet port and a liquid outlet port.

8. The measuring apparatus as claimed in claim 1 , further comprising a position adjusting means on which the optical electric field enhancing device is secured, the position adjusting means being capable of moving the optical electric field enhancing device in an in-plane direction thereof such that the excitation light is applied to the position detected by the position detection unit.

9. The measuring apparatus as claimed in claim 1 , wherein the light detected by the light detection unit is Raman-scattered light or surface enhanced Raman-scattered light.

10. The measuring apparatus as claimed in claim 1 , wherein the analyte is any of a living tissue, a cell, a microorganism, a mycoplasma, and a protein.

11. The measuring apparatus as claimed in claim 1 , wherein the illumination optical system applies illumination light only of a wavelength in the range from 430 to 510 nm nm.

Assignees

• Fujifilm Corp

Inventors

• Yamazoe Shogo
• Naya Masayuki
• Shiota Megumi

Classifications

• G01N21/658 Primary

  enhancement Raman, e.g. surface plasmons · CPC title

• G01J3/4412

  Scattering spectrometry (particle sizing by light scattering G01N15/0205; optical velocimetry of particles G01P5/20, G01P5/26) · CPC title

• G01J3/0227

  using notch filters · CPC title

• G01N2201/0612

  Laser diodes · CPC title

• G01B11/14

  for measuring distance or clearance between spaced objects or spaced apertures (G01B11/26 takes precedence; rangefinders G01C3/00) · CPC title