Systems and methods for distinguishing stimulated emissions as a means of increasing the signal of fluorescence microscopy

US9791371B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9791371-B2
Application numberUS-201514927263-A
CountryUS
Kind codeB2
Filing dateOct 29, 2015
Priority dateOct 29, 2014
Publication dateOct 17, 2017
Grant dateOct 17, 2017

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Abstract

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Embodiments of a fluorescence microscopy system that employs a technique for distinguishing stimulated emission as a means for enhancing signal strength of fluorescent markers are disclosed.

First claim

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What is claimed is: 1. A fluorescence microscopy system comprising: an excitation source for generating an excitation light beam along a first axis; a stimulation source for generating a stimulation light beam along a second axis that is in perpendicular orientation relative to the first axis, wherein the excitation light beam and the stimulation light beam have different wavelengths; a sample having one or more fluorescent markers which are illuminated by the excitation light beam such that the one or more fluorescent markers assumes an excited state and then illuminated again by the stimulation light beam to generate a stimulated emission by the initially excited sample; an objective lens oriented along the second axis for capturing and focusing the stimulation light beam and stimulated emission emitted by the one or more fluorescent markers; a stimulation light beam block component positioned at a focal point of the objective lens such that the stimulation light beam is blocked while allowing the stimulated emission to pass; and a detector for detecting the stimulated emission. 2. The fluorescence microscopy system of claim 1 , wherein the excitation light beam along the first axis is not captured by the objective lens. 3. The fluorescence microscopy system of claim 1 , wherein the stimulation light beam is collimated. 4. The fluorescence microscopy system of claim 1 , further comprising: a lens in association with the objective lens for focusing the stimulated emission onto the detector. 5. The fluorescence microscopy system of claim 1 , wherein the stimulated emission is imaged around the stimulation beam block component for detection by the detector. 6. The fluorescence microscopy system of claim 1 , wherein the one or more fluorescence markers are distributed sparsely or in a non-uniform manner along the sample. 7. The fluorescence microscopy system of claim 1 , wherein a wavelength of the stimulation emission is the same wavelength that the one or more fluorescent markers can emit during excitation of the sample by the excitation light beam. 8. The fluorescence microscopy system of claim 1 , wherein the stimulation light beam has a wavelength of about 550 nm. 9. The fluorescence microscopy system of claim 1 , wherein the stimulation source and the excitation source comprise a laser. 10. The fluorescence microscopy system of claim 1 , wherein the excitation light beam has a wavelength of about 488 nm. 11. The fluorescence microscopy system of claim 1 , wherein the stimulation light beam block component is aligned along the second axis and positioned to block the stimulated light beam from the objective lens. 12. A method for fluorescence microscopy comprising: illuminating one or more fluorescent markers in a sample with an excitation light beam from an excitation source oriented along a first axis such that the one or more fluorescent marker assume an excited state; illuminating the one or more fluorescent markers in the excited state with a stimulation light beam from a stimulation source oriented along a second axis that is in perpendicular relation to the first axis, wherein a stimulated emission is generated by the one or more fluorescent markers when illuminated by the stimulation light beam, wherein the stimulated light beam and the excitation light beam have different wavelengths; focusing the stimulation light beam and the stimulated emission through an objective lens; positioning a stimulated light beam block component along the second axis such that the stimulated light beam is focused onto and blocked by the stimulated light beam block component, and wherein the stimulated emission is not blocked by the positioning of the stimulated light beam block; and detecting the stimulated emission by a detector. 13. The method of claim 12 , wherein the stimulated light beam block is positioned at a focal point of the objective lens and oriented along the second axis. 14. The method of claim 12 , further comprising: focusing the stimulated emission using a lens onto the detector. 15. A fluorescence microscopy system comprising: an excitation source for generating an excitation light beam along a first axis; a stimulation source for generating a stimulation light beam along a second axis that is in perpendicular relation relative to the first axis, wherein the excitation light beam and the stimulation light beam have different wavelengths; a combined excitation/stimulation light beam that is generated by the intersection of the excitation light beam with the stimulation light beam; an excitation objective lens oriented along the first axis for capturing the combined excitation/stimulation light beam; a sample having one or more fluorescent markers in a focal plane of the excitation objective lens, wherein the one or more fluorescent markers are illuminated by the combined excitation/stimulation light beam for producing an stimulated emission; a detection objective lens oriented in perpendicular orientation relative to the excitation objective for capturing and focusing the stimulated emission emitted by the one or more fluorescent markers of the sample; and a detector for detecting the stimulated emission from the detection objective lens. 16. The fluorescence microscopy system of claim 15 , further comprising: a filter in association with the detection objective lens for filtering the stimulated emission focused by the detection objective lens. 17. The fluorescence microscopy system of claim 15 , wherein the wavelength of the stimulation emission is a wavelength that the one or more fluorescent markers can emit during excitation by the excitation light beam.

Assignees

Inventors

Classifications

  • Fluorescence microscopy (fluorescence microscopes per se G02B21/0076 and G02B21/16) · CPC title

  • Coherent sources; lasers · CPC title

  • Means for illuminating specimens · CPC title

  • adapted for ultraviolet illumination {; Fluorescence microscopes (G02B21/0076 takes precedence)} · CPC title

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What does patent US9791371B2 cover?
Embodiments of a fluorescence microscopy system that employs a technique for distinguishing stimulated emission as a means for enhancing signal strength of fluorescent markers are disclosed.
Who is the assignee on this patent?
The United States Of America As Represented By Secretary Dept Of Health And Human Services, Us Health
What technology area does this patent fall under?
Primary CPC classification G01N21/6458. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 17 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).