Method and device for measuring a vacuum pressure using a measuring cell arrangement

US9791339B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9791339-B2
Application numberUS-201314654771-A
CountryUS
Kind codeB2
Filing dateNov 20, 2013
Priority dateDec 24, 2012
Publication dateOct 17, 2017
Grant dateOct 17, 2017

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  1. Title

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Arrangement with capacitive pressure-measuring cell has a diaphragm for measuring vacuum pressure and a printed circuit board acting as a temperature sensor and another electronic component designed as a microchip that contains a digital signal processor with a temperature-to-digital converter and a capacitance-to-digital converter using a time measuring method. The converters determine temperature and capacitance of the cell in comparison to a reference resistor for temperature arranged on the printed circuit board and reference capacitor for capacitance for the pressure to be measured dependent on deformation of the diaphragm. A temperature-corrected pressure signal derived from the two measured signals uses correlation, the measured signals having been determined in advance from a calibration process, and the temperature-corrected pressure signal is provided as a pressure signal at the signal output for further processing. In this manner there is quick pressure measurement with high measuring accuracy.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for vacuum pressure measurement using a measuring cell arrangement ( 100 ) comprising: providing a measuring cell arrangement ( 100 ), the measuring cell arrangement ( 100 ) comprising: a capacitive diaphragm pressure-measuring cell ( 20 ) for measuring a vacuum medium and comprising a diaphragm ( 2 ) as a pressure transducer, a first housing body ( 1 ) is arranged at a first side of the diaphragm ( 2 ) spaced apart from the diaphragm and sealed at an edge region thereof using a joining means ( 3 ′) such that a reference vacuum space ( 25 ) is formed in between the first housing body ( 1 ) and the diaphragm ( 2 ); a second side of the diaphragm ( 2 ) opposite the first side of the diaphragm ( 2 ) spaced apart from a second housing body ( 4 ) and sealed at an edge region thereof using a joining means ( 3 ) such that a measuring vacuum space ( 26 ) is formed in between the second housing body ( 4 ) and the diaphragm ( 2 ), the second housing body ( 4 ) comprising an opening ( 27 ) at which connecting means ( 5 ) are arranged for a communicating connection of the measuring vacuum space ( 26 ) with the vacuum medium to be measured, wherein inside the reference vacuum space ( 25 ) at least part of the surface of the diaphragm ( 2 ) and at least part of a surface of the first housing body ( 1 ) are electrically conductive and form respective capacitor electrodes ( 7 , 7 ′) for the formation of an electric capacitance (C x ); a printed circuit board ( 10 ) which is equipped with electronic components ( 12 , 14 , R ref , C ref ) wherein at least one of said electronic components acts as a temperature sensor, wherein the printed circuit board ( 10 ) is electrically connected with the capacitor electrodes ( 7 , 7 ′) of the diaphragm pressure-measuring cell ( 20 ), wherein the printed circuit board ( 10 ) is positioned relative to the diaphragm pressure-measuring cell ( 20 ) such that the component that acts as a temperature sensor thermally contacts the first housing body, a microchip ( 12 ) containing a digital signal processor (DSP) with a temperature-to-digital converter (TDC) and a capacitance-to-digital converter (CDC) which operates using a time measuring method, said temperature-to-digital converter (TDC) and said capacitance-to-digital converter (CDC) being configured to determine a temperature (T x ) and the capacitance (C x ) of the diaphragm pressure-measuring cell ( 20 ) in comparison to a reference resistor (R ref ) for the temperature being arranged at the printed circuit board and in comparison to a reference capacitor (C ref ) for the capacitance (C x ) forming the measure for the pressure to be measured dependent on the deformation of the diaphragm ( 2 ), correlation means comprising stored relationships determined and saved in advance through a calibration process, and configured to derive a temperature-corrected pressure signal as a pressure signal p=f(C x , T eff ) at the signal output ( 16 ); the method further comprising: connecting the vacuum medium to be measured to the connecting means ( 5 ), the vacuum medium then being fluidically linked to the measuring vacuum space ( 26 ) and contacting the diaphragm; measuring the electric capacitance (C x ) of the capacitor electrodes ( 7 , 7 ′); measuring a temperature using the temperature sensor; and deriving a temperature-corrected pressure signal p=f(C x , T eff ). 2. The method according to claim 1 , characterized in that the values determined for the temperature correction and for the pressure signal via calibration are stored as a table in a memory (memory) within the microchip ( 12 ); the method comprising retrieving at least one of said stored values from the memory. 3. The method according to claim 1 , characterized in that the values determined for the temperature correction and for the pressure signal via calibration are stored as mathematical function T eff =f(T x ) and P eff =f(C x ) in a memory (memory) within the microchip ( 12 ). 4. The method according to claim 1 , characterized in that values determined for the temperature correction via calibration are stored as a table in a memory (memory) within the microchip ( 12 ) and the values determined for the pressure signal are stored as a mathematical functions T eff =f(T x ) and P eff =f(C x ) in the memory (memory) within the microchip ( 12 ); the method comprising retrieving at least one of said stored values from the memory. 5. The method according to claim 1 , characterized in that the values determined for the pressure signals via calibration are stored as a table in a memory (memory) within the microchip ( 12 ) and the values determined for the temperature correction via calibration are stored as a mathematical function T eff =f(T x ) in the memory (memory) within the microchip ( 12 ). 6. The method according to claim 1 , comprising: deriving the pressure signal from (1) the measured capacitance (C x ) of the diaphragm pressure-measuring cell ( 20 ), said capacitance being quantified by the capacitance-to-digital converter (CDC), and from (2) the measured temperature (T x ), said temperature being quantified by the temperature-to-digital converter (TDC), wherein the capacitance-to-digital converter (CDC), the temperature-to-digital converter (TDC), a digital signal processor (DSP), and a memory holding stored relationships of the correlation means, are all provided on the microchip ( 12 ). 7. The method according to claim 1 , characterized in that for each diaphragm pressure-measuring cell ( 20 ) calibration values for the correction of the measured temperature values and for the determination of the pressure signal are separately determined and are stored on the memory (memory) of the microchip ( 12 ). 8. The method according to claim 1 , characterized in that a resistor element is used for the temperature sensor. 9. The method according to claim 1 , characterized in that the microchip comprises the temperature sensor and thermally contacts the diaphragm pressure-measuring cell ( 20 ) via a heat transfer zone ( 13 ), the method comprising sensing the temperature using the temperature sensor. 10. The method according to claim 1 , characterized in that a cavity is provided on the printed circuit board above which the reference capacitor (C ref ) is installed such that the reference capacitor (C ref ) contacts the printed circuit board only at connecting ends. 11. The method according to claim 1 , wherein a measurement period of the microchip ( 12 ) is less than 8 milliseconds. 12. The method according to claim 1 , wherein at least one of the first housing body ( 1 ) and the diaphragm ( 2 ) comprises a dielectric material, and wherein the first housing body ( 1 ) and the diaphragm ( 2 ) provide capacitor electrodes ( 7 , 7 ′) on opposed surfaces, said capacitor electrodes each being provided as one or more electrically conductive layers. 13. The method according to claim 1 , wherein at least one of the first housing body ( 1 ), the diaphragm ( 2 ), and the second housing body ( 4 ) comprise dielectric aluminum oxide ceramic. 14. The method according to claim 1 , the method comprising processing at least one of a pressure signal and a temperature signal with a signal filter algorithm. 15. The method according to claim 1 , the method comprising using the measuring cell arrangement ( 100 ) as a reference measuring cell for calibrating one or more other measuring cells. 16. The method according to claim 1 , the method comprising using two measuring cell arrangements ( 100 ) as reference measuring cell fo

Assignees

Inventors

Classifications

  • G01L9/0072Primary

    using variations in capacitance · CPC title

  • using diaphragms · CPC title

  • using a ceramic diaphragm, e.g. alumina, fused quartz, glass · CPC title

  • with temperature compensating means (non electric temperature compensating means G01L19/04) · CPC title

  • G01L9/0045Primary

    Diaphragm associated with a buried cavity · CPC title

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What does patent US9791339B2 cover?
Arrangement with capacitive pressure-measuring cell has a diaphragm for measuring vacuum pressure and a printed circuit board acting as a temperature sensor and another electronic component designed as a microchip that contains a digital signal processor with a temperature-to-digital converter and a capacitance-to-digital converter using a time measuring method. The converters determine tempera…
Who is the assignee on this patent?
Inficon Gmbh, Inficon ag
What technology area does this patent fall under?
Primary CPC classification G01L9/0072. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 17 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).