Implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testing

US9785542B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9785542-B2
Application numberUS-201313864191-A
CountryUS
Kind codeB2
Filing dateApr 16, 2013
Priority dateApr 16, 2013
Publication dateOct 10, 2017
Grant dateOct 10, 2017

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  1. Title

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  2. Abstract

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method for debugging test procedures for automated device testing is disclosed. The method comprises receiving a command to update at least one modified test procedure modified during a first debugging session and saving state information for a test plan, wherein the state information comprises information regarding a breakpoint entry location, and wherein the modified test procedure is invoked within the test plan. The method subsequently comprises suspending execution of the test plan and unloading the modified test procedure. It also comprises compiling the modified test procedure to produce a compiled file and then reloading the test procedure into the test plan using the compiled file. Finally, it comprises resuming execution of the modified test procedure in a second debugging session and breaking the execution during the second debugging session at a breakpoint corresponding to the breakpoint entry location.

First claim

Opening claim text (preview).

What is claimed is: 1. A computer implemented method for debugging test procedures for automated device testing, said method comprising: receiving a command to update and invoke modifications made to at least one modified test procedure, wherein said at least one modified test procedure is modified during a first debugging session; saving state information for a test plan, wherein said state information comprises information regarding a breakpoint entry location, wherein said modified test procedure is invoked within said test plan, wherein said test plan is operable to execute on a site controller connected to plurality of devices under test (DUT), and wherein said test plan comprises a sequence of tests operable to be applied said plurality of DUTs coupled to automated test equipment, and wherein each test procedure is operable to implement a type of test applied to said plurality of DUTs; suspending execution of said test plan; unloading said modified test procedure from said test plan, wherein said unloading comprises detaching a debugger executing said first debugging session from said site controller; compiling said modified test procedure to produce a compiled file associated with said modified test procedure; reloading said modified test procedure into said test plan using said compiled file, wherein said reloading comprises attaching said debugger to said site controller and wherein said reloading further comprises transferring said compiled file from a system controller to said site controller, wherein said system controller is communicatively coupled to said site controller and wherein said system controller controls said site controller and instantiating test instances associated with said modified test procedure in said test plan using said compiled file; resuming execution of said modified test procedure and said test plan in a second debugging session; and breaking said execution during said second debugging session at a breakpoint corresponding to said breakpoint entry location, wherein said saving, said suspending, said unloading, said compiling, said reloading, said resuming and said breaking occur automatically in response to said receiving. 2. The method of claim 1 , wherein said resuming further comprises: clearing prior breakpoints set during said first debugging session; setting a breakpoint in said modified test procedure corresponding to said breakpoint entry location; and restoring said prior breakpoints after execution breaks during said second debugging session at said breakpoint corresponding to said breakpoint entry location. 3. The method of claim 1 , wherein said reloading further comprises: populating said test instances in said test plan with parameter values originally set during said first debugging session. 4. The method of claim 1 , wherein said modified test procedure comprises a base test procedure and at least one derived test procedure that depends from said base test procedure. 5. The method of claim 4 , further comprising: identifying said at least one derived test procedure that depends from said base test procedure before said unloading. 6. The method of claim 1 , further comprising: executing said modified test procedure to completion prior to said suspending. 7. The method of claim 1 , wherein said breakpoint entry location is selected from the group comprising: a current line, beginning of a current function, and any prior breakpoints. 8. The method of claim 1 , further comprising: executing said test plan to completion from said breakpoint corresponding to said breakpoint entry location during said second debugging session. 9. The method of claim 1 , further comprising: invoking said command to update said modified test procedure automatically when said modified test procedure is modified and a debug command is executed. 10. The method of claim 1 , further comprising: determining if test procedures are running in parallel to said modified test procedure in concurrently executing branch flow items; executing said test procedures running in parallel to completion while said modified test procedure is in a suspended state following said suspending; and suspending execution of further test procedures in said concurrently executing branch flow items while said modified test procedure is executing. 11. A non-transitory computer-readable storage medium having stored thereon, computer executable instructions that, if executed by a computer system cause the computer system to perform a computer implemented method for debugging test procedures for automated device testing, said method comprising: receiving a command to update and invoke modifications made to at least one modified test procedure, wherein said at least one modified test procedure is modified during a first debugging session; saving state information for a test plan, wherein said state information comprises information regarding a breakpoint entry location, wherein said modified test procedure is invoked within said test plan, wherein said test plan is operable to execute on a site controller connected to plurality of devices under test (DUT), and wherein said test plan comprises a sequence of tests operable to be applied said plurality of DUTs coupled to automated test equipment, and wherein each test procedure is operable to implement a type of test applied to said plurality of DUTs; suspending execution of said test plan; unloading said modified test procedure from said test plan, wherein said unloading comprises detaching a debugger executing said first debugging session from said site controller; compiling said modified test procedure to produce a compiled file associated with said modified test procedure; reloading said modified test procedure into said test plan using said compiled file, wherein said reloading comprises attaching said debugger to said site controller and wherein said reloading further comprises transferring said compiled file from a system controller to said site controller, wherein said system controller is communicatively coupled to said site controller and wherein said system controller controls said site controller and instantiating test instances associated with said modified test procedure in said test plan using said compiled file; resuming execution of said modified test procedure and said test plan in a second debugging session; and breaking said execution during said second debugging session at a breakpoint corresponding to said breakpoint entry location, wherein said saving, said suspending, said unloading, said compiling, said reloading, said resuming and said breaking occur automatically in response to said receiving. 12. The non-transitory computer-readable storage medium as described in claim 11 , wherein said method further comprises: clearing prior breakpoints set during said first debugging session; setting a breakpoint in said modified test procedure corresponding to said breakpoint entry location; and restoring said prior breakpoints after execution breaks during said second debugging session at said breakpoint corresponding to said breakpoint entry location. 13. The non-transitory computer-readable storage medium as described in claim 11 , wherein said method further comprises: populating said test instances in said test plan with parameter values originally set during said first debugging session. 14. The non-transitory computer-readable storage medium as described in claim 11 , wherein said modified test procedure comprises a base test procedure and at least one derived test procedure that depends from said base test procedure. 15. T

Assignees

Inventors

Classifications

  • Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing · CPC title

  • for test execution, e.g. scheduling of test suites · CPC title

  • Generation of test inputs, e.g. test vectors, patterns or sequences {; with adaptation of the tested hardware for testability with external testers} · CPC title

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What does patent US9785542B2 cover?
A method for debugging test procedures for automated device testing is disclosed. The method comprises receiving a command to update at least one modified test procedure modified during a first debugging session and saving state information for a test plan, wherein the state information comprises information regarding a breakpoint entry location, and wherein the modified test procedure is invok…
Who is the assignee on this patent?
Advantest Corp
What technology area does this patent fall under?
Primary CPC classification G06F11/3688. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 10 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).