Resist composition, method of forming resist pattern, polymeric compound, compound

US9778567B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9778567-B2
Application numberUS-201414540239-A
CountryUS
Kind codeB2
Filing dateNov 13, 2014
Priority dateNov 15, 2013
Publication dateOct 3, 2017
Grant dateOct 3, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A resist composition which generates acid upon exposure and exhibits changed solubility in a developing solution under action of acid, and which includes a base component (A) which exhibits changed solubility in a developing solution under action of acid, the base component (A) including a polymeric compound (A1) having a structural unit (a0) represented by general formula (a0-0) shown below (wherein V 11 represents an aliphatic cyclic group with or without a substituent; R 1 represents a lactam-containing cyclic group or a sultam-containing cyclic group; Y 1 represents an oxygen atom (—O—), an ester bond (—C(═O)—O—) or a single bond; and W 2 represents a group formed by a polymerization reaction of a polymerizable group-containing group).

First claim

Opening claim text (preview).

What is claimed is: 1. A resist composition which generates acid upon exposure and exhibits changed solubility in a developing solution under action of acid, wherein the resist composition comprises a base component (A) which exhibits changed solubility in a developing solution under action of acid, and an acid generator component (B), and the base component (A) comprises a polymeric compound (A1) comprising a structural unit (a0) represented by general formula (a0-1-1) shown below and a structural unit (a1) containing an acid decomposable group that exhibits increased polarity by the action of acid, wherein the amount of the polymeric compound (A1) based on the total weight of the component (A) is 50% by weight or more: wherein A″ represents an oxygen atom, a sulfur atom or an alkylene group of 1 to 5 carbon atoms with or without an oxygen atom or a sulfur atom; R 1 represents a lactam-containing cyclic group or a sultam-containing cyclic group selected from the group consisting of a group represented by general formulae (a0-r0-1) to (a0-r0-4); and W 2 represents a group which is formed by a polymerization reaction of a group containing a polymerizable group: wherein each Ra′ 01 independently represents a hydrogen atom, an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, —COOR″, —OC(═O)R″, a hydroxyalkyl group or a cyano group; R″ represents a hydrogen atom or an alkyl group; A″ represents an oxygen atom, a sulfur atom, or an alkylene group of 1 to 5 carbon atoms with or without an oxygen atom or a sulfur atom; Rb represents a hydrogen atom or a hydrocarbon group; and * represents a valence bond. 2. A method of forming a resist pattern, comprising: forming a resist film using the resist composition of claim 1 ; exposing the resist film; and developing the resist film to form a resist pattern. 3. A polymeric compound comprising a structural unit (a0) represented by general formula (a0-1-1) shown below and a structural unit (a1) containing an acid decomposable group that exhibits increased polarity by the action of acid: wherein A″ represents an oxygen atom, a sulfur atom or an alkylene group of 1 to 5 carbon atoms with or without an oxygen atom or a sulfur atom; R 1 represents a sultam-containing cyclic group selected from the group consisting of a group represented by general formulae (a0-r0-1) or (a0-r0-2); and W 2 represents a group which is formed by a polymerization reaction of a group containing a polymerizable group: wherein each Ra′ 01 independently represents a hydrogen atom, an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, —COOR″, —OC(═O)R″, a hydroxyalkyl group or a cyano group; R″ represents a hydrogen atom or an alkyl group; A″ represents an oxygen atom, a sulfur atom, or an alkylene group of 1 to 5 carbon atoms with or without an oxygen atom or a sulfur atom; Rb represents a hydrogen atom or a hydrocarbon group; and * represents a valence bond. 4. A compound represented by general formula (I) shown below: wherein A″ represents an oxygen atom, a sulfur atom or an alkylene group of 1 to 5 carbon atoms with or without an oxygen atom or a sulfur atom; R 1 represents a sultam-containing cyclic group selected from the group consisting of a group represented by general formulae (a0-r0-1) or (a0-r0-2); and R 2 represents a polymerizable group-containing group: wherein each Ra′ 01 independently represents a hydrogen atom, an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, —COOR″, —OC(═O)R″, a hydroxyalkyl group or a cyano group; R″ represents a hydrogen atom or an alkyl group; A″ represents an oxygen atom, a sulfur atom, or an alkylene group of 1 to 5 carbon atoms with or without an oxygen atom or a sulfur atom; Rb represents a hydrogen atom or a hydrocarbon group; and * represents a valence bond.

Assignees

Inventors

Classifications

  • and containing nitrogen and oxygen · CPC title

  • G03F7/0397Primary

    the macromolecular compound having an alicyclic moiety in a side chain · CPC title

  • containing oxygen in addition to the carboxy oxygen {, e.g. 2-N-morpholinoethyl (meth)acrylate or 2-isocyanatoethyl (meth)acrylate} · CPC title

  • Chemistry & Metallurgy · mapped topic

  • Chemistry & Metallurgy · mapped topic

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What does patent US9778567B2 cover?
A resist composition which generates acid upon exposure and exhibits changed solubility in a developing solution under action of acid, and which includes a base component (A) which exhibits changed solubility in a developing solution under action of acid, the base component (A) including a polymeric compound (A1) having a structural unit (a0) represented by general formula (a0-0) shown below (w…
Who is the assignee on this patent?
Tokyo Ohka Kogyo Co Ltd
What technology area does this patent fall under?
Primary CPC classification G03F7/0397. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 03 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).