Swept source interferometric imaging systems and methods

US9778018B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9778018-B2
Application numberUS-201514613121-A
CountryUS
Kind codeB2
Filing dateFeb 3, 2015
Priority dateFeb 14, 2014
Publication dateOct 3, 2017
Grant dateOct 3, 2017

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

Embodiments herein include swept-source interferometric imaging systems employing arbitrary sweep patterns in which a swept-source is swept over a continuous spectral range where the variation of wavelength over time is noncontinuous. Embodiments include sweep patterns that result in reduction of signals from moving scatterers and where the sweep is synchronized with the dead time of the camera.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for imaging a sample interferometrically comprising: illuminating the sample with a light source, said light source being swept over a range of frequencies; detecting combined light returning from the sample and light from a reference arm at a detector and generating signals in response thereto; processing said detected signals to generate an image of the sample, wherein the light source is swept with an arbitrary sweep pattern and wherein the arbitrary sweep pattern covers a continuous range of wavelengths and wherein the variation of wavelength over time is non-continuous. 2. An interferometric imaging method as recited in claim 1 , wherein the light source illuminates a point on the sample. 3. An interferometric imaging method as recited in claim 1 , wherein the light source illuminates a line on the sample. 4. An interferometric imaging method as recited in claim 1 , wherein the light source illuminates a two dimensional area on the sample. 5. A method for imaging a sample interferometrically comprising: illuminating the sample with a light source, said light source being swept over a range of frequencies; detecting combined light returning from the sample and light from a reference arm at a detector and generating signals in response thereto, said detector having dead time between exposures; and processing said detected signals to generate an image of the sample wherein the light source is either turned off during the dead time of the detector or the output of the light source is reduced during the dead time of the detector. 6. A method as recited in claim 5 , wherein the light source is swept using an arbitrary sweep pattern to cover a continuous range of wavelengths and wherein the variation of wavelength over time is non-continuous. 7. A method as recited in claim 5 , wherein the sweeping of the light source is halted during the dead time of the detector. 8. A method as recited in claim 5 , wherein the output of the light source is reduced during the dead time of the detector. 9. A method as recited in claim 5 , wherein the output of the light source is turned off during the dead time of the detector.

Assignees

Inventors

Classifications

  • of the object · CPC title

  • Tomographic interferometers, e.g. based on optical coherence · CPC title

  • using frequency scans · CPC title

  • using discrete frequency stepping or switching · CPC title

  • for optical coherence tomography [OCT] · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US9778018B2 cover?
Embodiments herein include swept-source interferometric imaging systems employing arbitrary sweep patterns in which a swept-source is swept over a continuous spectral range where the variation of wavelength over time is noncontinuous. Embodiments include sweep patterns that result in reduction of signals from moving scatterers and where the sweep is synchronized with the dead time of the camera.
Who is the assignee on this patent?
Zeiss Carl Meditec Inc
What technology area does this patent fall under?
Primary CPC classification G01B9/02004. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 03 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).