Method for soldering shape memory alloys

Patent metadata

Field	Value
Publication number	US-9775252-B2
Application number	US-201514931056-A
Country	US
Kind code	B2
Filing date	Nov 3, 2015
Priority date	Nov 3, 2015
Publication date	Sep 26, 2017
Grant date	Sep 26, 2017

Abstract

A method of soldering a shape memory alloy (SMA) element to a component includes positioning a tinned end of the SMA element with respect to a surface of the component, and then directly soldering the tinned end to the surface using solder material having a low liquidus temperature of 500° F. or less when an oxide layer is not present on the SMA element. The end may be soldered using lead-based solder material at a higher temperature when an oxide layer is present. The end may be tinned with flux material containing phosphoric acid or tin fluoride prior to soldering the SMA element. The SMA element may be submersed in an acid bath to remove the oxide layer. The solder material may contain tin and silver, antimony, or zinc, or other materials sufficient for achieving the low liquidus temperature. Heat penetrating the SMA element is controlled to protect shape memory abilities.

First claim

The invention claimed is:

1. A method of soldering a shape memory alloy (SMA) element to a component, the method comprising:
tinning an end of the SMA element with a solder material and a predetermined flux material, wherein the flux material contains concentrated phosphoric acid or tin fluoride, and wherein the solder material has a liquidus temperature that does not exceed 500° F.;
positioning the tinned end of the SMA element with respect to a surface of the component;
directly soldering the tinned end of the SMA element to the surface of the component using the solder material without crimping of the SMA element or using intervening structure between the SMA element and the component; and
controlling an amount of heat penetrating into a depth of the SMA element by attaching clip-on heat sinks to the SMA element such that the heat is locally retained and does not penetrate sufficiently into the depth of SMA element to cause shape memory abilities of the SMA element to be lost while tinning and directly soldering the SMA element.

2. The method of claim 1 , wherein the predetermined flux material contains the concentrated phosphoric acid of at least 80% phosphoric acid by weight.

3. The method of claim 1 , further comprising: detecting an oxide layer on the SMA element and using a leaded solder material as the solder material in response to the detected oxide layer.

4. The method of claim 3 , wherein the leaded solder material is at least 70% elemental lead by weight.

5. The method of claim 1 , further comprising: detecting an absence of an oxide layer on the SMA element, and using a lead-free solder material as the solder material in response to the detected absence of the oxide layer.

6. The method of claim 1 , wherein the predetermined flux material contains the tin fluoride.

7. The method of claim 1 , further comprising: submersing the SMA element in an acid bath, prior to tinning the end of the SMA element, for a calibrated duration sufficient for removing an oxide layer from the SMA element.

8. The method of claim 7 , wherein submersing the SMA element in an acid bath includes submersing the SMA element in a mixture of hydrofluoric acid and nitric acid.

9. The method of claim 1 , wherein the solder material contains elemental tin and elemental silver.

10. The method of claim 1 , wherein the component is a contact pad of a printed circuit board assembly.

11. The method of claim 1 , wherein the SMA element is an SMA wire constructed of nickel titanium.

12. A method of soldering a nickel titanium (NiTi) shape memory alloy (SMA) wire to a component, the method comprising:
submersing the NiTi SMA wire in an acid bath for a calibrated duration sufficient to remove an oxide layer from the NiTi SMA wire, thereby producing a clean SMA wire;
tinning an end of the clean NiTi SMA wire with a non-leaded solder material and a flux material;
positioning the tinned end of the clean NiTi SMA wire with respect to a surface of the component;
directly soldering the tinned end of the clean NiTi SMA wire to the surface of the component using the solder material without crimping of the NiTi SMA wire or using intervening structure between the NiTi SMA wire and the component, wherein the solder material has a liquidus temperature that does not exceed 500° F.; and
controlling an amount of heat penetrating into a depth of the NiTi SMA wire by attaching clip-on heat sinks to the NiTi SMA wire such that the heat is locally retained and does not penetrate sufficiently into the depth of NiTi SMA wire to cause shape memory abilities of the NiTi SMA wire to be lost while tinning and directly soldering the NiTi SMA wire.

13. The method of claim 12 , wherein the flux material contains at least 80% phosphoric acid by weight.

14. The method of claim 12 , wherein the solder material contains at least 15% elemental tin by weight.

15. The method of claim 14 , wherein the solder material is 96.5% elemental tin and 3.5% elemental silver.

16. The method of claim 12 , wherein submersing the SMA wire in an acid bath includes submersing the SMA wire in a concentrated mixture of hydrofluoric acid and nitric acid.

17. The method of claim 12 , wherein the surface of the component is a contact pad of a printed circuit board assembly.

18. A method of soldering a nickel titanium (NiTi) shape memory alloy (SMA) wire to a contact pad of a printed circuit board, the method comprising:
removing an oxide layer from the NiTi SMA wire using a concentrated mixture of hydrofluoric and nitric acid;
tinning an end of the NiTi SMA wire with a flux material containing at least 80% phosphoric acid by weight;
directly soldering the tinned end of the NiTi SMA wire to the contact pad of the printed circuit board without crimping of the NiTi SMA wire or using intervening structure between the NiTi SMA wire and the printed circuit board using a non-leaded solder material having a liquidus temperature that does not exceed 500° F.; and
controlling an amount of heat penetrating into a depth of the NiTi SMA wire by attaching clip-on heat sinks to the NiTi SMA wire such that the heat is locally retained and does not penetrate sufficiently into the depth of NiTi SMA wire to cause shape memory abilities of the NiTi SMA wire to be lost while tinning and directly soldering the NiTi SMA wire.

19. The method of claim 18 , wherein the non-leaded solder material is 96.5% elemental tin and 3.5% elemental silver by weight.

Assignees

• Gm Global Tech Operations Llc

Inventors

• Pinto Iv Nicholas W
• Johnson Nancy L
• Irish Nicholas P
• Balogh Michael P
• Haddad Daad B

Classifications

• H05K3/3465

  Application of solder · CPC title

• H05K3/3489 Primary

  Composition of fluxes; Application thereof; Other processes of activating the contact surfaces · CPC title

• B23K1/19

  taking account of the properties of the materials to be soldered · CPC title

• B23K35/362

  Selection of compositions of fluxes (B23K35/365, B23K35/368 take precedence) · CPC title

• B23K1/203

  Fluxing, i.e. applying flux onto surfaces · CPC title