Digital imaging with masked pixels

Patent metadata

Field	Value
Publication number	US-9774804-B2
Application number	US-201414563411-A
Country	US
Kind code	B2
Filing date	Dec 8, 2014
Priority date	Dec 13, 2013
Publication date	Sep 26, 2017
Grant date	Sep 26, 2017

Abstract

In one application, an imaging device includes an image sensor having an array of pixels, and a mask coupled with the image sensor. The mask is configured to darken a plurality of isolated pixels or groups of pixels interspersed within the array of pixels. The imaging device also includes a processor coupled with the image sensor and configured to receive image data from the image sensor, and determine a dark current fixed pattern noise based on the image data received from the plurality of darkened pixels or groups of pixels.

First claim

What is claimed is:

1. An imaging device comprising:
an image sensor comprising an array of pixels;
a processor coupled with the image sensor; and
a mask coupled with the image sensor, the mask configured to darken a plurality of isolated pixels or groups of pixels interspersed within the array of pixels;
wherein the array of pixels comprises a plurality of un-darkened pixels, and the processor is configured to:
receive image data from the image sensor including a signal for each pixel in the array of pixels, and determine a dark current fixed pattern noise based on the image data received from the plurality of darkened pixels or groups of pixels;
for each of the plurality of un-darkened pixels in the array of pixels, determine nearby darkened pixels that are nearest to each of the plurality of un-darkened pixels;
determine a change in a dark current fixed pattern of each of the nearby darkened pixels from a previously recorded dark current fixed pattern of each of the nearby darkened pixels;
determine a change in a dark current fixed pattern for each of the plurality of un-darkened pixels from a previously recorded dark current fixed pattern of each of the plurality of un-darkened pixels, based on an interpolation of the change in the dark current fixed pattern of each of the nearby darkened pixels that are nearest to each of the plurality of un-darkened pixels;
determine a dark current fixed pattern of each of the plurality of un-darkened pixels based on the change in a dark current fixed pattern for each of the plurality of un-darkened pixels; and
subtract the dark current fixed pattern of each of the plurality of un-darkened pixels from the signal for each of the plurality of un-darkened pixels.

2. The imaging device of claim 1 wherein the image sensor is a charge coupled device (CCD) or a complementary metal oxide semiconductor (CMOS) sensor.

3. The imaging device of claim 1 wherein the plurality of isolated pixels or groups of pixels are interspersed within the array of pixels in a random or semi-random distribution.

4. The imaging device of claim 1 wherein the plurality of isolated pixels or groups of pixels are interspersed within the array of pixels in a two dimensional array.

5. The imaging device of claim 1 wherein the mask is configured to combine an array of darkened pixels with a continuous frame of darkened pixels at a circumference of the image sensor.

6. The imaging device of claim 1 wherein the plurality of isolated pixels or groups of pixels includes a plurality of non-adjacent pixels in the array of pixels.

7. The imaging device of claim 1 wherein the plurality of isolated pixels or groups of pixels includes a group of more than one adjacent pixel in the array of pixels.

8. The imaging device of claim 1 wherein the mask comprises a thin sheet of transparent material attached to the array of pixels.

9. The imaging device of claim 1 wherein the mask comprises absorbing or reflecting material evaporated directly onto the array of pixels on the sensor.

10. The imaging device of claim 1 further comprising a faceplate coupled with the sensor and wherein the mask comprises opaque material evaporated or printed over the faceplate.

11. The imaging device of claim 1 further comprising optical components coupled with the sensor and wherein the optical components comprise at least one image plane and wherein the mask is coupled with the at least one image plane.

12. The imaging device of claim 1 wherein the processor is further configured to determine a dark current fixed pattern for each of the plurality of darkened pixels, and determine a dark current fixed pattern for each of a plurality of un-darkened pixels based on the dark current fixed pattern of each of the plurality of darkened pixels.

13. The imaging device of claim 1 wherein the previously recorded dark current fixed pattern includes a fixed pattern offset which comprises an average of a series of images when the array of pixels of the sensor is completely darkened at a shortest exposure time.

14. The imaging device of claim 1 wherein the previously recorded dark current fixed pattern is an average of a series of images for each of an increasing exposure time when the array of pixels of the sensor is completely darkened at each of the increasing exposure times.

15. The imaging device of claim 1 wherein the device is configured to detect chemiluminescence signals from a probe bound to biological material on a membrane.

16. The imaging device of claim 1 wherein the array of pixels is a linear array.

17. A method comprising:
receiving, at a processor of a device, image data from an image sensor, wherein receiving image data from the image sensor comprises receiving from the sensor, a signal for each pixel in an array of pixels of the sensor, the array of pixels comprising a plurality of isolated darkened pixels or groups of pixels interspersed in the array of pixels, and the array comprising a plurality of un-darkened pixels;
determining a dark current fixed pattern noise based on data for the plurality of darkened pixels or groups of pixels in the image data; and
subtracting the dark current fixed pattern noise from the image data;
wherein determining the dark current fixed pattern noise comprises:
for each of the plurality of un-darkened pixels in the array of pixels, determining, by the processor, nearby darkened pixels that are nearest to each of the plurality of un-darkened pixels;
determining, by the processor, a change in a dark current fixed pattern of each of the nearby darkened pixels from a previously recorded dark current fixed pattern of each of the nearby darkened pixels;
determining, by the processor, a change in a dark current fixed pattern for each of the plurality of un-darkened pixels from a previously recorded dark current fixed pattern of each of the plurality of un-darkened pixels, based on an interpolation of the change in the dark current fixed pattern of each of the nearby darkened pixels that are nearest to each of the plurality of un-darkened pixels; and
determining, by the processor, a dark current fixed pattern of each of the plurality of un-darkened pixels based on the change in a dark current fixed pattern for each of the plurality of un-darkened pixels.

18. The method of claim 17 wherein the previously recorded dark current fixed pattern includes a fixed pattern offset which comprises an average of a series of images when the array of pixels of the sensor is completely darkened at a shortest exposure time.

19. The method of claim 17 wherein the previously recorded dark current fixed pattern is an average of a series of images for each of an increasing exposure time when the array of pixels of the sensor is completely darkened at each of the increasing exposure times.

20. The method of claim 17 wherein subtracting the dark current fixed pattern noise from the image data comprises:
subtracting, by the processor, the dark current fixed pattern of each of the plurality of un-darkened pixels from the signal for each of the plurality of un-darkened pixels.

21. The method of claim 17 wherein the plurality of darkened pixels or groups of pixels are arranged in a random or semi-random distribution, or in a two dimensional array.

22. The method of claim 17 wherein the plurality of darkened pixels or groups of pixels comprise an array of darkened pixels and a continuous frame of darkened pixels at the circumference of the array sensor.

Assignees

• Bio Rad Laboratories Inc

Inventors

• Ran Boaz
• Swihart Steve
• Thrush Evan
• Barak Itay

Classifications

• H04N25/67 Primary

  applied to fixed-pattern noise, e.g. non-uniformity of response · CPC title

• H04N5/361 Primary

  Electricity · mapped topic

• H04N5/365

  Electricity · mapped topic

• H04N25/633

  by using optical black pixels · CPC title