Method of imaging the electrical conductivity distribution of a subsurface

US9772423B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9772423-B2
Application numberUS-201414447443-A
CountryUS
Kind codeB2
Filing dateJul 30, 2014
Priority dateJul 30, 2014
Publication dateSep 26, 2017
Grant dateSep 26, 2017

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Abstract

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A method of imaging electrical conductivity distribution of a subsurface containing metallic structures with known locations and dimensions is disclosed. Current is injected into the subsurface to measure electrical potentials using multiple sets of electrodes, thus generating electrical resistivity tomography measurements. A numeric code is applied to simulate the measured potentials in the presence of the metallic structures. An inversion code is applied that utilizes the electrical resistivity tomography measurements and the simulated measured potentials to image the subsurface electrical conductivity distribution and remove effects of the subsurface metallic structures with known locations and dimensions.

First claim

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I claim: 1. A method for imaging electrical conductivity distribution within a subsurface containing metallic structures with known locations and dimensions, the method comprising the steps of: a. generating electrical resistivity tomography measurements by injecting electrical currents into the subsurface and measuring electrical resistivity of items within the subsurface using multiple sets of electrodes; b. generating simulated data by applying a numeric code that simulates the measured resistivity of the known metallic structures; c. calculating tomographs from the simulated and measured electrical resistivity data; and d. applying an inversion code that removes the effects of the subsurface metallic structures with known locations and dimensions on the measured data. 2. The method of claim 1 wherein the numeric code is a forward model. 3. The method of claim 2 wherein the applying the forward model to simulate the subsurface potentials comprises a solution to a Poisson equation. 4. The method of claim 3 wherein the Poisson equation includes at least one of the following: integral calculations, analytical calculations, numerical calculations, partial solutions calculations, digital calculations, and an immersed interface boundary condition solution. 5. The method of claim 3 wherein the inversion code is applied so that the simulated electrical potentials match actual measured electrical potentials in the presence of the metallic structures. 6. The method of claim 4 wherein applying the inversion code includes generating an electrical conductivity distribution that minimizes error between the simulated electrical potentials and the actual potentials measured in the presence of the metallic structures. 7. The method of claim 2 wherein applying the forward model and the inversion produces a reconstructed three-dimensional image of the subsurface, while removing the effects of the subsurface metallic structures. 8. The method of claim 1 wherein the electrodes are at least one of the following: surface electrodes, well casing electrodes, arrays of point buried electrodes, and the metallic structures with known locations and dimensions used as electrodes. 9. The method of claim 1 wherein a boundary of each metallic structure is represented by nodes, faces, or segments of unstructured tetrahedral elements. 10. A method of locating features including leaks and leaked materials beneath a subsurface containing metallic infrastructures such as pipes and tanks with known locations and dimensions, the method comprising: a. injecting current and measuring electrical potential of the subsurface with multiple sets of electrodes in the presence of the metallic infrastructures, thus generating electrical resistivity tomography measurements; b. applying a forward model to simulate the subsurface electrical potential measurement of those metallic infrastructures; and c. performing an inversion of the forward model to generate an electrical conductivity distribution that minimizes error between the simulated electrical potentials and actual measured electrical potentials, while removing the effects of the metallic structures on the measured tomography measurements. 11. The method of claim 10 wherein the applying the forward model to simulate the electrical potential measurement comprises a solution to a Poisson equation. 12. The method of claim 11 wherein the Poisson equation is solved using an immersed interface boundary condition solution to simulate subsurface potentials generated in the presence of the metallic structures. 13. The method of claim 12 wherein the Poisson equation includes at least one of the following: integral calculations, analytical calculations, numerical calculations, partial solutions calculations, digital calculations, and an immersed interface boundary condition solution. 14. The method of claim 11 wherein applying the forward model and performing the inversion produces a reconstructed three-dimensional image of the subsurface, while removing the effects of the metallic structures. 15. The method of claim 10 wherein the electrodes are at least one of the following: surface electrodes, well casing electrodes, arrays of point buried electrodes, and the metallic structures used as electrodes. 16. The method of claim 10 wherein a boundary of each metallic structure is represented by nodes, faces, or segments of unstructured tetrahedral elements. 17. A method of imaging electrical conductivity distribution of features within a subsurface containing metallic structures with known locations and dimensions, the method comprising the steps of: a. injecting electrical currents into the subsurface to measure electrical potentials using multiple sets of electrodes, thus generating actual electrical resistivity tomography measurements; b. generating simulated electrical resistivity measurements by applying a Poisson equation to simulate the measured potentials in the presence of the metallic structures, wherein a boundary of each metallic structure is represented by nodes, faces, or segments of unstructured tetrahedral elements; and c. applying an inversion code to the simulated and actual electrical resistivity measurements to removes the effects of the subsurface metallic structures with known locations and dimensions on the actual data; and d. e. producing a reconstructed three-dimensional image of the subsurface electrical conductivity in the presence of the subsurface metallic structures. 18. The method of claim 17 wherein the Poisson equation includes at least one of the following: integral calculations, analytical calculations, numerical calculations, partial solutions calculations, digital calculations, and an immersed interface boundary condition solution. 19. The method of claim 17 wherein the electrodes are at least one of the following: surface electrodes, well casing electrodes, arrays of point buried electrodes, and the metallic structures used as electrodes. 20. The method of claim 17 wherein the inversion code is applied so that the simulated electrical potentials match actual measured electrical potentials in the presence of the metallic structures.

Assignees

Inventors

Classifications

  • G01V3/02Primary

    operating with propagation of electric current · CPC title

  • G01V3/20Primary

    operating with propagation of electric current · CPC title

  • Survey of boreholes or wells (monitoring pressure or flow of drilling fluid E21B21/08) · CPC title

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What does patent US9772423B2 cover?
A method of imaging electrical conductivity distribution of a subsurface containing metallic structures with known locations and dimensions is disclosed. Current is injected into the subsurface to measure electrical potentials using multiple sets of electrodes, thus generating electrical resistivity tomography measurements. A numeric code is applied to simulate the measured potentials in the pr…
Who is the assignee on this patent?
Johnson Timothy C, Battelle Memorial Institute
What technology area does this patent fall under?
Primary CPC classification G01V3/02. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Sep 26 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).