Photonic-channeled X-ray detector array

Patent metadata

Field	Value
Publication number	US-9772407-B2
Application number	US-201615230199-A
Country	US
Kind code	B2
Filing date	Aug 5, 2016
Priority date	Aug 7, 2015
Publication date	Sep 26, 2017
Grant date	Sep 26, 2017

Abstract

An X-ray detector array includes a scintillator that converts input X-ray radiation to secondary optical radiation output from the scintillator, a first telecentric micro lens array that array receives the secondary optical radiation, a phase coded aperture, where the first telecentric micro lens array directs the secondary optical radiation on the phase coded aperture, a second telecentric micro lens array, where the secondary optical radiation output from the phase coded array is directed to the second telecentric micro lens array, a patterned grating mask, where the second telecentric micro lens array directs the optical beam on the patterned mask, and a photodetector array, where the patterned mask outputs the optical beam in a pattern according to the patterned mask to the photodetector array, where the photodetector array outputs a signal, where a photon fringe pattern is imaged and sampled in the wavelength domain of the radiation from the scintillator.

First claim

What is claimed:

1. An X-ray detector array, comprising:
a) a scintillator, wherein said scintillator converts an input X-ray radiation to a secondary optical radiation, wherein said secondary optical radiation is output from said scintillator;
b) a first telecentric micro lens array wherein said telecentric micro lens array receives said secondary optical radiation;
c) a phase coded aperture, wherein said first telecentric micro lens array directs said secondary optical radiation on said phase coded aperture;
d) a second telecentric micro lens array, wherein said secondary optical radiation output from said phase coded array is directed to said second telecentric micro lens array;
e) a patterned grating mask, wherein said second telecentric micro lens array directs said optical beam on said patterned mask; and
f) a photodetector array, wherein said patterned mask outputs said optical beam in a pattern according to said patterned mask to said photodetector array, wherein said photodetector array outputs a signal, wherein a photon fringe pattern is imaged and sampled in the wavelength domain of said radiation from said scintillator.

2. The X-ray detector array according to claim 1 , wherein said scintillator comprises a CsI scintillator crystal.

3. The X-ray detector array according to claim 1 , wherein said phase coded aperture comprises a phase plate, wherein said phase plate comprises a cubic phase profile, wherein said phase plate is placed at a Fourier plane of said first telecentric micro lens array, wherein said phase plate is disposed to modify a point spread function, wherein said modified point spread function in an x-direction is constant over a depth of focus, wherein a point spread function in a y-direction increases with defocusing.

4. The X-ray detector array according to claim 1 , wherein said patterned grating mask comprises a chromium patterned grating mask.

5. The X-ray detector array according to claim 4 , wherein said grating mask comprises a photo processed absorption time mask.

6. The X-ray detector array according to claim 1 , wherein said scintillator crystal has a thickness in a range of 0.001-1 mm.

7. The X-ray detector array according to claim 1 , wherein each said telecentric micro lens array is arranged to form a 4-f imaging system.

8. The X-ray detector array according to claim 1 , wherein said patterned grating mask is placed at a focal plane of said second telecentric micro lens array.

9. The X-ray detector array according to claim 1 , wherein said X-ray detector array comprises a depth of focus configured to detect a distortion of an X-ray fringe while capturing photons from an entire volume of said scintillator.

Assignees

• Univ Leland Stanford Junior
• Univ Of Arizona

Inventors

• Cheng Yao-Te
• Hesselink Lambertus
• Kim Young-Sik
• Takashima Yuzuru
• Yuen Max

Classifications

• G21K2207/005

  Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast · CPC title

• G01T1/2023

  Selection of materials · CPC title

• G01T1/2002 Primary

  Optical details, e.g. reflecting or diffusing layers · CPC title

• G01N23/04

  and forming images of the material · CPC title

• G01T1/2018

  Scintillation-photodiode combinations · CPC title