Device and method for optical measurement of a target

Patent metadata

Field	Value
Publication number	US-9772228-B2
Application number	US-201415030697-A
Country	US
Kind code	B2
Filing date	Oct 21, 2014
Priority date	Oct 21, 2013
Publication date	Sep 26, 2017
Grant date	Sep 26, 2017

Abstract

A device and a method for optical measurement of a target, wherein the target is irradiated with radiation beam ( 15 ) and a measurement beam ( 27 ) is received from the target and detected. Commonly used absorbance, reflectance and fluorescence measurements do not provide adequate information in e.g. measuring small contents of sulphur compounds. The present solution provides a new Raman spectrometer which is suitable for mass applications. A target is activated with pulses of a laser diode ( 12 ). The Raman signatures are measured and integrated successively with a point detector ( 44 ). A Fabry-Perot interferometer ( 42 ) on the measurement path is successively controlled into corresponding pass bands. While high spectral resolution or range is not required it is possible to use small-sized and low cost components.

First claim

The invention claimed is:

1. A device for optical measurement of a target with Raman spectroscopy, the device comprising:
a radiation source for providing an activation radiation beam to the target, a detector for receiving a measurement radiation beam of Raman scattered radiation including signature wavelengths of a measured target material from the target and providing a signal which corresponds to the amount of radiation received by the detector from the target, and a Fabry-Perot interferometer disposed within the path of the measurement radiation beam, wherein:
the radiation source is a laser radiation source with a substantially fixed radiation wavelength,
the detector is a single point detector,
the Fabry-Perot interferometer has a controllable pass band wavelength,
the device is configured to control the Fabry-Perot interferometer sequentially into pass bands which correspond to signature wavelengths of the measured target material,
the device is configured to integrate the received measurement radiation signals of each measured signature wavelength,
the device is configured to provide a measurement result on the basis of the integrated signals

measurement radiation of a plurality of selected wavelengths is successively measured and cumulatively integrated, and
wherein the plurality of selected wavelengths and the integration times per each wavelength point are selected on the basis of the characteristic Raman spectrum of the target material to be measured.

2. The device according to claim 1 , wherein the detector is configured to integrate the received measurement radiation signals.

3. The device according to claim 1 , wherein the detector is a semiconductor photo detector.

4. The device according to claim 1 , wherein the laser radiation source is a laser diode.

5. The device according to claim 1 , wherein the device is arranged to integrate the radiation measurement signals of each signature separately.

6. The device according to claim 1 , wherein the device is arranged to measure signatures of predetermined molecules which include a predetermined chemical element.

7. The device according to claim 1 , wherein the device further comprises a fixed filter within the path of the measurement radiation beam, which fixed filter is arranged to block radiation with the wavelength of the radiation source and/or other than Raman emission received from the target or environment.

8. A method for optical measurement of a target, the method comprising:
providing a radiation beam to the target with Raman spectroscopy, receiving a measurement radiation beam of Raman scattered radiation including signature wavelengths of measured target material from the target and providing a signal which corresponds to the amount of radiation received by a detector from the target, and filtering the received measurement radiation beam with a Fabry-Perot interferometer, wherein:
a laser beam with a substantially fixed radiation wavelength is provided as the radiation beam,
the measurement radiation beam is detected with a single point detector,
the Fabry-Perot interferometer has a controllable pass band wavelength,
the pass band wavelength of the Fabry-Perot interferometer is controlled sequentially into pass bands which correspond to signature wavelengths of the measured target material,
the received measurement radiation signals of each measured signature wavelength are integrated,
a measurement result is provided on the basis of the integrated signals,

measurement radiation of a plurality of selected wavelengths is successively measured and cumulatively integrated, and
the plurality of selected wavelengths and the integration times per each wavelength point are selected on the basis of the characteristic Raman spectrum of the target material to be measured.

9. The method according to claim 8 , wherein the received measurement radiation signals are integrated as charges in the detector.

10. The method according to claim 8 , wherein the radiation measurement signals of each signature are integrated separately.

11. The method according to claim 8 , wherein only signatures of molecules which include a predetermined chemical element are measured.

12. The method according to claim 8 , wherein the radiation with the wavelength of the radiation source and/or other than Raman emission received from the target or environment is blocked with a fixed filter.

13. The method according to claim 8 , wherein the material contents of the target is monitored by continuously repeating the measurement sequence.

Assignees

• Teknologian Tutkimuskeskus Vtt Oy
• Teknologian Tutkimuskeskus Vtt Oy

Inventors

• Antila Jarkko
• Tenhunen Jussi

Classifications

• G02B26/00

  Optical devices or arrangements for the control of light using movable or deformable optical elements (control of light by modification of the optical properties of the media of the elements involved therein G02F1/00) · CPC title

• G02B5/28

  Interference filters · CPC title

• G01N21/65

  Raman scattering · CPC title

• G01J3/44

  Raman spectrometry; Scattering spectrometry {; Fluorescence spectrometry} · CPC title

• G01J3/45

  Interferometric spectrometry · CPC title