Wafer coating

US9768014B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9768014-B2
Application numberUS-201514658102-A
CountryUS
Kind codeB2
Filing dateMar 13, 2015
Priority dateJan 31, 2014
Publication dateSep 19, 2017
Grant dateSep 19, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Improved wafer coating processes, apparatuses, and systems are described. In one embodiment, an improved spin-coating process and system is used to form a mask for dicing a semiconductor wafer with a laser plasma dicing process. In one embodiment, a spin-coating apparatus for forming a film over a semiconductor wafer includes a rotatable stage configured to support the semiconductor wafer. The rotatable stage has a downward sloping region positioned beyond a perimeter of the semiconductor wafer. The apparatus includes a nozzle positioned above the rotatable stage and configured to dispense a liquid over the semiconductor wafer. The apparatus also includes a motor configured to rotate the rotatable stage.

First claim

Opening claim text (preview).

What is claimed is: 1. A spin-coating apparatus for forming a film over a substrate mounted on a carrier, the spin-coating apparatus comprising: a rotatable stage comprising: an inner region to support the substrate, an outer region; and a downward sloping region coupled with the inner region and positioned beyond a perimeter of the substrate, wherein the outer region of the rotatable stage is located beyond the downward sloping region, and wherein the outer region is flat, and wherein the inner region, downward sloping region, and outer region of the rotatable stage are one piece; a nozzle positioned above the rotatable stage and configured to dispense a liquid over the substrate; and a motor configured to rotate the rotatable stage. 2. The spin-coating apparatus of claim 1 , wherein the downward sloping region has an angle that is between 1 and 10 degrees. 3. The spin-coating apparatus of claim 1 , wherein the inner region positioned under the substrate is substantially flat. 4. The spin-coating apparatus of claim 1 , wherein the outer region of the rotatable stage comprises a holding mechanism configured to hold a wafer frame over which the substrate is mounted. 5. A spin-coating apparatus for forming a film over a substrate mounted on a carrier, the spin-coating apparatus comprising: a rotatable stage configured to support the substrate mounted on the carrier, wherein the rotatable stage comprises: an inner region positioned under the substrate, an outer region positioned under edges of the carrier and having a lower height than the inner region, and a downward sloping region between the inner region and the outer region; a nozzle positioned above the rotatable stage and configured to dispense a liquid over the substrate; and a motor configured to rotate the rotatable stage. 6. The spin-coating apparatus of claim 5 , wherein the downward sloping region has an angle that is between 1 and 10 degrees. 7. The spin-coating apparatus of claim 5 , wherein the inner region positioned under the substrate is substantially flat. 8. The spin-coating apparatus of claim 5 , wherein the outer region of the rotatable stage comprises a holding mechanism configured to hold a wafer frame over which the substrate is mounted. 9. The spin-coating apparatus of claim 8 , wherein the outer region of the rotatable stage is flat. 10. The spin-coating apparatus of claim 8 , wherein the inner region, downward sloping region, and outer region of the rotatable stage are one piece.

Assignees

Inventors

Classifications

  • used during dicing or grinding · CPC title

  • Apparatus for applying a liquid, a resin, an ink or the like · CPC title

  • using temporarily an auxiliary support · CPC title

  • Cutting or separating of wafers, substrates or parts of devices · CPC title

  • characterised by the process involved to create the mask, e.g. lift-off masks or sidewalls or to modify the mask · CPC title

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Frequently asked questions

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What does patent US9768014B2 cover?
Improved wafer coating processes, apparatuses, and systems are described. In one embodiment, an improved spin-coating process and system is used to form a mask for dicing a semiconductor wafer with a laser plasma dicing process. In one embodiment, a spin-coating apparatus for forming a film over a semiconductor wafer includes a rotatable stage configured to support the semiconductor wafer. The …
Who is the assignee on this patent?
Applied Materials Inc
What technology area does this patent fall under?
Primary CPC classification H10P14/6342. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Sep 19 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).