Optical reflecting device
US-2015116803-A1 · Apr 30, 2015 · US
US9766450B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9766450-B2 |
| Application number | US-201514872682-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 1, 2015 |
| Priority date | Oct 15, 2014 |
| Publication date | Sep 19, 2017 |
| Grant date | Sep 19, 2017 |
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A light deflector is provided including a mirror unit having a light reflection plane, a movable frame to support the mirror unit, a support frame disposed to surround the movable frame, a pair of serpentine beams each disposed between the movable frame and the support frame on both sides of the movable frame to form a turning shape, each of the serpentine beams having one end attached to the support frame, and another end attached to the movable frame, and a vibration damper provided on a portion that moves due to deformation of the serpentine beams caused by application of voltage being transferred.
Opening claim text (preview).
What is claimed is: 1. A light deflector comprising: a mirror unit having a light reflection plane; a movable frame to support the mirror unit; a support frame disposed to surround the movable frame; and a pair of serpentine beams each disposed between the movable frame and the support frame on both sides of the movable frame to form a turning shape, each of the serpentine beams having one end attached to the support frame, and another end attached to a connecting part between one of the serpentine beams and the movable frame; wherein the pair of serpentine beams, the connecting part, and the movable frame include at least a first silicon layer that is integrally formed, wherein the serpentine beams includes a piezoelectric element on the first silicon layer, wherein the connecting part includes a second silicon layer as a vibration damper on a side opposite the piezoelectric element on the first silicon layer of the serpentine beams, and the second silicon layer reduces vibration caused by the piezoelectric element through an oxidized silicon layer. 2. The light deflector according to claim 1 , wherein the vibration damper is disposed at a connecting part of the serpentine beams and the movable frame. 3. The light deflector according to claim 2 , wherein the vibration damper is formed by increasing a thickness of the second silicon layer on a side opposite to the piezoelectric member. 4. The light deflector according to claim 1 , wherein the vibration damper is formed by a same component as that of the movable frame and the serpentine beams. 5. The light deflector according to claim 1 , wherein the movable frame and the serpentine beams have a pair of connecting parts therebetween, and the pair of connecting parts are arranged in a point symmetry around the mirror unit. 6. The light deflector according to claim 1 , wherein the movable frame internally includes a pair of elastic supporting members each having one end attached to the mirror unit and configured to support the mirror unit in an oscillatable manner in a direction perpendicular to a direction of the oscillation caused by the deformation of the serpentine beams, and a pair of drive bars each having one end attached to another end of corresponding one of the elastic supporting members, the pair of drive bars being configured to deform by application of voltage. 7. A two-dimensional image display apparatus comprising: a light source configured to emit a plurality of laser beams of different wavelengths; an optical-path combiner configured to combine optical paths of the laser beams into one optical path; and a two-dimensional scanner configured to scan the combined laser beams to draw an image, wherein the two-dimensional scanner is the light deflector according to claim 1 , wherein the movable frame internally includes a pair of elastic supporting members each having one end attached to the mirror unit and configured to support the mirror unit in an oscillatable manner in a direction perpendicular to a direction of the oscillation caused by the deformation of the serpentine beams, and a pair of drive bars each having one end attached to another end of corresponding one of the elastic supporting members, the pair of drive bars being configured to deform by application of voltage, and the light deflector performs optical deflection and projects an image onto a projection plane. 8. An optical scanner comprising: a light source configured to emit light; a light deflector configured to deflect light beam emitted from the light source; and an imaging optical system configured to form an image of deflected light beam in a state of spot on a to-be-scanned surface, wherein the light deflector is the light deflector according to claim 1 . 9. An image forming apparatus comprising: an image bearer; an optical scanner configured to form an electrostatic latent image on the image bearer according to image data; a developing device configured to visualize the electrostatic latent image to form a visible image; and a transfer unit configured to transfer the visible image to a transfer medium, wherein the optical scanner includes a light source configured to emit light, a light deflector configured to deflect light beam emitted from the light source, and an imaging optical system configured to form an image of deflected light beam in a state of spot on a to-be-scanned surface, wherein the light deflector is the light deflector according to claim 1 . 10. The light deflector according to claim 1 , wherein the vibration damper extends from the one of the connecting parts towards the movable frame and terminates at an edge of the movable frame. 11. The light deflector according to claim 1 , wherein a vibration damper has point symmetry with a vibration damper across a mirror center, and one end of the serpentine beams has point symmetry with another end of the serpentine beams across the mirror center. 12. The light deflector according to claim 1 , wherein: the piezoelectric element is indirectly on the first silicon layer. 13. The light deflector according to claim 12 , further comprising: an electrode between the between the piezoelectric element and the first silicon layer.
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