Optical position measuring instrument

Patent metadata

Field	Value
Publication number	US-9766098-B2
Application number	US-201113068659-A
Country	US
Kind code	B2
Filing date	May 16, 2011
Priority date	May 21, 2010
Publication date	Sep 19, 2017
Grant date	Sep 19, 2017

Abstract

An optical position measuring instrument including a scale and a scanning unit, wherein the scanning unit and the scale are movable with respect to one another. The scanning unit includes a detector unit, and a reflector unit that has a first and second wave front correctors and a beam direction inverter. The reflector unit is disposed so that beams first pass through the scale and the first wave front corrector, then a back-reflection of partial beams is effected in a direction of the scale, and the partial beams then pass through the scale and the second wave front corrector before the partial beams then arrive at the detector unit, wherein it is ensured that wave front deformations of the partial beams are converted into wave front deformations that compensate for resultant wave front deformations of the partial beams upon a second diffraction at the scale.

First claim

We claim:

1. An optical position measuring instrument for detecting a relative position of a scanning unit and a scale, said optical position measuring instrument comprising:
a scale; and
a scanning unit, wherein said scanning unit and said scale are movable with respect to one another along a curved measurement direction and wherein said scanning unit comprises:
a detector unit; and
a reflector unit comprising;
a first wave front corrector;
a beam direction inverter; and
a second wave front corrector, wherein said reflector unit is disposed and/or embodied in said scanning unit so that partial beams first pass through a first combination of said scale and said first wave front corrector, then via said beam direction inverter, said partial beams are reflected back towards said scale, and said partial beams then pass through a second combination of said scale and said second wave front corrector before said partial beams then arrive at said detector unit, wherein said reflector unit has a structure so that it is ensured that wave front deformations of said partial beams, which result via a first diffraction at said scale, are converted into wave front deformations that compensate for resultant wave front deformations of said partial beams upon a second diffraction at said scale.

2. The optical position measuring instrument as defined by claim 1 , wherein:
via said first wave front corrector, a conversion of wave fronts exiting from said first combination of said scale and said first wave front corrector so that a first collimated partial beam with planar wave fronts is formed; and
via said second wave front corrector, a conversion of wave fronts exiting from said second combination of said scale and said second wave front corrector so that a second collimated partial beam with planar wave fronts is formed so that wave fronts of said second collimated partial beam that come to be superimposed are, after said second diffraction at said scale, identical at a superposition location.

3. The optical position measuring instrument as defined by claim 2 , wherein said first combination of said scale and said first wave front corrector is arranged along a direction of beam propagation in the following order: said scale followed by said first wave front corrector and wherein said second combination of said scale and said second wave front corrector is arranged along said direction of beam propagation in the following order: said second wave front corrector followed by said scale.

4. The optical position measuring instrument as defined by claim 2 , wherein said first combination of said scale and said first wave front corrector is arranged along a direction of beam propagation in the following order: said first wave front corrector followed by said scale and wherein said second combination of said scale and said second wave front corrector is arranged along said direction of beam propagation in the following order: said scale followed by said second wave front corrector.

5. The optical position measuring instrument as defined by claim 1 , wherein said first combination of said scale and said first wave front corrector is arranged along a direction of beam propagation in the following order: said scale followed by said first wave front corrector and wherein said second combination of said scale and said second wave front corrector is arranged along said direction of beam propagation in the following order: said second wave front corrector followed by said scale.

6. The optical position measuring instrument as defined by claim 1 , wherein said first combination of said scale and said first wave front corrector is arranged along a direction of beam propagation in the following order: said first wave front corrector followed by said scale and wherein said second combination of said scale and said second wave front corrector is arranged along said direction of beam propagation in the following order: said scale followed by said second wave front corrector.

7. The optical position measuring instrument as defined by claim 1 , wherein said beam direction inverter is embodied as a triple mirror or as a triple prism.

8. The optical position measuring instrument as defined by claim 7 , wherein said first wave front corrector and said second wave front corrector are embodied as diffractive optical elements.

9. The optical position measuring instrument as defined by claim 8 , wherein said first wave front corrector and said second wave front corrector are each embodied as diffractive combination elements in a form of scanning gratings, which moreover have at least one of the following additional optical functionalities on said partial beams striking them:
an optical deflection effect;
an optical splitting or uniting effect;
an optical focusing effect on the reflector mirror.

10. The optical position measuring instrument as defined by claim 8 , wherein said reflector mirror and said diffractive optical elements are disposed on opposite sides of a transparent scanning plate.

11. The optical position measuring instrument as defined by claim 1 , wherein said beam direction inverter is embodied as a combination of a lens and a reflector mirror.

12. The optical position measuring instrument as defined by claim 11 , wherein said first wave front corrector and said second wave front corrector are refractive optical elements.

13. The optical position measuring instrument as defined by claim 11 , wherein said lens of said beam direction inverter is embodied as a refractive optical element.

14. The optical position measuring instrument as defined by claim 13 , wherein said first wave front corrector and said second wave front corrector are refractive optical elements.

15. The optical position measuring instrument as defined by claim 11 , wherein said first wave front corrector and said second wave front corrector are embodied as diffractive optical elements.

16. The optical position measuring instrument as defined by claim 15 , wherein said lens of said beam direction inverter is embodied as a diffractive optical element.

17. The optical position measuring instrument as defined by claim 16 , wherein said reflector mirror and said diffractive optical elements are disposed on opposite sides of a transparent scanning plate.

18. The optical position measuring instrument as defined by claim 15 , wherein said first wave front corrector and said second wave front corrector are each embodied as diffractive combination elements in a form of scanning gratings, which moreover have at least one of the following additional optical functionalities on the partial beams striking them:
an optical deflection effect;
an optical splitting or uniting effect;
an optical focusing effect on the reflector mirror.

19. The optical position measuring instrument as defined by claim 15 , wherein said reflector mirror and said diffractive optical elements are disposed on opposite sides of a transparent scanning plate.

20. The optical position measuring instrument as defined by claim 1 , wherein said scale is embodied as a radial graduation on a graduated disk and is disposed concentrically around an axis of rotation of said graduated disk.

21. The optical position measuring instrument as defined by claim 1 , wherein said scale is embodied as a drum graduation on an outer circumference of a rotating graduation drum, and an axis of rotation of said drum graduation coincides with a longitudinal axis of said rotating graduation drum.

22.

Assignees

• Holzapfel Wolfgang
• Hermann Michael
• Sändig Karsten
• Heidenhain Gmbh Dr Johannes

Inventors

• Holzapfel Wolfgang
• Hermann Michael
• Sändig Karsten

Classifications

• G01D5/38

  by diffraction gratings · CPC title

• G01D5/3473

  Circular or rotary encoders · CPC title

• G01D5/347 Primary

  using displacement encoding scales · CPC title