Material damage system and method for determining same

Patent metadata

Field	Value
Publication number	US-9766053-B1
Application number	US-201113301249-A
Country	US
Kind code	B1
Filing date	Nov 21, 2011
Priority date	Nov 21, 2011
Publication date	Sep 19, 2017
Grant date	Sep 19, 2017

Abstract

A system and method for determining a change in a thickness and temperature of a surface of a material are disclosed herein. The system and the method are usable in a thermal protection system of a space vehicle, such as an aeroshell of a space vehicle. The system and method may incorporate micro electric sensors arranged in a ladder network and capacitor strip sensors. Corrosion or ablation causes a change in an electrical property of the sensors. An amount of or rate of the corrosion or the ablation and a temperature of the material is determined based on the change of the electrical property of the sensors.

First claim

The invention claimed is:

1. A system comprising:
a material susceptible to corrosion or ablation and having a thickness defined between a first end and a second end;
a first sensor and a second sensor on the material and extending along the thickness adjacent the first end and toward the second end, the first sensor having an electrical component that changes an electrical property of the sensor as temperature of the material changes, and wherein the second sensor has an electrical property that is constant with respect to changes in temperature of the material,
an electrical circuit coupled to the first sensor and the second sensor to determine the change in the electrical property of each of the first sensor and the second sensor; and
a processor determining a thickness and a temperature of the material based on the change of the electrical property of the first sensor and the second sensor; wherein the second sensor has a capacitance configured to change as a length of the second sensor changes.

2. The system of claim 1 wherein the first sensor comprises at least one resistor ladder network sensor and further wherein the second sensor comprises at least one capacitor strip sensor.

3. The system of claim 1 wherein the first sensor and the second sensor are arranged in ladder networks.

4. The system of claim 3 further comprising a third sensor having a capacitor strip for measuring the thickness of the material.

5. The system of claim 4 wherein the processor determines the thickness of the material from the electrical property of the second sensor and the third sensor, and further wherein the processor compares the thickness of the material as computed from changes in the electrical property of the second sensor with the thickness of the material as computed from changes in the electrical property of the third sensor.

6. The system of claim 1 wherein the ablation or the corrosion causes a first portion of the first sensor to electrically separate from a second portion of the first sensor.

7. The system of claim 1 wherein the change in the electrical property of the first sensor is an increased resistance and further wherein a change in the second sensor is a decreased capacitance.

8. The system of claim 1 wherein the first sensor has a plurality of resistors and further wherein at least one of the plurality of resistors having a non-zero temperature coefficient such that resistance changes with temperature.

9. The system of claim 1 wherein the processor determines the temperature of the material based on the electrical property of the first sensor and further wherein the processor determines the thickness of the material based on the second sensor.

10. The system of claim 1 further comprising a thermoelectric device configured to scavenge energy from the material and power the first sensor or the second sensor.

11. A method comprising the steps of:
positioning a first micro electric sensor and a second micro electric sensor within a susceptible material;
applying a current or voltage to the first micro electric sensor and the second micro electric sensor;
exposing the susceptible material to a substance causing a change in a temperature and thickness of the susceptible material;
determining the temperature of the susceptible material from an electrical property of the first micro electric sensor; and
determining the thickness of the susceptible material from an electrical property of the second micro electric sensor, wherein the electrical property of the first micro electric sensor changes more with temperature than the second micro electric sensor; wherein the second micro electric sensor has a capacitance configured to change as a length of the second micro electric sensor changes.

12. The method of claim 11 further comprising positioning a third micro electric sensor within the susceptible material adjacent the first micro electric sensor and the second micro electric sensor, wherein the step of determining the thickness of the susceptible material is based on analyzing the electrical property of the second micro electric sensor and the third micro electric sensor.

13. The method of claim 12 wherein the step of determining the temperature of the susceptible material comprises comparing the electrical property of the first micro electric sensor and the third micro electric sensor.

14. The method of claim 12 further comprising generating a tomographic image of a thickness of the material based on changes of the electrical property of the first sensor, the second sensor and the third sensor.

15. The method of claim 11 further comprising electrically separating or destroying a portion of the first sensor, the second sensor or the third sensor as a result of the change in the thickness of the susceptible material.

16. The method of claim 11 wherein the electrical property of the first sensor is resistance and the electrical property of the second sensor is capacitance.

17. A method comprising the steps of:
embedding a plurality of sensors within a material, the plurality of sensors comprising at least a first ladder sensor, a second ladder sensor, and a capacitor strip, the second ladder sensor having more rungs than the first ladder sensor, wherein the second ladder sensor having electrical components that are less temperature sensitive than electrical components of the first ladder sensor;
applying a current or voltage to each of the plurality of sensors;
exposing the material to a change in temperature causing a change in an electrical property of at least the second ladder sensor;
ablating a portion of the material to change an electrical property of at least the first ladder sensor and the capacitor strip;
determining a temperature of the material based on the change in the electrical property of the first ladder sensor and the second ladder sensor; and
determining a thickness of the material based on the change of the electrical property of the capacitor strip and the change of the electrical property of the second ladder sensor; wherein the second ladder sensor has a capacitance configured to change as a length of the second ladder sensor changes.

18. The method of claim 17 wherein the first ladder sensor and the second ladder sensor are micro resistance ladder sensors and a portion of the change of the electrical property of the first ladder sensor and the second ladder sensor is based on a change in resistance.

19. The method of claim 17 wherein the material is a braking material of a vehicle, a pipe conduit, or a thermal protection system of a space vehicle.

Assignees

• Okojie Robert
• Nasa

Inventors

• Okojie Robert

Classifications

• G01B7/08

  using capacitive means · CPC title

• G01B7/06

  for measuring thickness {(measuring during the manufacture of coatings C23C14/54)} · CPC title

• G01N3/56

  Investigating resistance to wear or abrasion · CPC title

• G01N27/20

  Investigating the presence of flaws · CPC title

• G01N17/04 Primary

  Corrosion probes · CPC title