Semiconductor device

US9761681B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9761681-B2
Application numberUS-201515303597-A
CountryUS
Kind codeB2
Filing dateMar 27, 2015
Priority dateMay 26, 2014
Publication dateSep 12, 2017
Grant dateSep 12, 2017

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

The semiconductor device includes a gate insulation film covering inner surfaces of the first trench and the second trench, and an inner surface of an intersection, and a gate electrode provided in the first trench and the second trench, and facing the semiconductor substrate via the gate insulation film. Further, the semiconductor device includes an emitter region of an n-type provided in the semiconductor substrate, exposed on the front surface of the semiconductor substrate, being in contact with the gate insulation film in the second trench, and not being in contact with the gate insulation film provided on the inner surface of the intersection of the first trench and the second trench.

First claim

Opening claim text (preview).

The invention claimed is: 1. A semiconductor device comprising: a first trench provided in a front surface of a semiconductor substrate; a second trench provided in the front surface, extending in a direction different from a direction of the first trench, and intersecting the first trench in a plan view of the front surface, the second trench extending in the y direction in the plan view and having spaced-part edges extending the y-direction and spaced apart from each other in the x direction in the plan view; a gate insulation film covering inner surfaces of the first trench and the second trench, and an inner surface of an intersection of the first trench and the second trench, the gate insulating film comprising first and second portions covering the spaced apart edges of the second trench, extending in the y direction in plan view, and spaced apart in the x direction in the plan view; a gate electrode provided in the first trench and the second trench, and facing the semiconductor substrate via the gate insulation film; a first semiconductor region of a first conductive type provided in the semiconductor substrate, exposed on the front surface, being in contact with the gate insulation film in the second trench, and not being in contact with the gate insulation film covering the inner surface of the intersection of the first trench and the second trench; a second semiconductor region of a second conductive type provided in the semiconductor substrate, and being in contact with the gate insulation film in the second trench on a deeper side than the first semiconductor region; and a third semiconductor region of a first conductive type provided in the semiconductor substrate, being in contact with the gate insulation film in the second trench on a deeper side than the second semiconductor region, and separated from the first semiconductor region by the second semiconductor region, the first semiconductor region extending in the x direction from one of the first and second portions of the gate insulating film in the plan view, and the first semiconductor region not extending in the x direction from the other of the first and second portions of the gate insulating film in the plan view. 2. The semiconductor device according to claim 1 , comprising: a plurality of the first trenches and a plurality of the second trenches, wherein the plurality of the first trenches and the plurality of the second trenches are arranged in a grid-like pattern in the plan view of the front surface, and the first semiconductor region is not in contact with the gate insulation film in the first trenches. 3. The semiconductor device according to claim 2 , wherein grids formed by the first trenches and the second trenches are arranged in a staggered pattern in the plan view of the front surface.

Assignees

Inventors

Classifications

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US9761681B2 cover?
The semiconductor device includes a gate insulation film covering inner surfaces of the first trench and the second trench, and an inner surface of an intersection, and a gate electrode provided in the first trench and the second trench, and facing the semiconductor substrate via the gate insulation film. Further, the semiconductor device includes an emitter region of an n-type provided in the …
Who is the assignee on this patent?
Toyota Motor Co Ltd
What technology area does this patent fall under?
Primary CPC classification H01L29/4236. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Sep 12 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).