Methods and systems for integrated plot training

Patent metadata

Field	Value
Publication number	US-9761027-B2
Application number	US-201615298109-A
Country	US
Kind code	B2
Filing date	Oct 19, 2016
Priority date	Dec 7, 2012
Publication date	Sep 12, 2017
Grant date	Sep 12, 2017

Abstract

A method for correlating data collected from at least one sensor of machinery with a malfunction of the machinery includes storing, in a memory, one or more reference data sets where each reference data set is associated with a malfunction of the machinery. The method also includes receiving measurement data based on measurement information from the at least one sensor and displaying, with a display device, a first plot representing a reference data set of the one or more reference data sets where the first plot has a plot type associated with the reference data set. The method also includes displaying, with the display device, a second plot representing the measurement data where the second plot is plotted using the first plot based at least in part with the association of the plot type with the reference data set. Furthermore, the method includes displaying, with the display device, an explanation of an appearance of the second plot.

First claim

What is claimed is:

1. A computing device-implemented method for correlating data collected from at least one sensor of machinery with a malfunction of the machinery, the method comprising:
storing, in a memory, one or more reference data sets, wherein each reference data set is associated with a malfunction of the machinery;
receiving measurement data based on measurement information from the at least one sensor;
displaying, with a display device, a first plot representing a reference data set of the one or more reference data sets, wherein the first plot has a plot type associated with the reference data set;
displaying, with the display device, a second plot representing the measurement data, wherein the second plot is plotted using the first plot based at least in part with the association of the plot type with the reference data set;
displaying, with the display device, an explanation of an appearance of the second plot; and
displaying, with the display device, a description of the malfunction associated with the measurement data represented by the second plot, wherein the description comprises an indication of a level of similarity between the first plot and the second plot, wherein the indication comprises at least one of a color on or around the first plot or the second plot and a textual indication of the level of similarity.

2. The method of claim 1 , wherein displaying the second plot comprises overlaying the second plot over the first plot.

3. The method of claim 1 comprising curve fitting the first and second plots to determine the level of similarity.

4. The method of claim 3 , wherein curve fitting comprises determining a sum of least squares and examining residuals.

5. The method of claim 1 , wherein each reference data set of the one or more reference data sets corresponds to a different malfunction of the machinery.

6. The method of claim 1 comprising arranging the one or more reference data sets in a sequence.

7. The method of claim 6 , wherein arranging the one or more reference data sets in the sequence comprises sorting the one or more reference data sets in a decreasing likelihood of occurrence for the machinery.

8. The method of claim 6 , wherein arranging the one or more reference data sets in the sequence comprises sorting the one or more reference data sets in a decreasing order based on a level of similarity between respective plots corresponding the one or more reference data sets and the measurement data.

9. A computing device for correlating data collected from at least one sensor of a machinery with a condition of the machinery, the computing device comprising:
a processor;
a display device coupled to the processor; and
a memory coupled to the processor, wherein the memory contains processor-executable instructions configured to cause the processor to:
store, in the memory, one or more reference data sets, wherein each reference data set is associated with a condition of the machinery;
receive measurement data based on measurement information from the at least one sensor;
display, with a display device, a reference plot representing a reference data set of the one or more reference data sets, wherein the first plot has a plot type associated with the reference data set;
display, with the display device, a measurement plot representing the measurement data based at least in part with the association of the plot type with the reference data set;
determine a level of similarity between the first plot and the second plot using curve fitting; and
displaying, with the display device, a description of a malfunction associated with the measurement data represented by the second plot, wherein the description comprises an indication of the level of similarity.

10. The computing device of claim 9 , wherein each of the one or more reference data sets corresponds to a different condition of the machinery.

11. The computing device of claim 9 , comprising an input device coupled to the processor, and the memory contains processor-executable instructions configured to cause the processor to:
receive an input with the input device; and
select the reference data set of the one or more reference data sets based on the input.

12. The computing device of claim 9 , wherein the curve fitting comprises determining a sum of least squares and examining residuals.

13. A method comprising:
storing, in a memory, two or more reference data sets, wherein each reference data set is associated with a condition of the machinery;
receiving measurement data based on measurement information from at least one sensor of the machinery;
displaying, with a display device, a first plot representing a first reference data set of the two or more reference data sets, wherein the first plot has a first plot type associated with a first condition of the machinery;
displaying, with the display device, a second plot representing the measurement data, wherein the second plot is plotted using the first plot type;
displaying, with the display device, a third plot representing a second reference data set of the two or more reference data sets, wherein the third plot has a second plot type associated with a second condition of the machinery; and
changing the display of the measurement data from the first plot type to the second plot type based at least in part on the display of the third plot.

14. The system of claim 13 , wherein the first condition of the machinery comprises a first malfunction of the machinery and the second condition of the machinery comprises a second malfunction of the machinery.

15. The method of claim 13 comprising:
determining a degree of similarity between the first plot and the second plot; and
displaying an indication of the degree of similarity.

Assignees

• Gen Electric

Inventors

• Williams Scott Terrell
• Robertson David Michael

Classifications

• G06T11/26 Primary

  Drawing of charts or graphs · CPC title

• G05B23/0232

  based on qualitative trend analysis, e.g. system evolution · CPC title

• G06T7/97

  Determining parameters from multiple pictures (depth or shape recovery from multiple images G06T7/55; stereo camera calibration G06T7/85) · CPC title

• G07C3/14

  Quality control systems · CPC title

• G06T11/206 Primary

  Physics · mapped topic