Circuit board formation using organic substrates

US9760002B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9760002-B2
Application numberUS-201514950673-A
CountryUS
Kind codeB2
Filing dateNov 24, 2015
Priority dateAug 19, 2014
Publication dateSep 12, 2017
Grant dateSep 12, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method of forming a circuit board includes forming a conductive pattern on a substrate; forming a first negative resist on the substrate after formation of the conductive pattern; partially exposing the first negative resist on the surface of the conductive pattern to form a first via exposure portion; forming a second negative resist on the substrate after formation of the first via exposure portion; partially exposing the second negative resist on the first via exposure portion to form a second via exposure portion larger than the first via exposure portion; developing the first negative resist and the second negative resist after formation of the second via exposure portion to form a via opening reaching the conductive pattern; and filling the via opening with a conductive material.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method of forming a circuit board, the method comprising: forming a conductive pattern on a substrate; forming a first negative resist on the substrate after formation of the conductive pattern; partially exposing the first negative resist on the surface of the conductive pattern to form a first via exposure portion; forming a second negative resist on the substrate after formation of the first via exposure portion; partially exposing the second negative resist on the first via exposure portion to form a second via exposure portion larger than the first via exposure portion using a photomask, wherein the first via exposure portion comprises a first sub-portion that overlaps a masked portion of the photomask and the second via exposure portion and a second sub-portion that overlaps an un-masked portion of the photomask and does not overlap the second via exposure portion; wherein partially exposing the second negative resist causes the second via exposure portion to be unexposed, the first sub-portion of the first via exposure portion to be unexposed, and the second sub-portion of the first via exposure portion to be exposed; developing the first negative resist and the second negative resist after formation of the second via exposure portion to form a via opening reaching the conductive pattern; and filling the via opening with a conductive material. 2. The method of claim 1 , wherein; forming the second via exposure portion includes simultaneously partially exposing the second negative resist outside of the first via exposure portion to form a conductive wiring exposure portion; forming a via opening reaching the conductive pattern includes simultaneously forming a wiring opening in the second negative resist; and filling the opening with a conductive material includes simultaneously filling the wiring opening with the conductive material. 3. The method of claim 2 , wherein filling the opening with a conductive material includes: forming a seed layer on the surface of the substrate excluding the via opening and the wiring opening, and in the interior of the via opening and the interior of the wiring opening; forming a conductive layer on the seed layer using electroplating; and polishing the surface of the substrate to leave the conductive material only in the via opening and the wiring opening. 4. The method of claim 1 , wherein filling the opening with a conductive material includes: forming a seed layer on the surface of the substrate excluding the via opening and in the interior of the via opening; forming a conductive layer on the seed layer using electroplating; and polishing the surface of the substrate to leave the conductive material only in the via opening. 5. The method of claim 1 , wherein the first negative resist and the second negative resist are used as interlayer insulating layers in the circuit board. 6. The method of claim 1 , wherein forming the first via exposure portion includes direct exposure of the first negative resist using a laser. 7. The method of claim 1 , wherein the substrate is an organic substrate, and the circuit board comprises an interposer.

Assignees

Inventors

Classifications

  • Aligning added circuit layers or via connections relative to previous circuit layers · CPC title

  • Applying the circuit pattern before another process, e.g. before filling of vias with conductive paste, before making printed resistors · CPC title

  • Double layer of resist having the same pattern · CPC title

  • G03F7/0035Primary

    Multiple processes, e.g. applying a further resist layer on an already in a previously step, processed pattern or textured surface · CPC title

  • Blind vias, i.e. vias having one side closed · CPC title

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What does patent US9760002B2 cover?
A method of forming a circuit board includes forming a conductive pattern on a substrate; forming a first negative resist on the substrate after formation of the conductive pattern; partially exposing the first negative resist on the surface of the conductive pattern to form a first via exposure portion; forming a second negative resist on the substrate after formation of the first via exposure…
Who is the assignee on this patent?
IBM
What technology area does this patent fall under?
Primary CPC classification G03F7/0035. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Sep 12 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).