High throughput triangulation system

Patent metadata

Field	Value
Publication number	US-9759555-B2
Application number	US-201615158665-A
Country	US
Kind code	B2
Filing date	May 19, 2016
Priority date	Jul 9, 2015
Publication date	Sep 12, 2017
Grant date	Sep 12, 2017

Abstract

A system for measuring heights of multiple structures of an object, the system may include an illumination module that is configured to illuminate the object by a light strip that is spatially incoherent; multiple cameras; a collection module that is configured to collect light that is reflected from the object and to distribute the light to the multiple cameras; wherein the collection module has an elongated field of view that has a longitudinal axis that is parallel to the light strip; wherein the multiple cameras are configured to generate, during a height measurement process, detection signals indicative of heights of the multiple structures; a mechanical stage for introducing a movement, during the height measurement process, between the object and each one of the illumination module and the collection module; and a processor that is configured to process the detection signals to determine the heights of the multiple structures.

First claim

We claim:

1. A system for measuring heights of multiple structures of an object, said system comprising:
an illumination module that is configured to illuminate the multiple structures of the object by a light strip that is spatially incoherent;
multiple cameras;
a collection module that is configured to collect light that is reflected from the multiple structures of the object and to distribute the light to the multiple cameras;
wherein the collection module has an elongated field of view that has a longitudinal axis that is parallel to the light strip;
wherein the multiple cameras are configured to generate, based on the light that is reflected from the multiple structures of the object and during a height measurement process, detection signals indicative of heights of the multiple structures;
a mechanical stage for introducing a movement, during the height measurement process, between the object and each one of the illumination module and the collection module; and
a processor that is configured to process the detection signals to determine the heights of the multiple structures.

2. The system according to claim 1 wherein during the height measurement process, fields of view of different cameras of the multiple cameras cover the multiple structures of the object in an interlaced manner.

3. The system according to claim 2 wherein the fields of view of the different cameras of the multiple cameras partially overlap.

4. The system according to claim 1 wherein during the height measurement process, fields of view of different cameras of the multiple cameras cover the multiple structures of the object in a non-interlaced manner.

5. The system according to claim 1 wherein the system is configured to operate in an interlaced mode or in a non-interlaced mode;
wherein when operating in the interlaced mode fields of view of different cameras of the multiple cameras cover the multiple structures of an object in an interlaced manner;
and wherein when operating in the non-interlaced mode the fields of view of different cameras of the multiple cameras cover the multiple structures of an object in a non-interlaced manner.

6. The system according to claim 1 wherein during the height measurement process, different cameras of the multiple cameras have focal planes that differ from each other.

7. The system according to claim 1 wherein during the height measurement process, different cameras of the multiple cameras are configured in a different manner from each other to obtain information from areas of the object that are located at different heights.

8. The system according to claim 1 wherein the multiple structures are microscopic bumps.

9. The system according to claim 8 wherein when operating in an interlaced mode each microscopic bump of the microscopic bumps is imaged by up to a single camera of the multiple cameras.

10. The system according to claim 8 wherein when operating in non-interlaced mode each microscopic bump of the microscopic bumps is imaged by a plurality of cameras of the multiple cameras.

11. The system according to claim 1 wherein the illumination module is configured to illuminate the multiple structures of the object by the light strip and to prevent the creation of interference patterns.

12. A method for measuring heights of multiple structures of an object, the method comprises:
illuminating, by an illumination module of an inspection system, the multiple structures of the object by a light strip that is spatially incoherent;
collecting, by a collection module, light that is reflected from the multiple structures of the object and distributing the light to multiple cameras; wherein the collection module has an elongated field of view that has a longitudinal axis that is parallel to the light strip;
generating, by the multiple cameras, based on the light that is reflected from the multiple structures of the object and during a height measurement process, detection signals indicative of heights of the multiple structures;
introducing a movement, by a mechanical stage and during the height measurement process, between the object and each one of the illumination module and the collection module; and
processing, by a processor, the detection signals to determine the heights of the multiple structures.

13. The method according to claim 12 wherein during the height measurement process, fields of view of different cameras of the multiple cameras cover the multiple structures of object in an interlaced manner.

14. The method according to claim 13 wherein the fields of view of the different cameras of the multiple cameras partially overlap.

15. The method according to claim 13 further comprising reconstructing a continuous frame that spans over the fields of view of the different cameras of the multiple cameras.

16. The method according to claim 13 wherein at least one of the processor and a frame grabber of the system are configured to reconstruct a continuous a frame that spans over the fields of view of the different cameras of the multiple cameras.

17. The method according to claim 12 wherein during the height measurement process, fields of view of different cameras of the multiple cameras cover the multiple structures of the object in a non-interlaced manner.

18. The method according to claim 12 comprising configuring the inspection system to operate in an interlaced mode or in a non-interlaced mode;
wherein when operating in the interlaced mode fields of view of different cameras of the multiple cameras cover the multiple structures of an object in an interlaced manner; and
wherein when operating in the non-interlaced mode the fields of view of different cameras of the multiple cameras cover the multiple structures of an object in a non-interlaced manner.

19. The method according to claim 12 wherein during the height measurement process, different cameras of the multiple cameras have focal planes that differ from each other.

20. The method according to claim 12 wherein during the height measurement process, different cameras of the multiple cameras are configured in a different manner from each other to obtain information from areas of the object that are located at different heights.

21. The method according to claim 12 wherein the multiple structures are microscopic bumps.

22. The method according to claim 21 wherein when operating in an interlaced mode each microscopic bump of the microscopic bumps is imaged by up to a single camera of the multiple cameras.

23. The method according to claim 21 wherein when operating in non-interlaced mode each microscopic bump of the microscopic bumps is imaged by a plurality of cameras of the multiple cameras.

24. The method according to claim 12 wherein the illuminating, by the illumination module, the multiple structures of the object by the light strip comprises preventing a creation of interference patterns.

Assignees

• Camtek Ltd

Inventors

• Koren Shimon
• Gilad Tomer

Classifications

• G01B11/25

  by projecting a pattern, e.g. {one or more lines,} moiré fringes on the object (G01B11/255 takes precedence {; image analysis for depth or shape recovery G06T7/50}) · CPC title

• G01B11/2522 Primary

  the position of the object changing and being recorded · CPC title