Drop impact tester and method for drop impact test

Patent metadata

Field	Value
Publication number	US-9739697-B2
Application number	US-201514657197-A
Country	US
Kind code	B2
Filing date	Mar 13, 2015
Priority date	Aug 14, 2014
Publication date	Aug 22, 2017
Grant date	Aug 22, 2017

Abstract

A drop impact tester comprises a holder configured to hold a test piece and release the test piece such that the test piece drops in freefall; an impact surface disposed under the holder such that the test piece dropped from the holder hits the impact surface; and a drop angle measurement device configured to measure a drop angle which is a value correlated with an angle between a major surface of the dropped test piece and a reference plane. The tester further comprises an impact measurement device configured to move the impact surface from its first posing state to its second posing state to adjust an angle of the impact surface with respect to the reference plane based on the drop angle. The impact measurement device is configured to measure a drop impact applied to the impact surface by the dropped test piece or another test piece.

First claim

What is claimed is:

1. A drop impact tester comprising:
a holder configured to hold a test piece comprising a major surface and to release the test piece such that the test piece drops in freefall;
an impact surface disposed under the holder such that the test piece dropped from the holder hits the impact surface;
a drop angle measurement device configured to measure a drop angle which is a value correlated with an angle between the major surface of the dropped test piece and a reference plane; and
an impact measurement device configured to move the impact surface from its first posing state to its second posing state to adjust an angle of the impact surface with respect to the reference plane based on the drop angle, the impact measurement device being further configured to measure a drop impact impulse applied to the impact surface by the dropped test piece.

2. The drop impact tester of claim 1 , wherein the impact measurement device is configured to move the impact surface such that the angle of the impact surface with respect to the reference plane is substantially the same with the drop angle.

3. The drop impact tester of claim 1 , wherein the drop angle measurement device comprises at least one among a camera, an ultraviolet sensor, an infrared sensor, and a laser sensor.

4. The drop impact tester of claim 1 , wherein the holder comprises:
an upper plate over which the test piece is disposed; and
a rotating arm connected to the upper plate, and configured to rotate about a rotation axis to fix the test piece between the rotating arm and the upper plate or drop the test piece in freefall.

5. The drop impact tester of claim 4 , wherein the holder further comprises:
a second rotating arm spaced away from the rotating arm, and configured to rotate about a second rotation axis different from the rotation axis.

6. The drop impact tester of claim 1 , wherein the holder comprises:
an upper plate over which the test piece is disposed; and
a grabber comprising at least one jaw disposed over the upper plate and the at least one jaw being movable with respect to the upper plate, the grabber being configured to move the at least one jaw for holding and releasing the test piece.

7. The drop impact tester of claim, 6 , wherein the holder further comprises a contact sensor configured to detect contact between the at least one jaw and the test piece.

8. The drop impact tester of claim 6 , wherein the test piece comprises a first side surface, a second side facing away from the first side surface, a third side surface connecting the first side surface and the second side surface, a fourth side surface connecting the first side surface and the second side surface and facing away from the third side surface, the first, second, third and fourth sides defining a perimeter surface of the test piece, wherein the at least one movable jaw comprises:
a first jaw configured to move to contact the first side surface;
a second jaw configured to move to contact the second side surface;
a third jaw configured to move to contact the third side surface; and
a fourth jaw configured to move to contact the fourth side surface.

9. The drop impact tester of claim 6 , wherein the test piece comprises a first side surface, a second side facing away from the first side surface, a third side surface connecting the first side surface and the second side surface, a fourth side surface connecting the first side surface and the second side surface and facing away from the third side surface, the first, second, third and fourth sides defining a perimeter surface of the test piece, wherein the at least one jaw comprises:
a fifth jaw configured to move to contact the first side and the third side surface; and
a sixth jaw configured to move to contact the second side surface and the fourth side surface.

10. The drop impact tester of claim 1 , wherein the impact surface at its first posing state defines the reference plane, wherein the drop angle measurement device is configured to measure an angle of the major surface of the dropped test piece with respect to the impact surface at its first posing state to acquire the drop angle, wherein the impact measurement device is configured to move the impact surface to its second posing state in which an angle of the impact surface with respect to the major surface of the dropped test piece is substantially zero.

11. The drop impact tester of claim 1 , wherein the drop angle measurement device is integrated with the impact measurement device.

12. The drop impact tester of claim 1 , further comprising a controller configured to receive a signal indicative of the drop angle from the drop angle measurement device and provide a signal to change the angle of the impact surface with respect to the reference plane.

13. The drop impact tester of claim 10 , wherein the holder is configured to hold the test piece such that the major surface generally faces downward and contacts the impact surface after dropped, wherein the impact measurement device is configured to move the impact surface to its second posting state such that substantially the entire portion of the major surface simultaneously hits the impact surface.

14. A method of testing a drop impact of test pieces, the method comprising:
holding a test piece comprising a major surface;
releasing the test piece to drop in freefall toward an impact surface;
measuring a drop angle which is a value correlated with an angle between the major surface of the dropped test piece and a reference plane;
moving the impact surface to change an angle of the impact surface with respect to the reference plane based on the drop angle; and
measuring a drop impact impulse applied to the impact surface by the dropped test piece.

15. The method of claim 14 , wherein the impact surface is moved to such that the angle of the impact surface with respect to the reference plane is substantially the same with the drop angle.

16. The method of claim 14 , wherein the measuring of the drop angle is performed by at least one among a camera, an ultraviolet sensor, an infrared sensor and a laser sensor.

17. The method of claim 14 , wherein the impact surface at its first posing state defines the reference plane, wherein the measuring of the drop angle comprises measuring an angle of the major surface of the dropped test piece with respect to the impact surface at its first posing state to acquire the drop angle, wherein the moving of the impact surface comprises moving the impact surface to its second posing state in which an angle of the impact surface with respect to the major surface of the dropped piece is substantially zero.

18. The method of claim 14 , wherein all of the measuring of the drop angle, the adjusting the angle of the impact surface and the measuring of the drop impact impulse are performed in a single freefall drop of a test piece.

19. The method of claim. 14 , wherein the drop angle is measured before the test piece reaches the impact surface or at a time when the test piece reaches the impact surface.

20. The method of claim 14 , wherein the major surface generally faces downward and contacts the impact surface after dropped, wherein the impact surface is moved to its second posing state such that substantially the entire portion of the major surface simultaneously hits the impact surface.

Assignees

• Samsung Display Co Ltd

Inventors

• Lee Jong-Nam
• Hong Ikjun
• Kim Minsu

Classifications

• G01N3/303 Primary

  generated only by free-falling weight · CPC title