Cross-sectional profile measuring method

Patent metadata

Field	Value
Publication number	US-9739607-B2
Application number	US-201213480878-A
Country	US
Kind code	B2
Filing date	May 25, 2012
Priority date	May 27, 2011
Publication date	Aug 22, 2017
Grant date	Aug 22, 2017

Abstract

A cross-sectional profile measuring method of measuring cross-sectional profiles of an object at plural measurement sections of the object with a contact probe, includes: circularly moving the probe along a route around a circumference of the object at one of the measurement sections, a distance of the moving being longer than a measurement range corresponding to the circumference of the object by a predetermined overlapping range consisting of an acceleration range and a deceleration range; and moving the probe to next one of the measurement sections through a transfer range in a movement direction oblique to a continuous direction in which the cross-sectional profiles are adjacent to one another to offset a distance corresponding to the overlapping range.

First claim

What is claimed is:

1. A cross-sectional profile measuring method of measuring cross-sectional profiles of an object at plural measurement sections of the object with a contact probe, the method comprising:
circularly moving the probe by passing through a first start position of a first measurement section along a route around a circumference of the object to return to the first start position, a distance of the moving being longer than the circumference of the object by a predetermined overlapping range and measuring a first cross-sectional profile of the first measurement section;
circularly moving the probe by passing through a second start position of a second measurement section along a route around a circumference of the object to return to the second start position, a distance of the moving being longer than the circumference of the object by the overlapping range and measuring a second cross-sectional profile of the second measurement section; and
when the probe is shifted from the first measurement section to the second measurement section, moving the probe to the second measurement section in a movement direction opposite to the moving direction of the probe at the first measurement section, as viewed in the first cross-sectional profile, and oblique to a direction in which the first and second cross-sectional profiles are adjacent to one another to offset a distance corresponding to the overlapping range.

2. A cross-sectional profile measuring method of measuring cross-sectional profiles of an object at plural measurement sections of the object with a contact probe, the method comprising:
circularly moving the probe from a first measurement-start point of a first measurement section along a route around a circumference of the object to a first measurement-end point, correcting the first measurement-start point and the first measurement-end point so that a first cross-sectional profile of the first measurement section is provided in a closed loop, and measuring the first cross-sectional profile;
circularly moving the probe from a second measurement-start point of a second measurement section along a route around a circumference of the object to a second measurement-end point, correcting the second measurement-start point and the second measurement-end point so that a second cross-sectional profile of the second measurement section is provided in a closed loop, and measuring the second cross-sectional profile; and
when the probe is shifted from the first measurement section to the second measurement section, moving the probe to the second measurement section in a movement direction opposite to the moving direction of the probe at the first measurement section, as viewed in the first cross-sectional profile, and oblique to a direction in which the first and second cross-sectional profiles are adjacent to one another.

3. A cross-sectional profile measuring method of measuring cross-sectional profiles of an object at plural measurement sections of the object with a contact probe, the method comprising:
circularly moving the probe by passing through a first start point of a first measurement section along a route around a circumference of the object to return to the first start point, a distance of the moving being equal to a length of the circumference of the object plus a length of a predetermined overlapping range and measuring a first cross-sectional profile of the first measurement section;
circularly moving the probe by passing through a second start point of a second measurement section along a route around a circumference of the object to return to the second start point, a distance of the moving being equal to a length of the circumference of the object plus a length of the overlapping range and measuring a second cross-sectional profile of the second measurement section; and
when the probe is shifted from the first measurement section to the second measurement section, moving the probe to the second measurement section in a movement direction oblique to the route around the circumference of the object along which the probe is moved to measure the first cross-sectional profile, to offset a distance corresponding to the overlapping range, wherein
the circularly moving the probe by passing through the first start point of the first measurement section along the route around the circumference of the object to return to the first start point comprises circularly moving the probe by passing through successive ranges of a first acceleration range, a first measurement range, and a first deceleration range in this order, in the first measurement range the probe passing the first start point of the first measurement section along the route around the circumference of the object to return to the first start point, a distance of the first measurement range being equal to a length of the circumference of the object; and
the circularly moving the probe by passing through the second start point of the second measurement section along the route around the circumference of the object to return to the second start point comprises circularly moving the probe by passing through successive ranges of a second acceleration range, a second measurement range, and a second deceleration range in this order, in the second measurement range the probe passing the second start point of the second measurement section along the route around the circumference of the object to return to the second start point, a distance of the second measurement range being equal to a length of the circumference of the object.

4. A cross-sectional profile measuring method of measuring cross-sectional profiles of an object at plural measurement sections of the object with a contact probe, the method comprising:
circularly moving the probe by passing through a first start point of a first measurement section along a route around a circumference of the object to return to the first start point, a distance of the moving being equal to a length of the circumference of the object plus a length of a predetermined overlapping range and measuring a first cross-sectional profile of the first measurement section;
circularly moving the probe by passing through a second start point of a second measurement section along a route around a circumference of the object to return to the second start point, a distance of the moving being equal to a length of the circumference of the object plus a length of the overlapping range and measuring a second cross-sectional profile of the second measurement section; and
when the probe is shifted from the first measurement section to the second measurement section, moving the probe to the second measurement section in a movement direction oblique to the route around the circumference of the object along which the probe is moved to measure the first cross-sectional profile, to offset a distance corresponding to the overlapping range, wherein
before circularly moving the probe by passing the probe through the first start point of the first measurement section along the route around the circumference of the object and returning the probe to the first start point, the method further comprises allocating the probe at a first acceleration point and accelerating the probe toward the first start point of the first measurement section;
after circularly moving the probe by passing the probe through the first start point of the first measurement section along a route around a circumference of the object and returning the probe to the first start point, and measuring the first cross-sectional profile of the first measurement section, the method further comprises decelerating the probe toward a first deceleration point and stopping the probe at the first deceleration point;
before circularly moving the probe by passing the probe through the second start point of the s

Assignees

• Michiwaki Hirokazu
• Mitutoyo Corp

Inventors

• Michiwaki Hirokazu

Classifications

• G01B21/047 Primary

  Accessories, e.g. for positioning, for tool-setting, for measuring probes · CPC title