Precise current measurement with chopping technique for high power driver

Patent metadata

Field	Value
Publication number	US-9733276-B2
Application number	US-201514954530-A
Country	US
Kind code	B2
Filing date	Nov 30, 2015
Priority date	Nov 30, 2015
Publication date	Aug 15, 2017
Grant date	Aug 15, 2017

Abstract

A system for measuring high power currents, including: a low power transistor that is a scaled replica of a high power transistor of a high power driver; a regulator connected to the low power transistor, wherein the regulator is configured to regulate the current flowing through the low power transistor based upon a voltage sensed across the high power transistor and a chop signal; a current mirror with an input connected to the regulator and an output; a current detector having in input configured to receive the chop signal, wherein the current detector is connected to the output of the current mirror and wherein the current detector is configured to measure the current at the output of the current mirror to produce an estimate of the current flowing through the high power transistor.

First claim

What is claimed is:

1. A system for measuring high power currents, comprising:
a low power transistor that is a scaled replica of a high power transistor of a high power driver;
a first regulation transistor connected in series with the low power transistor;
a multiplexer including a first input configured to receive a voltage signal from the low power transistor, a second input configured to receive a voltage signal from the high power transistor, a third input configured to receive a chop signal, and two outputs, wherein the multiplexer is configured to output the first input voltage signal and the second input voltage signal on the two outputs based upon the chop signal;
a regulation amplifier with two inputs connected to the first and second outputs of the multiplexer and an output connected to a gate of the first regulation transistor;
a current mirror with an input connected to the first regulation transistor and an output;
a sensing resistor connected to the output of the current mirror;
a voltage detector configured to detect a voltage across the sensing resistor and configured to produce an output that indicates a current output by the high power transistor, wherein the voltage detector has an input configured to receive the chop signal.

2. The system of claim 1 , wherein the voltage detector includes an analog to digital converter (ADC) and an averaging circuit.

3. The system of claim 1 , wherein the voltage detector compensates its output based upon gain compensation value and offset compensation value.

4. The system of claim 1 , wherein the voltage detector is configured to average values of the voltage detected across the sensing resistor based upon the chop signal.

5. The system of claim 1 , further comprising a second low power transistor in parallel with a second low power resistor.

6. The system of claim 5 , wherein a gate control signal is selectively applied to a gate of the first low power transistor and a gate of the second low power transistor.

7. The system of claim 5 , wherein the first low power transistor and the second low power transistor are configured to have the same current handling characteristics.

8. The system of claim 5 , wherein the first low power transistor and the second low power transistor are configured to have the different current handling characteristics.

9. The system of claim 5 , wherein a gate control signal is applied to both a gate of the first low power transistor and a gate of the second low power transistor.

10. A system for measuring high power currents, comprising:
a low power transistor that is a scaled replica of a high power transistor of a high power driver;
a regulator connected to the low power transistor, wherein the regulator is configured to regulate a current flowing through the low power transistor based upon a voltage sensed across the high power transistor and a chop signal;
a current mirror with an input connected to the regulator and an output;
a current detector having an input configured to receive the chop signal, wherein the current detector is connected to the output of the current mirror and wherein the current detector is configured to measure a current at the output of the current mirror to produce an estimate of a current flowing through the high power transistor.

11. The system of claim 10 , wherein the estimate of the current flowing through the high power transistor is based upon a current relationship between the low power transistor and the high power transistor and a current ratio implemented by the current mirror.

12. The system of claim 11 , wherein the current detector comprises:
a sensing resistor connected to the output of the current mirror;
an analog to digital converter (ADC) connected to the sensing resistor configured to convert a voltage across the sensing resistor to output a digital value indicative of the current flowing through the high power transistor; and
an averaging system that averages an output of the ADC based upon the chop signal to produce the estimate of the current flowing through the high power transistor.

13. The system of claim 10 , wherein the current detector compensates its output based upon gain compensation value and offset compensation value.

14. The system of claim 10 , further comprising a second low power transistor in parallel with a second low power resistor.

15. The system of claim 14 , wherein a gate control signal is selectively applied to a gate of the first low power transistor and a gate of the second low power transistor.

16. The system of claim 14 , wherein the first low power transistor and the second low power transistor are configured to have the same current handling characteristics.

17. The system of claim 14 , wherein the first low power transistor and the second low power transistor are configured to have the different current handling characteristics.

18. The system of claim 14 , wherein a gate control signal is applied to both a gate of the first low power transistor and a gate of the second low power transistor.

19. The system of claim 10 , wherein the regulator further comprises:
a regulator transistor connected to the input of the current mirror and the low power transistor; and
a regulation amplifier having a first input and a second input configured to receive the voltage sensed across the high power transistor and a voltage sensed across the low power transistor and the regulation amplifier having an output connected to a gate of the regulation transistor.

20. The system of claim 19 , wherein the regulator further comprises a multiplexer including a first input configured to receive voltage signal sensed across the low power transistor, a second input configured to receive the voltage signal sensed across the high power transistor, a third input configured to receive the chop signal, and two outputs, wherein the multiplexer is configured to output the first input voltage signal and the second input voltage signal on the two outputs based upon the chop signal, wherein the two outputs are connected to the first input and the second input of the regulation amplifier.

Assignees

• Nxp Bv

Inventors

• Maschera Davide
• Effing Herman Johannes

Classifications

• H03F2200/462

  the current being sensed · CPC title

• G01R15/146 Primary

  Measuring arrangements for current not covered by other subgroups of G01R15/14, e.g. using current dividers, shunts, or measuring a voltage drop (if no voltage isolation is involved G01R1/203 or G01R19/0092) · CPC title

• H03F2200/456

  A scaled replica of a transistor being present in an amplifier · CPC title

• G01R19/003 Primary

  Measuring mean values of current or voltage during a given time interval · CPC title

• H03F3/2171

  with field-effect devices (H03F3/2173 - H03F3/2178 take precedence) · CPC title