One quarter wavelength transmission line based electrostatic discharge (ESD) protection for integrated circuits

US9728957B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9728957-B2
Application numberUS-201514703845-A
CountryUS
Kind codeB2
Filing dateMay 4, 2015
Priority dateMay 4, 2015
Publication dateAug 8, 2017
Grant dateAug 8, 2017

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

Device and a method of forming an integrated circuit (IC) that offers protection against ESD in RE applications is disclosed. The device includes a transmission line (TL) coupled to a signal pad. The TL is a short circuited stub that is configured as an ESD protection device and as a band pass filter in dependence of a center frequency of the band pass filter. The TL is configured to pass through a signal in response to a frequency of the signal being within an allowable range of frequencies of the band pass filter. The TL functioning as an ESD protection device is configured to shunt the signal in response to the frequency being outside the allowable range. The IC may include an array of control switches that are operable to change an electrical length L of the TL. The center frequency is tunable by controlling the electrical length L.

First claim

Opening claim text (preview).

What is claimed is: 1. A device comprising: a signal pad; and a transmission line (TL) coupled to the signal pad, wherein the TL is a short circuited stub having a variable electrical length L controlled by operation of an array of control switches, the TL being configured as an ESD protection device and as a band pass filter in dependence of a center frequency of the band pass filter. 2. The device of claim 1 , wherein the TL is configured to pass through a signal in response to a frequency of the signal being within an allowable range of frequencies of the band pass filter, wherein the ESD protection device is configured to shunt the signal in response to the frequency being outside the allowable range. 3. The device of claim 1 , wherein the TL is fabricated as coplanar waveguide on an integrated circuit chip. 4. The device of claim 2 , wherein the electrical length L is configured to be exactly equal to one quarter of a wavelength of the signal, the wavelength corresponding to an operating frequency of the TL. 5. The device of claim 2 , wherein the center frequency is tunable by controlling the electrical length L, the change in the electrical length L causing a corresponding change in the center frequency. 6. The device of claim 5 , wherein the array of control switches are disposed within a configurable distance of an end of the short circuited stub. 7. The device of claim 5 , wherein the array of control switches are operable to change the electrical length L to one of the electrical length L, L+ΔL, and L−ΔL. 8. The device of claim 2 , wherein a pair of control switches selected from the array of control switches are asserted to generate a new short circuited path for the signal, the new short circuit path changing the electrical length L. 9. The device of claim 1 , wherein the band pass filter is configured to operate in a RF band of frequencies. 10. A device comprising: a coplanar waveguide configured as a short circuited stub tuned to resonate at a center frequency, wherein the coplanar waveguide includes a top metal layer having a center signal trace equally separated from a pair of ground traces by a configurable gap, the pair of ground traces being disposed on either side of the center signal trace, a base metal layer to provide a shield to the coplanar waveguide, an end metal layer coupled to the center signal trace, the pair of ground traces and the base metal layer to provide the short circuited stub; and an array of control switches operable to dynamically vary an electrical length L of the coplanar waveguide, wherein a change in the electrical length L causes a corresponding change in the center frequency. 11. The device of claim 10 , wherein the coplanar waveguide is configured to have a rectangular cross section. 12. The device of claim 10 , wherein the coplanar waveguide is configured as an ESD protection device and as a band pass filter in dependence of the center frequency. 13. The device of claim 10 , wherein the array of control switches are operable to change the electrical length to one of the electrical length L, L+ΔL, and L−ΔL. 14. The device of claim 10 , wherein the configurable gap is approximately equal to 3 times a width of the center signal trace. 15. The device of claim 10 , wherein the coplanar waveguide and the array of control switches are fabricated on an integrated circuit chip. 16. A device comprising: a signal pad; a transmission line (TL) coupled to the signal pad, wherein the TL is configured as an ESD protection device and as a band pass filter in dependence of a center frequency of the band pass filter; and an array of control switches configured to vary an electrical length of the TL, wherein a change in the electrical length causes a corresponding change in the center frequency. 17. The device of claim 16 , wherein the TL is configured as a short circuited stub having the electrical length exactly equal to one quarter of a wavelength corresponding to the center frequency. 18. A method comprising: configuring a TL as a short circuited stub, the TL being configured as an ESD protection device and as a band pass filter in dependence of a center frequency of the band pass filter; and tuning the center frequency by changing an electrical length L of the TL, wherein the electrical length L is changed by controlling an array of control switches. 19. The method of claim 18 , wherein the controlling comprises asserting the array of control switches to generate a new short circuited path having a length different than the electrical length L. 20. The method of claim 18 , wherein TL is fabricated as coplanar waveguide on an integrated circuit chip.

Assignees

Inventors

Classifications

  • responsive to excess voltage appearing at terminals of integrated circuits · CPC title

  • H02H9/041Primary

    using a short-circuiting device · CPC title

  • H01P1/2039Primary

    Galvanic coupling between Input/Output · CPC title

  • Coplanar line filters · CPC title

  • H01P1/20Primary

    Frequency-selective devices, e.g. filters · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US9728957B2 cover?
Device and a method of forming an integrated circuit (IC) that offers protection against ESD in RE applications is disclosed. The device includes a transmission line (TL) coupled to a signal pad. The TL is a short circuited stub that is configured as an ESD protection device and as a band pass filter in dependence of a center frequency of the band pass filter. The TL is configured to pass throu…
Who is the assignee on this patent?
Globalfoundries Sg Pte Ltd
What technology area does this patent fall under?
Primary CPC classification H02H9/041. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Aug 08 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).