System and method of correcting a non-concentric ultrasonic iris inspection result

US9726641B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9726641-B2
Application numberUS-201414478412-A
CountryUS
Kind codeB2
Filing dateSep 5, 2014
Priority dateSep 5, 2014
Publication dateAug 8, 2017
Grant dateAug 8, 2017

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

Disclosed is an ultrasonic IRIS inspection system and a method of providing automatically compensated concentric B-scans by means of curve-fitting the unadjusted tube boundaries from inspection data, and from the curve fitted theoretical circle, using non-linear regression analysis to determine an adjusted center. The off-center distance between the adjust center and the misaligned center is then used to produce concentric inspection result by compensating the unadjusted inspection result with the off-center distance.

First claim

Opening claim text (preview).

What is claimed is: 1. A non-destructive inspection apparatus with a probe assembly suitable for inspecting a test object of a shape of a tube having an inner surface and an outer surface, the probe attached to a centering roller and configured to travel along a nominal reference center inside and along the tube to inspect the tube during an inspection session, the inspection apparatus comprising: a transducer residing within the probe assembly, configured to emit inspection energy to the tube and to receive corresponding echo signals; a data acquisition unit electronically coupled with the transducer, configured to trigger and guide the inspection energy and receive the echo signals; a data processing and display unit configured to process the echo signals to produce inspection data, firstly as an unadjusted inspection result, including an unadjusted inner boundary and/or an unadjusted outer boundary, the unadjusted inner and/or outer boundary is associated with a misaligned center, the data processing and display unit further comprising, an off-center calculator configured to curve-fit a theoretical inner and/or outer circle and an adjusted reference center based on the unadjusted inner and/or outer boundary, correspondingly, and the off-center calculator further configured to calculate an off-center distance between the misaligned center and the adjusted reference center, a center adjuster configured to produce an adjusted inspection result by compensating the unadjusted inspection result with the off-center distance. 2. The non-destructive inspection apparatus of claim 1 is an ultrasonic inspection apparatus and the inspection energy consists of ultrasonic pulses. 3. The non-destructive inspection apparatus of claim 2 , wherein the transducer is a single element ultrasonic transducer. 4. The non-destructive inspection apparatus of claim 2 , wherein the transducer is a multi-element or array element ultrasonic transducer. 5. The non-destructive inspection apparatus of claim 2 , wherein the inspection data and the associated inspection results are presented as B-scans. 6. The non-destructive inspection apparatus of claim 2 , wherein the inspection data and the associated inspection results are presented as C-scans. 7. The non-destructive inspection apparatus of claim 1 , wherein the nominal reference center is known to and entered by an operator to the apparatus prior to the inspection session. 8. The non-destructive inspection apparatus of claim 7 , wherein the nominal reference center is consistent with the center of the centering roller. 9. The non-destructive inspection apparatus of claim 1 , wherein the data processing and display unit further comprising an ID signal and angle generator and OD signal and angle generator for generating the unadjusted inner boundary and the unadjusted outer boundary, respectively. 10. The non-destructive inspection apparatus of claim 9 , wherein the off-center calculator further including an internal filter, an external filter, which filters out inspection data outside a predetermined threshold of an inner nominal circle or outer nominal circle, respectively. 11. The non-destructive inspection apparatus of claim 9 , wherein the off-center calculator further comprising an internal calculator and an external calculator, each configured to conduct curve fitting to produce a theoretical inner circle and a theoretical outer circle, based on the unadjusted inner boundary and the unadjusted outer boundary, correspondingly. 12. The non-destructive inspection apparatus of claim 11 , wherein the curve fitting is conducted by defining the inner or outer distance R (φ j ;r 0 ,φ 0 )=√{square root over ( r 2 (φ j )+ r 0 2 −2 r (φ j )* r 0 *cos(φ j −φ 0 ))} as from an assumed reference center ( 303 a ( j )) to the J boundary sample positions labelled j=1 . . . J, wherein R(φ j ;r 0 ,φ 0 ) is the radial position of the part boundary relative to assumed reference center 303 a ( j ), φ j is the angle of the j th boundary position relative to misaligned data center 302 , r 0 is the distance between the misaligned data center 302 and assumed reference center 303 a, φ 0 is the offset angle of assumed reference center 303 a ( j ) relative to the misaligned data center 302 , and r(φ j ) is the radial position of the part boundary relative to the misaligned data center 302 . 13. The non-destructive inspection apparatus of claim 10 , wherein the center adjuster further comprising a signal selector selecting a selected theoretical inner circle or the theoretical outer circle that is closest to the inner nominal circle or the outer nominal circle, respectively. 14. The non-destructive inspection apparatus of claim 10 , wherein the selected theoretical inner or the selected theoretical outer circle is used to produce the adjusted reference center. 15. The non-destructive inspection apparatus of claim 14 employs non-linear regression analysis to deduce the adjusted reference center from the selected theoretical inner circle or the selected theoretical outer circle, with the nominal reference center as a non-linear regression starting point. 16. The non-destructive inspection apparatus of claim 15 is further configured to seek the adjusted reference center, a special case of the assumed reference center defined by parameters r 0 and φ 0 , such that objective function S(r 0 , φ 0 ) is minimal, with S ⁡ ( r 0 , ϕ 0 ) = ∑ j = 1 J ⁢ [ R ⁡ ( ϕ j ; r 0 , ϕ 0 ) - R 0

Assignees

Inventors

Classifications

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US9726641B2 cover?
Disclosed is an ultrasonic IRIS inspection system and a method of providing automatically compensated concentric B-scans by means of curve-fitting the unadjusted tube boundaries from inspection data, and from the curve fitted theoretical circle, using non-linear regression analysis to determine an adjusted center. The off-center distance between the adjust center and the misaligned center is th…
Who is the assignee on this patent?
Bourgelas Tommy, St-Laurent Martin, Painchaud-April Guillaume, and 1 more
What technology area does this patent fall under?
Primary CPC classification G01N29/043. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Aug 08 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).