Device and method for acquiring a microscopic image of a sample structure

Patent metadata

Field	Value
Publication number	US-9720221-B2
Application number	US-201113812443-A
Country	US
Kind code	B2
Filing date	Jul 22, 2011
Priority date	Jul 28, 2010
Publication date	Aug 1, 2017
Grant date	Aug 1, 2017

Abstract

A device and a method for acquiring a microscopic image of a sample structure are described. An optic for imaging the sample structure and a reference structure is provided, as well as a drift sensing unit for sensing a drift of the sample structure relative to the optic on the basis of the imaged reference structure. The optic comprises a first sharpness plane for imaging the sample structure and at the same time a second sharpness plane, modifiable in location relative to the first sharpness plane, for imaging the reference structure.

First claim

The invention claimed is:

1. A localization microscopy device for acquiring a microscopic image of a sample structure based on calculated localizations of the sample structure, said device comprising:
an optic for imaging the sample structure and a reference structure,
a drift sensing unit for sensing a lateral and axial drift of the sample structure relative to the optic on the basis of the imaged reference structure,
wherein the optic comprises a first sharpness plane for imaging the sample structure and at the same time a second sharpness plane, modifiable in location relative to the first sharpness plane, for imaging the reference structure,
wherein the optic comprises an objective for imaging the sample structure, and a sub-optic that co-acts with the objective in order to image the reference structure and is adjustable in order to modify the location of the second sharpness plane,

and a calculation unit configured to calculate the localizations of the sample structure and to correct them on basis of the sensed lateral and axial drift.

2. The device according to claim 1 , wherein the sub-optic encompasses at least two lenses movable relative to one another.

3. The device according to claim 1 , wherein the sub-optic is arranged in a secondary beam path that is diverted from a main beam path intended for imaging of the sample structure.

4. The device according to claim 3 , comprising a first light detector arranged in a main beam path onto which the sample structure is imageable, and a second light detector, arranged in the secondary beam path, onto which the reference structure is imageable.

5. The device according to claim 3 , comprising a light-separating optical element with which the secondary beam path is diverted from the main beam path and directed onto the second light detector.

6. The device according to claim 1 , wherein a light source illuminates the sample structure and at the same time the reference structure through the objective.

Assignees

• Dyba Marcus
• Foelling Jonas
• Leica Microsystems

Inventors

• Dyba Marcus
• Foelling Jonas

Classifications

• G02B21/367

  providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison · CPC title

• G02B27/58

  Optics for apodization or superresolution; Optical synthetic aperture systems · CPC title

• H04N5/253

  Picture signal generating by scanning motion picture films or slide opaques, e.g. for telecine (scanning details therefor H04N3/36 {; standard conversion therefor H04N7/0112}) · CPC title

• G02B21/365 Primary

  Control or image processing arrangements for digital or video microscopes (G02B21/361, G02B21/362 take precedence) · CPC title

• G01N21/6458 Primary

  Fluorescence microscopy (fluorescence microscopes per se G02B21/0076 and G02B21/16) · CPC title