Volumetric Imaging
US-2024418652-A1 · Dec 19, 2024 · US
US9720218B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9720218-B2 |
| Application number | US-201414452181-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 5, 2014 |
| Priority date | Aug 6, 2013 |
| Publication date | Aug 1, 2017 |
| Grant date | Aug 1, 2017 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A system for a laser-scanning microscope includes an optical element configured to transmit light in a first direction onto a first beam path and to reflect light in a second direction to a second beam path that is different from the first beam path; a reflector on the first beam path; and a lens including a variable focal length, the lens positioned on the first beam path. The lens and reflector are positioned relative to each other to cause light transmitted by the optical element to pass through the lens a plurality of times and in a different direction each time. In some implementations, the system also can include a feedback system that receives a signal that represents an amount of focusing of the lens, and changes the focal length of the lens based on the received signal.
Opening claim text (preview).
What is claimed is: 1. A laser-scanning microscope system comprising: a beam input system comprising: an optical element configured to transmit light of a first polarization onto a first path and to reflect light of a second polarization onto a second path, a quarter-wave plate in the first path, a lens comprising a focal length that is adjustable during use of the lens, and a reflective element in the first path, the reflective element positioned to receive light from and reflect light toward one or more of the quarter-wave plate and the lens, the lens being between the reflective element and the quarter-wave plate; a beam delivery system comprising: first and second optical relays, at least one of which is in the second path, a scanner that receives and deflects light from the second path, and an imaging optic that directs the deflected light into a sample and receives light that emanates from the sample, wherein one or more of the first optical relay and the second optical relay is configured to image the lens to a pupil plane of the imaging optic; and a detector that receives the light that emanates from the sample from the imaging optic. 2. The system of claim 1 , wherein the optical element comprises a polarizing beam splitter. 3. The system of claim 1 , wherein the first optical relay is in the second path, and the second optical relay is positioned to receive light that is deflected by the scanner. 4. The system of claim 3 , wherein each of the first and second optical relays comprise two lenses that are arranged as a 4f system, and the two 4f systems are configured to image the lens to the pupil plane of the microscope objective. 5. The system of claim 3 , wherein the scanner comprises a galvanometer scanner. 6. The system of claim 5 , wherein the scanner is a resonant galvanometer scanner. 7. The system of claim 5 , wherein the scanner is a non-resonant galvanometer scanner. 8. The system of claim 1 , wherein the scanner comprises a movable mirror that deflects the light. 9. The system of claim 1 , wherein the detector comprises a photomultiplier tube. 10. The system of claim 1 , further comprising a data acquisition system that receives data from the detector, the data comprising a representation of an amount of light received at the detector, and the data acquisition system comprising: one or more electronic processors, and instructions stored on a computer-readable medium, the instructions, when executed by the one or more electronic processors, causing the data from the detector to be processed into a three-dimensional representation of the sample. 11. The system of claim 1 , wherein the light emanating from the sample is a laser-excited signal. 12. The system of claim 11 , wherein the laser-excited signal comprises two-photon excited fluorescence. 13. The system of claim 1 , wherein one of the first and second optical relays is in the first path between the reflective element and the lens, and the one of the first and second optical relays that is in the first path is configured to image the reflective element onto the lens and to image the lens onto the reflective element. 14. A system for a laser-scanning microscope, the system comprising: an optical element that transmits light of a first polarization onto a first path and reflects light having a second polarization onto a second path; a quarter-wave plate in the first path; a lens comprising a focal length that is adjustable during use of the lens; a reflective element in the first path, the reflective element positioned to receive light from and reflect light toward one or more of the quarter-wave plate and the lens; and an optical relay configured to image the lens to a pupil plane of an imaging objective of the laser-scanning microscope, wherein the lens is between the reflective element and the quarter-wave plate. 15. The system of claim 14 , wherein the lens comprising a focal length that is adjustable during use of the lens comprises a medium that has an index of refraction that is adjusted by applying a sonic signal to the medium. 16. The system of claim 15 , further comprising a continuous wave optical source. 17. The system of claim 16 , further comprising: a detector configured to measure an amount of optical power in the second path, the amount of power being related to the focal length of the lens, and a phase locked loop that receives an indication of the measured amount of optical power from the detector and provides a signal based on the indication of the measured amount of optical power to the lens on the first path, the provided signal being sufficient to change the focal length of the lens. 18. The system of claim 14 , further comprising a feedback system comprising one or more electronic processors and a non-transitory computer-readable medium comprising instructions that, when executed, cause the one or more electronic processors to: receive a signal that represents an amount of focusing of the lens, and change the focal length of the lens based on the received signal. 19. The system of claim 14 , wherein the lens is in the first path, the reflective element is positioned to receive light from and reflect light toward the lens and the quarter-wave plate, and the lens is between the reflective element and the quarter-wave plate such that light received at the reflective element from the quarter-wave plate passes through the lens, and light reflected from the reflective element toward the quarter-wave plate passes through the lens.
providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison · CPC title
arrangements using fluorescence or luminescence · CPC title
Polarisation microscopes · CPC title
Scanning microscopes (scanning near field optical microscopes G01Q60/18) · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.