Piezoelectric microelectromechanical resonator device and corresponding manufacturing process
US-2024154599-A1 · May 9, 2024 · US
US9712110B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9712110-B2 |
| Application number | US-201615005280-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 25, 2016 |
| Priority date | Jan 29, 2015 |
| Publication date | Jul 18, 2017 |
| Grant date | Jul 18, 2017 |
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A resonator element includes a quartz crystal substrate in which a plane including X and Z′ axes is set as a main plane and a direction oriented along a Y′ axis is a thickness direction. The quartz crystal substrate includes a first region in which thickness shear vibration is generated, a second region that has a thickness thinner than the first region, and first protrusions that are disposed between one pair of electrode pads disposed to be lined in a direction oriented along a Z′ axis on a mounted side of the second region. When Lx is a length of the first protrusions along the X axis and λ is a wavelength of flexural vibration of the quartz crystal substrate, a relation of “λ/2×(2n+1)−0.1λ≦Lx≦λ/2×(2n+1)+0.1λ” (where n is a positive integer) is satisfied.
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What is claimed is: 1. A resonator element comprising: a quartz crystal substrate in which an X axis of an orthogonal coordinate system having the X axis serving as an electric axis, a Y axis serving as a mechanical axis, and a Z axis serving as an optical axis, which are crystallographic axes of quartz crystal, is set as a rotation axis, an axis inclined from the Z axis so that a +Z side is rotated in a −Y direction of the Y axis is set as a Z′ axis, an axis inclined from the Y axis so that a +Y side is rotated in a +Z direction of the Z axis is set as a Y′ axis, a plane including the X and Z′ axes is set as a main plane, and the direction oriented along the Y′ axis is set as a thickness direction; and a pair of electrode pads, wherein the quartz crystal substrate includes a first region in which thickness shear vibration is generated, a second region that is located in periphery of the first region and has a thickness thinner than the first region, and a first protrusion that is disposed to be lined with the first region in a direction oriented along the X axis at one end side of the second region along the X axis, wherein the one pair of electrode pads are disposed to be lined in a direction oriented along the Z′ axis at the one end side of the second region in the direction oriented along the X axis, wherein the first protrusion is present between the one pair of electrode pads, and wherein when Lx is a length of the first protrusion along the X axis and λ is a wavelength of flexural vibration generated in the quartz crystal substrate, a relation of “λ/2×(2n+1)−0.1λ≦Lx≦λ/2×(2n+1)+0.1λ” (where n is a positive integer) is satisfied. 2. The resonator element according to claim 1 , wherein when Lz is a length of the first protrusion along the Z′ axis and Mz is a length of the first region along the Z′ axis, a relation of “0<Lz/Mz≦0.7” is satisfied. 3. The resonator element according to claim 1 , wherein the first protrusion is disposed in a region which vibration displacement energy by the vibration section does not reach. 4. The resonator element according to claim 1 , wherein the first protrusion has two side surfaces extending along the Z′ axis, and wherein of the two side surfaces, one side surface is disposed at a position of one maximum amplitude of the flexural vibration and the other side surface is disposed at a position of the other maximum amplitude of the flexural vibration. 5. The resonator element according to claim 1 , further comprising: a pair of second protrusions that are disposed to be lined in the direction oriented along the Z′ axis at the other end side of the second region along the X axis. 6. The resonator element according to claim 1 , wherein the first region includes a first portion, and a second portion that has a thickness thinner than the first portion and is present between the first portion and the second region at least in a vibration direction of the thickness shear vibration in a plan view. 7. The resonator element according to claim 1 , further comprising: excitation electrodes that are formed in the first and second regions. 8. The resonator element according to claim 2 , further comprising: excitation electrodes that are formed in the first and second regions. 9. The resonator element according to claim 3 , further comprising: excitation electrodes that are formed in the first and second regions. 10. The resonator element according to claim 4 , further comprising: excitation electrodes that are formed in the first and second regions. 11. A resonator comprising: the resonator element according to claim 1 ; and a package in which the resonator element is accommodated. 12. A resonator comprising: the resonator element according to claim 2 ; and a package in which the resonator element is accommodated. 13. A resonator device comprising: the resonator element according to claim 1 ; and an electronic element. 14. A resonator device comprising: the resonator element according to claim 2 ; and an electronic element. 15. The resonator device according to claim 13 , wherein the electronic element is a thermosensitive element. 16. An oscillator comprising: the resonator element according to claim 1 ; and an oscillation circuit that is electrically connected to the resonator element. 17. An oscillator comprising: the resonator element according to claim 2 ; and an oscillation circuit that is electrically connected to the resonator element. 18. An electronic apparatus comprising: the resonator element according to claim 1 . 19. A moving object comprising: the resonator element according to claim 1 .
of the energy-trap type · CPC title
Horizontal, i.e. parallel to the substrate plane · CPC title
Dimensional parameters, e.g. ratio between two dimension parameters, length, width or thickness · CPC title
consisting of quartz · CPC title
the BAW device being of the cantilever type · CPC title
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