Substrate processing apparatus
US-2024269862-A1 · Aug 15, 2024 · US
US9711389B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9711389-B2 |
| Application number | US-201414465364-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 21, 2014 |
| Priority date | Sep 17, 2013 |
| Publication date | Jul 18, 2017 |
| Grant date | Jul 18, 2017 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
An automatic module apparatus for manufacturing a solid state drive (SSD) includes a labeling apparatus, one or more test handler apparatuses and a sorting apparatus. The labeling apparatus is for printing a label on a SSD mounted on a carrier tray. The one or more test handler apparatuses are for transporting the carrier tray on which the labeled SSD is mounted and for testing the labeled SSDs to determine whether the labeled SSDs have any defects. The SSD sorting apparatus is for transporting the carrier tray on which the tested SSDs are mounted and sorting non-defective defective SSDs tested by the test handler apparatuses. The SSD labeling apparatus, the test handler apparatuses, and the SSD sorting apparatus are in-line and automated.
Opening claim text (preview).
What is claimed is: 1. An automatic module apparatus for manufacturing a solid state drive (SSD), the apparatus comprising: a SSD labeling apparatus configured to print a label on each of a plurality of SSDs mounted on a carrier tray; one or more test handler apparatuses, each test handler apparatus configured to receive the carrier tray on which the labeled SSDs are mounted from the SSD labeling apparatus and to test the labeled SSDs to determine whether the labeled SSDs are defective or non-defective; and a first SSD sorting apparatus configured to receive the carrier tray on which the tested SSDs are mounted from the one or more test handler apparatuses and to sort non-defective defective SSDs as tested by the test handler apparatuses, wherein the SSD labeling apparatus, the test handler apparatuses, and the first SSD sorting apparatus are in-line with the SSD labeling apparatus in front of the test handler apparatuses and the test handler apparatuses in front of the first SSD sorting apparatus, and wherein the SSD labeling apparatus, the test handler apparatuses, and the first SSD sorting apparatus are automated such that the carrier tray is transported in a straight line from the SSD labeling apparatus to the test handler apparatuses and from the test handler apparatuses to the first SSD sorting apparatus, wherein the carrier tray is transported by a tray transportation apparatus installed in the SSD labeling apparatus, the test handler apparatuses, and the first SSD sorting apparatus, the tray transportation apparatus comprising a straight continuous conveyor member to transport the carrier tray in the straight line from the SSD labeling apparatus to the test handler apparatuses and from the test handler apparatuses to the first SSD sorting apparatus. 2. The apparatus of claim 1 , wherein at least one tray rotation member configured to rotate the carrier tray is installed in the straight conveyor member of the tray transportation apparatus at each test handler apparatus to align a connector of a respective SSD on the carrier tray with a socket of a test board of the test handler apparatus. 3. The apparatus of claim 1 , further comprising a SSD casing apparatus configured to assemble cases on each of the SSDs mounted on the carrier tray, the SSD casing apparatus installed in front of the SSD labeling apparatus. 4. The apparatus of claim 3 , further comprising a router apparatus and a second SSD sorting apparatus, the second SSD sorting apparatus configured to sort defective bare SSDs from non-defective bare SSDs manufactured by the router apparatus, wherein the router apparatus and the second SSD sorting apparatus are installed in front of the SSD casing apparatus. 5. The apparatus of claim 1 , further comprising a visual inspection apparatus configured to inspect an exterior of each of the SSDs mounted on the carrier tray, wherein the first SSD sorting apparatus is installed in front of the visual inspection apparatus. 6. The apparatus of claim 1 , further comprising a visual inspection apparatus disposed between the one or more test handler apparatuses and the first SSD sorting apparatus, the visual inspection apparatus configured to inspect an exterior of each of the SSDs mounted on the carrier tray. 7. The apparatus of claim 1 , further comprising a router apparatus and a second SSD sorting apparatus, the second SSD sorting apparatus configured to sort defective bare SSDs from non-defective bare SSDs provided by the router apparatus, wherein the router apparatus and the second SSD sorting apparatus are installed in front of the SSD labeling apparatus. 8. An automatic module apparatus for manufacturing a SSD, the apparatus comprising: a tray loading apparatus configured to provide a carrier tray on which a plurality of SSDs are mounted; a tray transportation apparatus configured to receive and to transport the carrier tray on which the SSDs are mounted; and one or more test handler apparatuses configured to test electrical characteristics of the SSDs mounted on the carrier tray, wherein the tray transportation apparatus extends through each of the test handler apparatuses such that the carrier tray is conveyed through each of the test handler apparatuses; wherein each test handler apparatus comprises: a test kit stack part comprising a plurality of test kit stack units, the test kit stack part configured to receive the SSDs that have been removed from the carrier tray such that each SSD is mounted on an individual test kit and such that a plurality of the test kits are mounted on each of the test kit stack units in a stacked relationship to one another; and a test site unit configured to receive the test kits from the test kit stack part and to test electrical characteristics of the SSDs mounted on the test kits. 9. The apparatus of claim 8 , further comprising a transportation robot configured to transport the test kits from the test kit stack units to the test site unit. 10. The apparatus of claim 8 , wherein each test handler apparatus comprises a transportation robot configured to transport the SSDs from the carrier tray to the test kit stack part, the transportation robot further configured to transport the test kits to the test site unit. 11. The apparatus of claim 10 , wherein the transportation robot comprises: a picker configured to mount the SSDs on respective test kits; and a gripper configured to transport the test kits to the test site unit. 12. The apparatus of claim 8 , wherein the test site unit comprises: a test kit fixing support on which the test kits are fixedly mounted; and a test board configured to electrically connect to the SSDs mounted on the test kits. 13. The apparatus of claim 12 , wherein each test kit includes one or more protrusions at a bottom portion thereof, wherein the test kit fixing support includes one or more grooves sized and configured to receive the one or more protrusions such that the test kit is fixedly mounted to the test kit fixing support. 14. The apparatus of claim 13 , wherein a respective groove has a wide portion and a narrow portion extending from the wide portion, and wherein the groove is configured to receive a respective protrusion first in the wide portion of the groove and then in the narrow portion of the groove to fixedly mount the test kit to the test kit fixing support. 15. The apparatus of claim 12 , wherein a plurality of unit socket groups for electrical connection with the SSDs mounted on the test kits are installed on the test board, and wherein each unit socket group includes a plurality of differently configured sockets for electrical connection with differently configured SSDs. 16. The apparatus of claim 8 wherein a respective test kit comprises a groove defined therein, the groove sized and configured to receive one of the SSDs. 17. The apparatus of claim 16 wherein, when the SSD is received in the groove, the test kit covers at least a portion of each of opposite upper and lower surfaces of the SSD. 18. An automatic module apparatus for manufacturing a SSD, the apparatus comprising: a tray transportation apparatus configured to transport a carrier tray on which a plurality of SSDs are mounted; and a test handler apparatus through which the tray transportation apparatus extends, the test handler apparatus comprising: a test kit stack part having a plurality of test kits thereon; a test site unit having a plurality of sockets, each socket configured to electrically connect with an SSD; and at least one transportation robot configured to: remove each SSD from the
using identification means, e.g. labels on substrates or labels on containers · CPC title
Sorting devices · CPC title
the wafers being placed on a robot blade or gripped by a gripper for conveyance · CPC title
Apparatus features · CPC title
Handling, conveying or loading, e.g. belts, boats, vacuum fingers (G01R31/2867 takes precedence; handling semiconductor devices or wafers during manufacture or treatment H10P72/00) · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.